摘要:
Even if a multiprocessor includes an uneven performance core, an inoperative core or a core that does not satisfy such a performance as designed but if the contrivance of task allocation can satisfy the requirement of an application to be executed, the multiple processors are shipped. In a task group allocation method for allocating, to a processor having a plurality of cores, task groups included in an application for the processor to execute, a calculation section measures performances and disposition patterns of the cores, generates a restricting condition associating the measured performances and disposition patterns of the cores with information indicating whether the application can be executed, and, with reference to the restricting condition, reallocates to the cores, the task groups that have previously been allocated to the cores.
摘要:
Even if a multiprocessor includes an uneven performance core, an inoperative core or a core that does not satisfy such a performance as designed but if the contrivance of task allocation can satisfy the requirement of an application to be executed, the multiple processors are shipped. In a task group allocation method for allocating, to a processor having a plurality of cores, task groups included in an application for the processor to execute, a calculation section measures performances and disposition patterns of the cores, generates a restricting condition associating the measured performances and disposition patterns of the cores with information indicating whether the application can be executed, and, with reference to the restricting condition, reallocates to the cores, the task groups that have previously been allocated to the cores.
摘要:
An apparatus for performing a screening test of a semiconductor integrated circuit is disclosed, the semiconductor integrated circuit comprising a plurality of processors each having an output signal for instruction execution information, and the processors being programmatically operable. The apparatus for performing a screening test of a semiconductor integrated circuit comprises: an instruction/data signal synchronization circuit for synchronizing the supplying of instructions to said respective processors and for synchronizing the supplying of data to said respective processors; and a trace comparison circuit for comparing instruction execution information that are output from the respective processors to determine whether or not any of said processors has output different instruction execution information.
摘要:
An information processing device comprises a plurality of processing units on which OSs and execution environments operate, and shared peripheral devices shared by the plurality of processing units. The information processing device is provided with a failure concealing device for concealing a failure which has occurred in a processing unit. The failure concealing device determines a substitutional processing unit that will act as a substitute for a failed processing unit so that the OS and execution environment which have operated on the failed processing unit will operate on the substitutional processing unit, switches the OS and execution environment which have operated on the failed processing unit so that they will operate on the substitutional processing unit, and switches a shared resource used by the failed processing unit such that it is available to the substitutional processing unit.
摘要:
A semiconductor integrated circuit comprising a processor having an output signal of instruction log information and being operable in a program in memory is disclosed. The semiconductor integrated circuit comprises trace determination circuit for comparing an instruction code that corresponds to the instruction log information from a processor with an instruction code that is read from the memory to detect faults.
摘要:
An information processing device comprises a plurality of processing units on which OSs and execution environments operate, and shared peripheral devices shared by the plurality of processing units. The information processing device is provided with a failure concealing device for concealing a failure which has occurred in a processing unit. The failure concealing device determines a substitutional processing unit that will act as a substitute for a failed processing unit so that the OS and execution environment which have operated on the failed processing unit will operate on the substitutional processing unit, switches the OS and execution environment which have operated on the failed processing unit so that they will operate on the substitutional processing unit, and switches a shared resource used by the failed processing unit such that it is available to the substitutional processing unit.
摘要:
An apparatus for performing a screening test of a semiconductor integrated circuit is disclosed, the semiconductor integrated circuit comprising a plurality of processors each having an output signal for instruction execution information, and the processors being programmatically operable. The apparatus for performing a screening test of a semiconductor integrated circuit comprises: an instruction/data signal synchronization circuit for synchronizing the supplying of instructions to said respective processors and for synchronizing the supplying of data to said respective processors; and a trace comparison circuit for comparing instruction execution information that are output from the respective processors to determine whether or not any of said processors has output different instruction execution information.
摘要:
A semiconductor integrated circuit comprising a processor having an output signal of instruction log information and being operable in a program in memory is disclosed. The semiconductor integrated circuit comprises trace determination circuit for comparing an instruction code that corresponds to the instruction log information from a processor with an instruction code that is read from the memory to detect faults.
摘要:
A damage control unit includes: a switching judgment unit to judge the CPU configuration which performs smoothing of the damage ratio, according to the damage ratio of the CPUs; and a switching unit to perform switching of I/O signals of all the CPUs. The switching judgment unit observes the damage ratio calculated from values such as the temperature, voltage, current consumption amount, operation ratio, the number of accesses to the resources in the CPU, at all times or at some extent of time intervals and notifies the switching unit of the CPU configuration to be changed by using the calculation method for smoothing the damage ratio of each CPU. The switching unit makes a connection to the I/O signals of all the CPUs and a system bus and switches the I/O signal of the CPU to be switched according to the notification from the switching judgment unit.
摘要:
A redundant computing system is composed of two systems: a first arithmetic processing unit (A-system) and a second arithmetic processing unit (B-system) having the same functions. A diagnosis control unit performs diagnosis of one system while the other system is performing arithmetic processing operation. The diagnosis control unit controls the input to the first and second arithmetic processing units by way of an input control unit according to the diagnosis operation, and an output control unit controls the output from the first and second arithmetic processing units according to the diagnosis result. After termination of the diagnosis, a value is copied from a storage unit of the system which has not been diagnosed to a storage unit of the system which has been diagnosed, and the redundant computing system resumes the redundant operation.