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    Laser ablation spectrometry apparatus
    2.
    发明授权
    Laser ablation spectrometry apparatus 有权

    公开(公告)号：US11768157B2

    公开(公告)日：2023-09-26

    申请号：US18098083

    申请日：2023-01-17

    Applicant: Applied Spectra, Inc.

    Inventor： Jong Hyun Yoo ,  Chunyi Liu ,  Richard E. Russo

    IPC: G01N21/71 ,  B23K26/04 ,  H01J49/04 ,  H01J49/10 ,  H01J49/00

    CPC classification number: G01N21/718 ,  B23K26/048 ,  H01J49/0004 ,  H01J49/0463 ,  H01J49/0468 ,  H01J49/105

    Abstract: Apparatus for laser induced ablation spectroscopy (LIBS) is disclosed. An apparatus can have a computer, a pulsed laser and a lightguide fiber bundle that is subdivided into branches. One branch can convey a first portion of the light to a first optical spectrometer and a different branch can convey a second portion of the light to another optical spectrometer. The first spectrometer can be relatively wideband to analyze a relative wide spectral segment and the other spectrometer can be high dispersion to measure minor concentrations. The apparatus can further comprise an unbranched lightguide fiber bundle to provide more light to a low sensitivity spectrometer. The apparatus can include an inductively coupled plasma mass spectrometer ICP-MS and a computer instructions operable to provide normalized LIBS/ICP-MS composition analyses.

    MICROWAVE DRIVEN PLASMA ION SOURCE
    3.
    发明公开
    MICROWAVE DRIVEN PLASMA ION SOURCE 审中-公开

    公开(公告)号：US20230164903A1

    公开(公告)日：2023-05-25

    申请号：US17916205

    申请日：2021-04-01

    Applicant: TOFWERK AG

    Inventor： Martin TANNER

    IPC: H05H1/30 ,  H01J37/16 ,  H01J49/04 ,  H01J37/34

    CPC classification number: H05H1/30 ,  H01J37/165 ,  H01J37/3488 ,  H01J49/0468

    Abstract: The invention relates to a microwave driven plasma ion source (1) for ionising a sample to be ionised to sample ions, the microwave driven plasma ion source (1) including a sample intake (6) for inserting the sample from an outside of the microwave driven plasma ion source (1) into an inside (3) of the microwave driven plasma ion source (1); a microwave generator (10) for generating microwaves for generating a plasma (101) from a plasma gas (100); a plasma torch (20) providing a plasma torch orientation direction (29) having an inside (21) for housing (2) a process of generation of the plasma (101) from the plasma gas (100) and for housing a process of ionising the sample to the sample ions by exposing the sample to the plasma (101), wherein the plasma torch (20) comprises a torch outlet (22) for letting out the plasma (101) and the sample ions from the inside (21) of the plasma torch (20) essentially in the plasma torch orientation direction (29) to an outside of the plasma torch (20), the torch outlet (22) having a torch aperture. Furthermore the microwave driven plasma ion source (1, 201) includes a shielding (4) for shielding off the microwaves from passing from the inside (3) of the microwave driven plasma ion source (1) to the outside of the microwave driven plasma ion source (1), wherein the shielding (4) comprises a shielding outlet (5) for letting out the plasma (101) and the sample ions from the inside (3) of the microwave driven plasma ion source (1) essentially in the plasma torch orientation direction (29) to the outside of the microwave driven plasma ion source (1), the shielding outlet (5) having a shielding aperture. Thereby, the shielding outlet (5) is fluidly coupled to the torch outlet (22) for letting out the plasma (101) and the sample ions from the inside (21) of the plasma torch (20) essentially in the plasma torch orientation direction (29) to the outside of the microwave driven plasma ion source (1), wherein a size of the shielding aperture is less than 150%, preferably less than 125%, particular preferably less than 110% of a size of the torch aperture, wherein both the size of the shielding aperture and the size of the torch aperture are measured in units of area.

    APPARATUS FOR AND METHOD OF MASS ANALYSIS
    5.
    发明申请
    APPARATUS FOR AND METHOD OF MASS ANALYSIS 审中-公开

    公开(公告)号：US20190214240A1

    公开(公告)日：2019-07-11

    申请号：US16244359

    申请日：2019-01-10

    Applicant: HITACHI HIGH-TECH SCIENCE CORPORATION

    Inventor： Masahiro SAKUTA ,  Yoshiki MATOBA

    IPC: H01J49/00 ,  H01J49/34 ,  H01J49/04 ,  H01J49/02

    CPC classification number: H01J49/0036 ,  H01J49/025 ,  H01J49/0422 ,  H01J49/0468 ,  H01J49/34

    Abstract: Disclosed is an apparatus for and a method of mass analysis, the apparatus and the method being capable of improving a detection accuracy of a target substance including impurities, without increasing a size of the apparatus, and shortening measuring time. The apparatus analyzing a sample containing a target substance and one or more interfering substances, which have a peak of a mass spectrum overlapping that of the target substance includes: a peak correction unit calculating an intensity of net peak D of the mass spectrum of the target substance by subtracting a total sum of estimated intensities of the peak B, which are calculated every predetermined time interval according to the intensity of the peak A and a nonlinear relation F between the peak A and the peak B, from an intensity of peak C of a mass spectrum of the target substance of the sample.

    SAMPLE INJECTION DEVICE AND METHOD FOR SAMPLE COLLECTION AND SAMPLE THERMAL DESORPTION, AND TRACE DETECTION APPARATUS
    10.
    发明申请
    SAMPLE INJECTION DEVICE AND METHOD FOR SAMPLE COLLECTION AND SAMPLE THERMAL DESORPTION, AND TRACE DETECTION APPARATUS 审中-公开

    公开(公告)号：US20170176299A1

    公开(公告)日：2017-06-22

    申请号：US15117086

    申请日：2015-12-28

    Applicant: Nuctech Company Limited

    Inventor： Qingjun ZHANG ,  Yuanjing LI ,  Zhiqiang CHEN ,  Weiping ZHU ,  Huishao HE ,  Qiufeng MA ,  Yaohong LIU ,  Xiang ZOU ,  Jianping CHANG

    IPC: G01N1/02 ,  H01J49/04 ,  G01N27/62 ,  G01N1/22 ,  G01N1/40

    CPC classification number: G01N1/02 ,  G01N1/2211 ,  G01N1/2214 ,  G01N1/2273 ,  G01N1/38 ,  G01N1/405 ,  G01N1/42 ,  G01N27/622 ,  G01N30/08 ,  G01N2030/128 ,  H01J49/0422 ,  H01J49/0459 ,  H01J49/0468

    Abstract: The present invention discloses a sample injection device for sample collection and sample thermal desorption. The device comprises: a sample collection structure; a piston type adsorber having an adsorption cavity capable of being arranged to be in communication with the sample collection structure; a piston cylinder defining a piston chamber that is configured for accommodating the piston type adsorber and configured to be in communication with the adsorption cavity; a thermal desorption chamber that is configured to be in communication with the adsorption cavity and the piston chamber and is configured to thermally desorb the sample adsorbed in the adsorption cavity; and a pump that is configured to be in communication with the piston chamber via a conduit and is configured to pump a sample diffused in an ambient gas into the adsorption cavity through the sample collection structure, the adsorption cavity being configured to adsorb the sample collected by the sample collection structure; the piston type adsorber is configured to be movable between a sample collecting position where the adsorption cavity is located outside the thermal desorption chamber and in communication with the sample collection structure so as to adsorb the sample collected by the sample collection structure and a sample desorbing position where the adsorption cavity is located inside the thermal desorption chamber so that the adsorbed sample is thermally desorbed in the thermal desorption chamber. There are also provided a method of collecting and desorbing a sample by using the abovementioned device, and a trace detection apparatus.

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