-
公开(公告)号：US5778512A
公开(公告)日：1998-07-14
申请号：US574033
申请日：1995-12-18
CPC分类号： H02K15/0414 , H02K15/066 , Y10T29/49012
摘要： A rotor for an electric rotary machine having an armature core, upper layer coil elements and lower layer coil elements is provided. Each coil element has a straight coil side and a pair of coil ends extending radially at a right angle from the coil side. Each coil end is inclined by a predetermined angle with respect to the coil side in a circumferential direction of the armature core. The lower layer coil side and the upper layer coil side are inserted into corresponding slots in a radial direction. A connector comprising a tip of the coil end of the upper layer coil element and a connector comprising a tip of the coil end of the lower layer coil element are welded together.
摘要翻译： 提供一种具有电枢铁芯，上层线圈元件和下层线圈元件的旋转电机的转子。 每个线圈元件具有直线圈侧和从线圈侧以直角径向延伸的一对线圈端。 每个线圈端部在电枢铁芯的圆周方向上相对于线圈侧倾斜预定的角度。 下层线圈侧和上层线圈侧沿径向插入对应的槽。 包括上层线圈元件的线圈端的尖端和包括下层线圈元件的线圈端的尖端的连接器的连接器被焊接在一起。
-
2.发明授权Probe card for maintaining the position of a probe in high temperature application 失效用于在高温应用中保持探头位置的探针卡
公开(公告)号：US5670889A
公开(公告)日：1997-09-23
申请号：US404729
申请日：1995-03-15
CPC分类号： G01R1/07342 , G01R31/2855
摘要： Probe card is a part which is incorporated into a probing equipment to test finished IC chips, This card is customarily mounted with a plurality of probes, very fine needle and generally bent, and each probe is disposed so that its front end may pinpoint to a pad of an IC chip of interest. In performing the probing test, a most important condition is to keep the probe contact pressure on the pad of an IC chip at a constant position during measurement time, but in performing such at a high temperature, heated IC chips radiate the probe card and thereby positional deviation of the contact point is caused by heat expansion of the probe card and hence the contact pressure may change. The invented probe card employs a ceramic material in fabricating the probe card for possessing a very low expansion coefficient or for possessing an equivalent coefficient value to the IC chip or wafers, thereby the positional deviation of the probe contact is avoided and other devices to cope with difficulties caused by performance at a high temperature are disclosed.
摘要翻译： 探针卡是结合在探测设备中以测试完成的IC芯片的部件。该卡通常安装有多个探针，非常细的针并且通常弯曲，并且每个探针被设置成使得其前端可以精确定位到 感兴趣的IC芯片的焊盘。 在进行探测测试时，最重要的条件是在测量时间内将探针接触压力保持在恒定位置，但是在高温下进行，加热的IC芯片辐射探针卡 接触点的位置偏差是由探针卡的热膨胀引起的，因此接触压力可能改变。 本发明的探针卡采用陶瓷材料制造探针卡，用于具有非常低的膨胀系数或者具有相当于IC芯片或晶片的系数值，从而避免了探针接触的位置偏差，并且其他装置可以应付 公开了在高温下由性能引起的困难。
-
公开(公告)号：US08344837B2
公开(公告)日：2013-01-01
申请号：US13216662
申请日：2011-08-24
申请人： Masami Niimi , Kouji Katahira , Masaki Akiyama
发明人： Masami Niimi , Kouji Katahira , Masaki Akiyama
CPC分类号： H01H51/065 , H01F5/04
摘要： In a solenoid apparatus, first and second cylindrical holding parts respectively have first and second opening parts. One flange part is provided with first and second notch portions. In an exciting coil, one line end portion is held by the first cylindrical holding part, and is bent immediately after the one line end portion is pulled from the first notch portion to the inside of the flange part. A line member is wound around a winding drum part toward the other side in the circumferential direction opposed to the opening direction of the first opening part and is wound a predetermined number of turns. Thereafter, the other line end portion is bent in the axial direction immediately in front of the second notch portion and is pulled out from the second notch portion to the outside of the flange part, and is then held by the second cylindrical holding part.
摘要翻译： 在螺线管装置中，第一和第二圆柱形保持部分别具有第一和第二开口部分。 一个凸缘部分设置有第一和第二切口部分。 在一个励磁线圈中，一个线端部由第一圆柱形保持部分保持，并且在一个线端部从第一切口部分拉到凸缘部分的内部之后立即弯曲。 线圈构件在与第一开口部的开口方向相反的圆周方向上朝向另一侧卷绕在卷绕鼓部上，并且卷绕预定数量的匝数。 此后，另一个线端部在轴向方向上立即在第二切口部分的前方弯曲，并从第二切口部分拉出到凸缘部分的外侧，然后被第二圆柱形保持部分保持。
-
-
搜索结果
3 条记录 (耗时 0.023 秒)
