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1.发明授权Testing device and testing method for quantum battery using semiconductor probe 有权使用半导体探头的量子电池的测试装置和测试方法公开(公告)号：US09164149B2
公开(公告)日：2015-10-20
申请号：US14355329
申请日：2011-10-30
CPC分类号： G01R31/3637 , B82Y10/00 , G01R1/06744 , G01R31/3641 , G01R31/3665 , H01M10/48
摘要： This invention provide a testing device and method for a quantum battery by a semiconductor probe, whereby the electrical characteristics of the charging layer can be evaluated during the quantum battery manufacturing process. The testing device equipped with a semiconductor probe constituted by a conductive electrode and a metal oxide semiconductor layer including a metal oxide semiconductor which are laminated on a support, a source voltage for applying voltage across an electrode equipped to the semiconductor probe and a basic electrode laminated on a secondary battery charging layer, and an ammeter for measuring the current flowing between the electrode equipped on the semiconductor probe and the basic electrode of the secondary battery on which charging layer is laminated, and measures the current-voltage characteristics of the charging layer.
摘要翻译： 本发明通过半导体探针提供量子电池的测试装置和方法，由此可以在量子电池制造过程中评估充电层的电特性。 配备有由导电电极和层叠在支撑体上的包含金属氧化物半导体的金属氧化物半导体层构成的半导体探针的测试装置，层叠在半导体探针上的电极施加电压的源极电压和层叠 二次电池充电层和用于测量在半导体探针上配备的电极和层叠有充电层的二次电池的基极之间流动的电流的电流表，并测量充电层的电流 - 电压特性。
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公开(公告)号：US09799927B2
公开(公告)日：2017-10-24
申请号：US14357856
申请日：2011-11-14
CPC分类号： H01M10/42 , H01L31/186 , H01L31/208 , H01M10/4242 , Y02E10/50 , Y02P70/521 , Y10T29/53135
摘要： A repair apparatus of a sheet type cell is capable of appropriately repairing and detoxifying defects of a sheet type cell having semiconductor characteristics. The repair apparatus repairs a sheet type cell in which a storage layer is sandwiched by layers of a positive electrode and a negative electrode and at least the storage layer has semiconductor characteristics. The repair apparatus applies electrical stimulation between the positive electrode and the negative electrode, measures electrical characteristics of the sheet type cell when the electrical stimulation is applied, and specifies a value of the electrical stimulation by the electrical stimulation source while considering measured electrical characteristics.
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公开(公告)号：US20150000119A1
公开(公告)日：2015-01-01
申请号：US14357856
申请日：2011-11-14
IPC分类号： H01M10/42
CPC分类号： H01M10/42 , H01L31/186 , H01L31/208 , H01M10/4242 , Y02E10/50 , Y02P70/521 , Y10T29/53135
摘要： A repair apparatus of a sheet type cell that is capable of appropriately repairing and detoxifying defects of a sheet type cell having semiconductor characteristics is provided.The repair apparatus repairs a sheet type cell in which a storage layer is sandwiched by layers of a positive electrode and a negative electrode and at least the storage layer has semiconductor characteristics. The repair apparatus includes an electrical stimulation source that applies electrical stimulation between the positive electrode and the negative electrode, an electrical characteristic measurement means that measures electrical characteristics of the sheet type cell when the electrical stimulation is applied, and a control means that specifies a value of the electrical stimulation by the electrical stimulation source while considering measured electrical characteristics.
摘要翻译： 提供一种片状电池的修复装置，其能够适当地修复和解毒具有半导体特性的片状电池的缺陷。 修理装置修复其中存储层被正极和负极的层夹在中的片状电池，并且至少存储层具有半导体特性。 所述修复装置包括在所述正极和所述负极之间施加电刺激的电刺激源，测定所述电刺激时所述片状电池的电特性的电特性测定单元，以及指定值 的电刺激源的电刺激，同时考虑测量的电特性。
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4.发明申请TESTING DEVICE AND TESTING METHOD FOR QUANTUM BATTERY USING SEMICONDUCTOR PROBE 有权使用半导体探针的量子电池的测试装置和测试方法公开(公告)号：US20140320108A1
公开(公告)日：2014-10-30
申请号：US14355329
申请日：2011-10-30
IPC分类号： G01R31/36
CPC分类号： G01R31/3637 , B82Y10/00 , G01R1/06744 , G01R31/3641 , G01R31/3665 , H01M10/48
摘要： This invention provide a testing device and method for a quantum battery by a semiconductor probe, whereby the electrical characteristics of the charging layer can be evaluated during the quantum battery manufacturing process. The testing device equipped with a semiconductor probe constituted by a conductive electrode and a metal oxide semiconductor layer including a metal oxide semiconductor which are laminated on a support, a source voltage for applying voltage across an electrode equipped to the semiconductor probe and a basic electrode laminated on a secondary battery charging layer, and an ammeter for measuring the current flowing between the electrode equipped on the semiconductor probe and the basic electrode of the secondary battery on which charging layer is laminated, and measures the current-voltage characteristics of the charging layer.
摘要翻译： 本发明通过半导体探针提供量子电池的测试装置和方法，由此可以在量子电池制造过程中评估充电层的电特性。 配备有由导电电极和层叠在支撑体上的包含金属氧化物半导体的金属氧化物半导体层构成的半导体探针的测试装置，层叠在半导体探针上的电极施加电压的源极电压和层叠 二次电池充电层和用于测量在半导体探针上配备的电极和层叠有充电层的二次电池的基极之间流动的电流的电流表，并测量充电层的电流 - 电压特性。
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公开(公告)号：US09859596B2
公开(公告)日：2018-01-02
申请号：US14355509
申请日：2011-10-30
申请人： Takuo Kudoh , Akira Nakazawa , Nobuaki Terakado
发明人： Takuo Kudoh , Akira Nakazawa , Nobuaki Terakado
CPC分类号： H01M14/005 , H01L31/022425 , H01L49/00 , H01M10/00 , H01M10/02 , H01M14/00 , H02J7/324
摘要： The purpose of this invention is to provide a repeatedly chargeable and dischargeable quantum battery that is available for a long period of time without an aging change. The quantum battery is charged by causing an n-type metal oxide semiconductor to have a photo-exited structural change, thereby the electrode of quantum battery is prevented from being oxide and a price reduction and stable operation are possible. The repeatedly usable quantum battery is constituted by laminating; a first metal electrode having an oxidation preventing function, charging layer in which an energy level is formed in the band gap by causing an n-type metal oxide semiconductor covered with an insulating material to have a photo-exited structure change and electrons are trapped at the energy level; p-type metal oxide semiconductor layer; and a second metal electrode having the oxidation preventing function, the electrodes are passive metal layers formed of metals having passive characteristics.
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公开(公告)号：US20140352775A1
公开(公告)日：2014-12-04
申请号：US14355509
申请日：2011-10-30
申请人： Takuo Kudoh , Akira Nakazawa , Nobuaki Terakado
发明人： Takuo Kudoh , Akira Nakazawa , Nobuaki Terakado
IPC分类号： H01L31/0224 , H02J7/32 , H01L49/00
CPC分类号： H01M14/005 , H01L31/022425 , H01L49/00 , H01M10/00 , H01M10/02 , H01M14/00 , H02J7/324
摘要： The purpose of this invention is to provide a repeatedly chargeable and dischargeable quantum battery that is available for a long period of time without an aging change. The quantum battery is charged by causing an n-type metal oxide semiconductor to have a photo-exited structural change, thereby the electrode of quantum battery is prevented from being oxide and a price reduction and stable operation are possible. The repeatedly usable quantum battery is constituted by laminating; a first metal electrode having an oxidation preventing function, charging layer in which an energy level is formed in the band gap by causing an n-type metal oxide semiconductor covered with an insulating material to have a photo-exited structure change and electrons are trapped at the energy level; p-type metal oxide semiconductor layer; and a second metal electrode having the oxidation preventing function, the electrodes are passive metal layers formed of metals having passive characteristics.
摘要翻译： 本发明的目的是提供可重复充电和放电的量子电池，该电池可长时间使用而没有老化变化。 通过使n型金属氧化物半导体具有光退出结构变化来对量子电池进行充电，从而防止量子电池的电极成为氧化物，并且价格降低和稳定的操作成为可能。 重复使用的量子电池由层叠构成; 具有防氧化功能的第一金属电极，通过使覆盖有绝缘材料的n型金属氧化物半导体具有光引发结构而使电子被捕获在其中，在带隙中形成能级的充电层 能量水平; p型金属氧化物半导体层; 和具有防氧化功能的第二金属电极，电极是由具有被动特性的金属形成的无源金属层。
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