公开(公告)号：US20150287468A1

公开(公告)日：2015-10-08

申请号：US14679046

申请日：2015-04-06

申请人： HYUN-JU YI ,  SEOK-WON AHN ,  HWA-SEOK OH

发明人： HYUN-JU YI ,  SEOK-WON AHN ,  HWA-SEOK OH

IPC分类号： G11C16/14 ,  G11C16/32

CPC分类号： G11C16/16 ,  G06F13/161 ,  G11C16/32 ,  G11C2216/20

摘要： A non-volatile memory and a method of controlling an erase operation of the non-volatile memory using a controller are provided. The method of controlling the erase operation includes beginning performance of the erase operation, monitoring a next command to be performed in the non-volatile memory while performing the erase operation, determining an erase status, and continuing, suspending or canceling the erase operation based on the determination result of the erase status.

摘要翻译： 提供一种使用控制器来控制非易失性存储器的擦除操作的非易失性存储器和方法。 控制擦除操作的方法包括开始执行擦除操作，监视在执行擦除操作期间在非易失性存储器中执行的下一个命令，确定擦除状态，以及继续，暂停或取消擦除操作，基于 擦除状态的确定结果。

公开(公告)号：US20130094312A1

公开(公告)日：2013-04-18

申请号：US13584849

申请日：2012-08-14

申请人： SOON-BOK JANG ,  JONG-UK SONG ,  YOUNG-WOOK KIM ,  HWA-SEOK OH

发明人： SOON-BOK JANG ,  JONG-UK SONG ,  YOUNG-WOOK KIM ,  HWA-SEOK OH

IPC分类号： G11C7/00 ,  H01L35/00

CPC分类号： G11C29/021 ,  G11C7/04 ,  G11C7/222 ,  G11C29/023 ,  G11C29/028 ,  G11C2029/5002

摘要： A voltage scaling device of a semiconductor memory device, the voltage scaling device including: a delay tester for determining the number of delay cells of a delay locked loop (DLL) required to cumulatively delay a clock signal having a constant frequency, and which is input to the DLL, by one clock period; a temperature sensor for measuring the temperature of the semiconductor memory device; and a voltage regulator for regulating a supply voltage of a voltage source which provides a chip voltage to the semiconductor memory device in response to the temperature measured by the temperature sensor and a locking value corresponding to the number of delay cells calculated by the delay tester.

摘要翻译： 一种半导体存储器件的电压调节装置，所述电压缩放装置包括：延迟测试器，用于确定累积地延迟具有恒定频率的时钟信号所需的延迟锁定环（DLL）的延迟单元数量，并且其被输入 到DLL，一个时钟周期; 温度传感器，用于测量半导体存储器件的温度; 以及电压调节器，用于响应于由温度传感器测量的温度和对应于由延迟测试器计算的延迟单元的数量的锁定值，调节向半导体存储器件提供芯片电压的电压源的电源电压。

公开(公告)号：US20150331628A1

公开(公告)日：2015-11-19

申请号：US14685619

申请日：2015-04-14

申请人： JUNG-PIL LEE ,  HWA-SEOK OH ,  KYUNG-PHIL YOO ,  MYUNG-SUB SHIN

发明人： JUNG-PIL LEE ,  HWA-SEOK OH ,  KYUNG-PHIL YOO ,  MYUNG-SUB SHIN

IPC分类号： G06F3/06

CPC分类号： G06F13/16 ,  G06F3/0619 ,  G06F3/0655 ,  G06F3/0659 ,  G06F3/0688 ,  G06F9/3004 ,  G06F9/54 ,  G06F12/02 ,  G06F12/1009

摘要： A memory swapping method and a data processing system using the same, the memory swapping method including receiving queue information for a memory swapping task from a host device; performing part of the memory swapping task in a storage device based on the queue information; receiving a command corresponding to the queue information from the host device after performing of the part of the memory swapping task is completed; and performing a remaining part of the memory swapping task according to the command by using a result of the part of the memory swapping task that had been previously performed.

摘要翻译： 一种存储器交换方法和使用其的数据处理系统，所述存储器交换方法包括从主机设备接收用于存储器交换任务的队列信息; 基于队列信息在存储设备中执行部分内存交换任务; 在执行部分存储器交换任务之后，从主机装置接收与该队列信息对应的命令完成; 以及通过使用先前执行的部分内存交换任务的结果，根据该命令执行存储器交换任务的剩余部分。