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1.发明授权Testing device and testing method for quantum battery using semiconductor probe 有权使用半导体探头的量子电池的测试装置和测试方法公开(公告)号：US09164149B2
公开(公告)日：2015-10-20
申请号：US14355329
申请日：2011-10-30
CPC分类号： G01R31/3637 , B82Y10/00 , G01R1/06744 , G01R31/3641 , G01R31/3665 , H01M10/48
摘要： This invention provide a testing device and method for a quantum battery by a semiconductor probe, whereby the electrical characteristics of the charging layer can be evaluated during the quantum battery manufacturing process. The testing device equipped with a semiconductor probe constituted by a conductive electrode and a metal oxide semiconductor layer including a metal oxide semiconductor which are laminated on a support, a source voltage for applying voltage across an electrode equipped to the semiconductor probe and a basic electrode laminated on a secondary battery charging layer, and an ammeter for measuring the current flowing between the electrode equipped on the semiconductor probe and the basic electrode of the secondary battery on which charging layer is laminated, and measures the current-voltage characteristics of the charging layer.
摘要翻译： 本发明通过半导体探针提供量子电池的测试装置和方法，由此可以在量子电池制造过程中评估充电层的电特性。 配备有由导电电极和层叠在支撑体上的包含金属氧化物半导体的金属氧化物半导体层构成的半导体探针的测试装置，层叠在半导体探针上的电极施加电压的源极电压和层叠 二次电池充电层和用于测量在半导体探针上配备的电极和层叠有充电层的二次电池的基极之间流动的电流的电流表，并测量充电层的电流 - 电压特性。
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2.发明申请TESTING DEVICE AND TESTING METHOD FOR QUANTUM BATTERY USING SEMICONDUCTOR PROBE 有权使用半导体探针的量子电池的测试装置和测试方法公开(公告)号：US20140320108A1
公开(公告)日：2014-10-30
申请号：US14355329
申请日：2011-10-30
IPC分类号： G01R31/36
CPC分类号： G01R31/3637 , B82Y10/00 , G01R1/06744 , G01R31/3641 , G01R31/3665 , H01M10/48
摘要： This invention provide a testing device and method for a quantum battery by a semiconductor probe, whereby the electrical characteristics of the charging layer can be evaluated during the quantum battery manufacturing process. The testing device equipped with a semiconductor probe constituted by a conductive electrode and a metal oxide semiconductor layer including a metal oxide semiconductor which are laminated on a support, a source voltage for applying voltage across an electrode equipped to the semiconductor probe and a basic electrode laminated on a secondary battery charging layer, and an ammeter for measuring the current flowing between the electrode equipped on the semiconductor probe and the basic electrode of the secondary battery on which charging layer is laminated, and measures the current-voltage characteristics of the charging layer.
摘要翻译： 本发明通过半导体探针提供量子电池的测试装置和方法，由此可以在量子电池制造过程中评估充电层的电特性。 配备有由导电电极和层叠在支撑体上的包含金属氧化物半导体的金属氧化物半导体层构成的半导体探针的测试装置，层叠在半导体探针上的电极施加电压的源极电压和层叠 二次电池充电层和用于测量在半导体探针上配备的电极和层叠有充电层的二次电池的基极之间流动的电流的电流表，并测量充电层的电流 - 电压特性。
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公开(公告)号：US09799927B2
公开(公告)日：2017-10-24
申请号：US14357856
申请日：2011-11-14
CPC分类号： H01M10/42 , H01L31/186 , H01L31/208 , H01M10/4242 , Y02E10/50 , Y02P70/521 , Y10T29/53135
摘要： A repair apparatus of a sheet type cell is capable of appropriately repairing and detoxifying defects of a sheet type cell having semiconductor characteristics. The repair apparatus repairs a sheet type cell in which a storage layer is sandwiched by layers of a positive electrode and a negative electrode and at least the storage layer has semiconductor characteristics. The repair apparatus applies electrical stimulation between the positive electrode and the negative electrode, measures electrical characteristics of the sheet type cell when the electrical stimulation is applied, and specifies a value of the electrical stimulation by the electrical stimulation source while considering measured electrical characteristics.
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公开(公告)号：US20150000119A1
公开(公告)日：2015-01-01
申请号：US14357856
申请日：2011-11-14
IPC分类号： H01M10/42
CPC分类号： H01M10/42 , H01L31/186 , H01L31/208 , H01M10/4242 , Y02E10/50 , Y02P70/521 , Y10T29/53135
摘要： A repair apparatus of a sheet type cell that is capable of appropriately repairing and detoxifying defects of a sheet type cell having semiconductor characteristics is provided.The repair apparatus repairs a sheet type cell in which a storage layer is sandwiched by layers of a positive electrode and a negative electrode and at least the storage layer has semiconductor characteristics. The repair apparatus includes an electrical stimulation source that applies electrical stimulation between the positive electrode and the negative electrode, an electrical characteristic measurement means that measures electrical characteristics of the sheet type cell when the electrical stimulation is applied, and a control means that specifies a value of the electrical stimulation by the electrical stimulation source while considering measured electrical characteristics.
摘要翻译： 提供一种片状电池的修复装置，其能够适当地修复和解毒具有半导体特性的片状电池的缺陷。 修理装置修复其中存储层被正极和负极的层夹在中的片状电池，并且至少存储层具有半导体特性。 所述修复装置包括在所述正极和所述负极之间施加电刺激的电刺激源，测定所述电刺激时所述片状电池的电特性的电特性测定单元，以及指定值 的电刺激源的电刺激，同时考虑测量的电特性。
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5.发明申请SEMICONDUCTOR PROBE, TESTING DEVICE AND TESTING METHOD FOR TESTING QUANTUM BATTERY 有权半导体探头，测试装置和测试量子电池的测试方法公开(公告)号：US20150192611A1
公开(公告)日：2015-07-09
申请号：US14404803
申请日：2012-05-31
申请人： Harutada Dewa , Kiyoyasu Hiwada , Akira Nakazawa
发明人： Harutada Dewa , Kiyoyasu Hiwada , Akira Nakazawa
CPC分类号： G01R1/067 , G01R1/06744 , G01R1/06761 , G01R31/3624 , G01R31/3665 , H01L22/14
摘要： A testing device and method of a quantum battery by a semiconductor probe capable of evaluating electric characteristics of a charge layer in the middle of a production process of the quantum battery without damaging the charge layer. On semiconductor probe constituted by stacking electrode and metal oxide semiconductor on support body, and probe charge layer is formed of the same material as that of quantum battery and irradiated with ultraviolet rays. Forming probe charge layer of same material as that of quantum battery on semiconductor probe enables evaluation without damaging charge layer of the quantum battery. Testing device and method are provided which measure the charge/discharge characteristics of a charge layer in the middle of producing the quantum battery by a voltmeter and a constant current source or a discharge resistor by using the semiconductor probe including the probe charge layer.
摘要翻译： 一种通过半导体探针的量子电池的测试装置和方法，其能够在量子电池的制造过程的中间评估电荷层的电特性，而不损坏电荷层。 在由支撑体上堆叠电极和金属氧化物半导体构成的半导体探针上，探针电荷层由与量子电池相同的材料形成，并用紫外线照射。 在半导体探针上形成与量子电池相同材料的探针电荷层可以进行评估，而不会损坏量子电池的电荷层。 提供了通过使用包括探针电荷层的半导体探针，通过伏特计和恒流源或放电电阻来测量制造量子电池中间的电荷层的充电/放电特性的测试装置和方法。
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公开(公告)号：US09778284B2
公开(公告)日：2017-10-03
申请号：US14404803
申请日：2012-05-31
申请人： Harutada Dewa , Kiyoyasu Hiwada , Akira Nakazawa
发明人： Harutada Dewa , Kiyoyasu Hiwada , Akira Nakazawa
CPC分类号： G01R1/067 , G01R1/06744 , G01R1/06761 , G01R31/3624 , G01R31/3665 , H01L22/14
摘要： A testing device and method of a quantum battery by a semiconductor probe capable of evaluating electric characteristics of a charge layer in the middle of a production process of the quantum battery without damaging the charge layer. On semiconductor probe constituted by stacking electrode and metal oxide semiconductor on support body, and probe charge layer is formed of the same material as that of quantum battery and irradiated with ultraviolet rays. Forming probe charge layer of same material as that of quantum battery on semiconductor probe enables evaluation without damaging charge layer of the quantum battery. Testing device and method are provided which measure the charge/discharge characteristics of a charge layer in the middle of producing the quantum battery by a voltmeter and a constant current source or a discharge resistor by using the semiconductor probe including the probe charge layer.
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公开(公告)号：US10036780B2
公开(公告)日：2018-07-31
申请号：US14342870
申请日：2011-09-05
申请人： Harutada Dewa , Kiyoyasu Hiwada
发明人： Harutada Dewa , Kiyoyasu Hiwada
CPC分类号： G01R31/385 , G01R1/07314 , G01R31/364 , G01R31/378 , H01M10/0436 , H01M10/48
摘要： An electrode probe is brought into contact with a measurement part on an outer surface of at least one of the positive electrode and the negative electrode of a sheet type cell, and quantity of electricity is measured at the measurement part, so as to evaluate the sheet type cell. The electrode probe may be connected to a voltage meter and to a charge source or a discharge source, and the evaluation made by detecting a charge characteristic that changes the cell from a non-charged state to a fully charged state, a discharge characteristic that changes the cell from a fully charged state to the non-charged state, or a measurement voltage of the voltage meter when the cell is in the fully charged state.
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公开(公告)号：US20140327445A1
公开(公告)日：2014-11-06
申请号：US14342870
申请日：2011-09-05
申请人： Harutada Dewa , Kiyoyasu Hiwada
发明人： Harutada Dewa , Kiyoyasu Hiwada
IPC分类号： G01R31/36
CPC分类号： G01R31/3627 , G01R1/07314 , G01R31/3665 , G01R31/3696 , H01M10/0436 , H01M10/48
摘要： A sheet type cell in which a storage layer is sandwiched by layers of a positive electrode and a negative electrode is evaluated.The present invention is characterized in that an electrode probe is brought into contact with a measurement part on an outer surface of at least one of the positive electrode and the negative electrode, and quantity of electricity is measured at the measurement part, so as to evaluate the sheet type cell. For example, a charge source and a voltage meter are connected to the electrode probe, and a charge characteristic that changes the sheet type cell from a non-charged state to a fully charged state is detected from a change in a measurement voltage of the voltage meter, so as to make an evaluation. Further, for example, a discharge source and the voltage meter are connected to the electrode probe, and a discharge characteristic that changes the sheet type cell from the fully charged state to the non-charged state is detected from the change in the measurement voltage of the voltage meter, so as to make an evaluation. Furthermore, for example, the charge source and the voltage meter are connected to the electrode probe, and the measurement voltage of the voltage meter is detected when the sheet type cell is in the fully charged state, so as to make an evaluation.
摘要翻译： 评估其中存储层被正极和负极的层夹在中间的片状电池。 本发明的特征在于，使电极探针与正极和负极中的至少一个的外表面上的测量部接触，并且在测量部分测量电量，以评估 片状细胞。 例如，将电荷源和电压计连接到电极探针，并且将片状电池从非充电状态改变为完全充电状态的电荷特性从电压的测量电压的变化中检测 米，以便进行评估。 此外，例如，将放电源和电压计连接到电极探针，并且将片状电池从完全充电状态改变为非充电状态的放电特性从测量电压的变化中检测到 电压表，以进行评估。 此外，例如，电荷源和电压计连接到电极探针，当片式电池处于完全充电状态时，检测电压计的测量电压，以进行评估。
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