MAINTENANCE DEVICE, MAINTENANCE SYSTEM, AND METHODS FOR EXAMINING AN INSPECTION TARGET
    2.
    发明申请
    MAINTENANCE DEVICE, MAINTENANCE SYSTEM, AND METHODS FOR EXAMINING AN INSPECTION TARGET 审中-公开
    维护设备,维护系统和检查检查目标的方法

    公开(公告)号:US20160195477A1

    公开(公告)日:2016-07-07

    申请号:US14590532

    申请日:2015-01-06

    Inventor: Amit Patil

    Abstract: Devices, systems, and methods are provided for examining an inspection target. The maintenance device is connected to a configuration platform using a communication interface and receives a set of inspection target information from the configuration platform. The set of inspection target information is stored in a memory module of the maintenance device. An illumination source illuminates the inspection target and a sensor module obtains a set of inspection target features from the inspection target. Inspection target information is selected from the memory module based on the obtained set of inspection target features and the selected inspection target information is projected using an information projector.

    Abstract translation: 提供设备,系统和方法来检查检查目标。 维护设备使用通信接口连接到配置平台,并从配置平台接收一组检查目标信息。 该检查对象信息被存储在维护装置的存储模块中。 照明源照亮检查对象,传感器模块从检查目标获取一组检查目标特征。 基于获得的检查对象特征集合从存储器模块中选择检查对象信息,并且使用信息投影仪投影所选择的检查对象信息。

Patent Agency Ranking