Infrared reflecting layer system for transparent substrate
    3.
    发明授权
    Infrared reflecting layer system for transparent substrate 失效
    用于透明基板的红外反射层系统

    公开(公告)号:US08119194B2

    公开(公告)日:2012-02-21

    申请号:US11749900

    申请日:2007-05-17

    IPC分类号: B05D5/06 C23C16/00

    摘要: An infrared radiation reflecting transparent layer system on a transparent substrate and a method for producing same is provided. The infrared radiation reflecting layer system comprises an infrared radiation reflecting layer sequence which includes a selective function usually consisting of a noble metal, mostly silver, or an alloy thereof and having a good selective reflectivity in the infrared range. The layer sequence is supplemented by at least one transparent dielectric layer of an oxynitride of a metal, a semiconductor or a semiconductor alloy having a low to moderate refractive index arranged directly on the substrate or above the infrared radiation reflecting layer sequence.

    摘要翻译: 提供了在透明基板上的红外线反射透明层系统及其制造方法。 红外线辐射反射层系统包括红外辐射反射层序列,其包括通常由贵金属(大部分为银)或其合金组成的选择性功能,并且在红外范围具有良好的选择性反射率。 该层序列由至少一个金属氧化物的透明介电层,半导体或半导体合金的半导体或半导体合金补充,该半导体或半导体合金直接布置在基板上或红外线辐射反射层序列上。

    Measuring device for measuring optical properties of transparent substrates
    4.
    发明授权
    Measuring device for measuring optical properties of transparent substrates 有权
    用于测量透明基板的光学性能的测量装置

    公开(公告)号:US08072607B2

    公开(公告)日:2011-12-06

    申请号:US12297893

    申请日:2007-10-30

    IPC分类号: G01N21/47

    摘要: A measuring device for measuring optical properties of transparent substrates includes a light transmitter and/or light receiver comprising a hollow cylinder having a highly reflective and diffusely dispersive inner surface. The light transmitter comprises a light source arranged in its interior and a light exit opening at a distance from the light source. The light receiver has a light sensor instead of the light source, at a distance from a light entrance opening. The light source and light sensor are arranged at such a distance from the light exit opening and light entrance opening respectively, given a corresponding direction of propagation of the light, that light emitted by the light source or received by the light sensor and multiply reflected in the hollow cylinder emerges as diffuse light from the light exit opening or is incident on the light sensor.

    摘要翻译: 用于测量透明基板的光学特性的测量装置包括:光发射器和/或光接收器,其包括具有高度反射和漫射色散的内表面的中空圆筒。 光发射器包括布置在其内部的光源和距离光源一定距离的光出射开口。 光接收器具有光传感器而不是光源,与光入口开口相距一定距离。 给出相应的光传播方向,光源和光传感器分别布置在与光出射开口和光入射口相距的距离处,由光源发射或由光传感器接收并被乘以反射的光 中空圆筒作为来自光出口的漫射光而出现,或者入射到光传感器上。

    Infrared reflecting layer system for transparent substrate
    5.
    发明授权
    Infrared reflecting layer system for transparent substrate 失效
    用于透明基板的红外反射层系统

    公开(公告)号:US08377578B2

    公开(公告)日:2013-02-19

    申请号:US13349007

    申请日:2012-01-12

    IPC分类号: B32B15/04

    摘要: An infrared radiation reflecting transparent layer system on a transparent substrate and a method for producing same is provided. The infrared radiation reflecting layer system comprises an infrared radiation reflecting layer sequence which includes a selective function usually consisting of a noble metal, mostly silver, or an alloy thereof and having a good selective reflectivity in the infrared range. The layer sequence is supplemented by at least one transparent dielectric layer of an oxynitride of a metal, a semiconductor or a semiconductor alloy having a low to moderate refractive index arranged directly on the substrate or above the infrared radiation reflecting layer sequence.

    摘要翻译: 提供了在透明基板上的红外线反射透明层系统及其制造方法。 红外线辐射反射层系统包括红外辐射反射层序列,其包括通常由贵金属(大部分为银)或其合金组成的选择性功能,并且在红外范围具有良好的选择性反射率。 该层序列由至少一个金属氧化物的透明介电层,半导体或半导体合金的半导体或半导体合金补充,该半导体或半导体合金直接布置在基板上或红外线辐射反射层序列上。

    LIGHT TRANSMITTER, LIGHT RECEIVER AND MEASURING DEVICE FOR MEASURING OPTICAL PROPERTIES OF TRANSPARENT SUBSTRATES
    6.
    发明申请
    LIGHT TRANSMITTER, LIGHT RECEIVER AND MEASURING DEVICE FOR MEASURING OPTICAL PROPERTIES OF TRANSPARENT SUBSTRATES 有权
    用于测量透明基板的光学特性的光发射器,光接收器和测量装置

    公开(公告)号:US20110007320A1

    公开(公告)日:2011-01-13

    申请号:US12297893

    申请日:2007-10-30

    IPC分类号: G01N21/47 G01N21/55

    摘要: A measuring device for measuring optical properties of transparent substrates includes a light transmitter and/or light receiver comprising a hollow cylinder having a highly reflective and diffusely dispersive inner surface. The light transmitter comprises a light source arranged in its interior and a light exit opening at a distance from the light source. The light receiver has a light sensor instead of the light source, at a distance from a light entrance opening. The light source and light sensor are arranged at such a distance from the light exit opening and light entrance opening respectively, given a corresponding direction of propagation of the light, that light emitted by the light source or received by the light sensor and multiply reflected in the hollow cylinder emerges as diffuse light from the light exit opening or is incident on the light sensor.

    摘要翻译: 用于测量透明基板的光学特性的测量装置包括:光发射器和/或光接收器,其包括具有高度反射和漫射色散的内表面的中空圆筒。 光发射器包括布置在其内部的光源和距离光源一定距离的光出射开口。 光接收器具有光传感器而不是光源,与光入口开口相距一定距离。 给出相应的光传播方向,光源和光传感器分别布置在与光出射开口和光入射口相距的距离处,由光源发射或由光传感器接收并被乘以反射的光 中空圆筒作为来自光出口的漫射光而出现,或者入射到光传感器上。

    ARRANGEMENT FOR COATING TAPE-SHAPED FILM SUBSTRATES
    7.
    发明申请
    ARRANGEMENT FOR COATING TAPE-SHAPED FILM SUBSTRATES 审中-公开
    涂层胶带薄膜的布置

    公开(公告)号:US20110139067A1

    公开(公告)日:2011-06-16

    申请号:US12999431

    申请日:2009-06-23

    IPC分类号: B05C9/12

    摘要: An arrangement for coating of sheet-like foil substrates having an unwinding roll and a winding roll between which the foil substrate is guided under sheet tension and a coating station arranged in between the rolls, permits vacuum coating of foil substrates in which surpassing of the maximum substrate temperature is prevented and high quality substrate transport is made possible. The coating station has at least two coating sources arranged in the direction of the sheet run one behind the other opposite the coating site of the foil substrate, and a support element that generates a support force resulting from the sheet tension on the back of the foil substrate as force component. The support element is arranged between two adjacent coating sources on the back of the substrate opposite the coating side and the foil substrate is freely tightened between two support elements.

    摘要翻译: 用于涂布具有退卷辊和卷绕辊的片状箔基板的布置,箔片基板在纸张张力之间被引导,布置在辊之间的涂布台可以真空涂覆超过最大值的箔基板 可以防止衬底温度的变化,从而可以实现高质量的衬底输送。 涂布站具有至少两个涂布源,其沿片材的方向布置在与箔基材的涂布部位相对的另一个之后,并且产生由箔的背面上的片张力产生的支撑力的支撑元件 基板作为力分量。 支撑元件布置在与涂层侧相对的基板的背面上的两个相邻涂层源之间,并且箔基板在两个支撑元件之间自由地紧固。

    Measuring instrument, in particular for transmission measurement in vacuum system
    8.
    发明授权
    Measuring instrument, in particular for transmission measurement in vacuum system 失效
    测量仪器,特别适用于真空系统中的传输测量

    公开(公告)号:US07443518B2

    公开(公告)日:2008-10-28

    申请号:US11400857

    申请日:2006-04-10

    IPC分类号: G01B11/06 G01B9/02 G01D5/36

    摘要: A measuring instrument, in particular for transmission measurement with transparent substrates, comprises a measuring head with a light emitting element for emitting a light beam and a light receiver element for recording an incident light beam, and a retro-reflector for reflection of the emitted light beam. The measuring instrument allows transmission measurements to be carried out on transparent substrates with only one reflection measuring head. The measuring instrument also allows reflection measurements to be carried out, for example on non-transparent substrates or by tilting the measuring head and covering the retro-reflector. The measuring instrument only requires one measuring head and can therefore be produced more cost-effectively. It does not require calibration, as the retro-reflector also reflects the light in the original direction in the case of oblique incidence and in the event of positional changes caused by process or operational factors (vibrations etc.).

    摘要翻译: 一种测量仪器,特别是用于透明基板的透射测量,包括具有用于发射光束的发光元件的测量头和用于记录入射光束的光接收元件,以及用于反射发射光的回射反射器 光束。 测量仪器允许在只有一个反射测量头的透明基板上进行透射测量。 测量仪器还允许进行反射测量,例如在非透明基板上,或者通过倾斜测量头并覆盖后向反射器。 测量仪器只需要一个测量头,因此可以更经济地生产。 它不需要校准,因为在倾斜入射的情况下以及由于过程或操作因素(振动等)引起的位置变化的情况下,回射器还反射原始方向的光。

    INFRARED REFLECTING LAYER SYSTEM FOR TRANSPARENT SUBSTRATE
    9.
    发明申请
    INFRARED REFLECTING LAYER SYSTEM FOR TRANSPARENT SUBSTRATE 失效
    用于透明基板的红外反射层系统

    公开(公告)号:US20080032157A1

    公开(公告)日:2008-02-07

    申请号:US11749900

    申请日:2007-05-17

    IPC分类号: B32B9/00 C23C16/00

    摘要: An infrared radiation reflecting transparent layer system on a transparent substrate and a method for producing same is provided. The infrared radiation reflecting layer system comprises an infrared radiation reflecting layer sequence which includes a selective function usually consisting of a noble metal, mostly silver, or an alloy thereof and having a good selective reflectivity in the infrared range. The layer sequence is supplemented by at least one transparent dielectric layer of an oxynitride of a metal, a semiconductor or a semiconductor alloy having a low to moderate refractive index arranged directly on the substrate or above the infrared radiation reflecting layer sequence.

    摘要翻译: 提供了在透明基板上的红外线反射透明层系统及其制造方法。 红外线辐射反射层系统包括红外辐射反射层序列,其包括通常由贵金属(大部分为银)或其合金组成的选择性功能,并且在红外范围具有良好的选择性反射率。 该层序列由至少一个金属氧化物的透明介电层,半导体或半导体合金的半导体或半导体合金补充,该半导体或半导体合金直接布置在基板上或红外线辐射反射层序列上。

    Measuring instrument, in particular for transmission measurement in vaccuum system
    10.
    发明申请
    Measuring instrument, in particular for transmission measurement in vaccuum system 失效
    测量仪器,特别是用于真空系统中的传输测量

    公开(公告)号:US20060256351A1

    公开(公告)日:2006-11-16

    申请号:US11400857

    申请日:2006-04-10

    IPC分类号: G01B11/06

    摘要: A measuring instrument, in particular for transmission measurement with transparent substrates, comprises a measuring head with a light emitting element for emitting a light beam and a light receiver element for recording an incident light beam, and a retro-reflector for reflection of the emitted light beam. The measuring instrument allows transmission measurements to be carried out on transparent substrates with only one reflection measuring head. The measuring instrument also allows reflection measurements to be carried out, for example on non-transparent substrates or by tilting the measuring head and covering the retro-reflector. The measuring instrument only requires one measuring head and can therefore be produced more cost-effectively. It does not require calibration, as the retro-reflector also reflects the light in the original direction in the case of oblique incidence and in the event of positional changes caused by process or operational factors (vibrations etc.).

    摘要翻译: 一种测量仪器,特别是用于透明基板的透射测量,包括具有用于发射光束的发光元件的测量头和用于记录入射光束的光接收元件,以及用于反射发射光的回射反射器 光束。 测量仪器允许在只有一个反射测量头的透明基板上进行透射测量。 测量仪器还允许进行反射测量,例如在非透明基板上,或者通过倾斜测量头并覆盖后向反射器。 测量仪器只需要一个测量头,因此可以更经济地生产。 它不需要校准,因为在倾斜入射的情况下以及由于过程或操作因素(振动等)引起的位置变化的情况下,回射器还反射原始方向的光。