公开(公告)号：US20160196965A1

公开(公告)日：2016-07-07

申请号：US14911411

申请日：2014-07-09

Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION

Inventor： Hiroyuki SATAKE ,  Hideki HASEGAWA ,  Yukiko HIRABAYASHI ,  Yuichiro HASHIMOTO

IPC: H01J49/10 ,  H01J49/16 ,  H01J49/04

CPC classification number: H01J49/107 ,  H01J49/0468 ,  H01J49/165 ,  H01J49/168

Abstract: In order to provide an ion source that can be easily switched with high sensitivity and in a short time, the ion source includes an ionization probe for spraying a sample, a heating chamber for heating and vaporizing a sample; and driving portions and for changing the distance between an outlet end (i.e., an end on the spray side) of the ionization probe and an inlet end (i.e., an end on the ionization probe side) of the heating chamber. The positions of the ionization probe and the heating chamber are controlled by the driving portions so that an ionization region that uses the ionization probe or an ionization region that uses the heating chamber is positioned near the ion inlet port of the mass spectrometer.

Abstract translation: 为了提供能够以高灵敏度和短时间容易切换​​的离子源，离子源包括用于喷射样品的电离探针，用于加热和蒸发样品的加热室; 和驱动部分，并且用于改变电离探针的出口端（即，喷射侧的端部）与加热室的入口端（即电离探针侧的端部）之间的距离。 离子化探针和加热室的位置由驱动部分控制，使得使用离子化探针的电离区域或使用加热室的电离区域位于质谱仪的离子入口附近。