公开(公告)号：US20080259973A1

公开(公告)日：2008-10-23

申请号：US12081398

申请日：2008-04-15

申请人： Hong Ki Kim ,  Bae Kyun Kim ,  June Sik Park ,  Dong Hoon Kang ,  Sang Su Hong ,  Chang Yun Lee ,  Tak Gyum Kim

发明人： Hong Ki Kim ,  Bae Kyun Kim ,  June Sik Park ,  Dong Hoon Kang ,  Sang Su Hong ,  Chang Yun Lee ,  Tak Gyum Kim

IPC分类号： H01S3/10

CPC分类号： G02F1/39 ,  G02F2001/3507 ,  G02F2001/354 ,  G02F2201/16

摘要： a wavelength converted laser apparatus includes a laser oscillator emitting an excitation laser beam having a first wavelength, a harmonic wave generator converting the excitation laser beam into a beam having a second wavelength lower than the first wavelength and an optical parametric oscillator converting and outputting the beam having the second wavelength into a beam having a continuously selectable specific wavelength. The optical parametric oscillator has an OPO crystal, a SHG crystal disposed at an output terminal of the optical parametric oscillator crystal to generate a second harmonic beam and a pair of high reflectivity mirrors for amplifying the beam outputted from the optical parametric oscillator.

摘要翻译： 波长转换激光装置包括：发射具有第一波长的激发激光束的激光振荡器;将激发激光束转换成具有低于第一波长的第二波长的波束的谐波发生器;以及光参量振荡器， 使第二波长成为具有可连续选择的特定波长的光束。 光参量振荡器具有OPO晶体，SHG晶体设置在光参量振荡器晶体的输出端，以产生二次谐波光束和一对用于放大从光参量振荡器输出的光束的高反射镜。

公开(公告)号：US20090091737A1

公开(公告)日：2009-04-09

申请号：US12196586

申请日：2008-08-22

申请人： Hong Ki KIM ,  Bae Kyun Kim ,  June Sik Park ,  Dong Hoon Kang ,  Sang Su Hong ,  Chang Yun Lee ,  Tak Gyum Kim

发明人： Hong Ki KIM ,  Bae Kyun Kim ,  June Sik Park ,  Dong Hoon Kang ,  Sang Su Hong ,  Chang Yun Lee ,  Tak Gyum Kim

IPC分类号： G01C3/08

CPC分类号： G01B11/026 ,  G01S7/4814 ,  G01S7/4818 ,  G01S17/10

摘要： A laser measuring device for precisely measuring a short distance is obtained by adding a relatively simple structure to a TOF laser measuring device that is simple and easily handled. The laser measuring device includes a light emitter, a light receiver and an optical length extender, which increases an optical path of emitted light or incident light.

摘要翻译： 通过向简单易操作的TOF激光测量装置添加相对简单的结构，可以获得精确测量短距离的激光测量装置。 激光测量装置包括光发射器，光接收器和光学长度延长器，其增加发射光或入射光的光路。

公开(公告)号：US07921674B2

公开(公告)日：2011-04-12

申请号：US12062165

申请日：2008-04-03

申请人： Hong Ki Kim ,  Bae Kyun Kim ,  June Sik Park ,  Dong Hoon Kang ,  Sang Su Hong ,  Chang Yun Lee ,  Tak Gyum Kim

发明人： Hong Ki Kim ,  Bae Kyun Kim ,  June Sik Park ,  Dong Hoon Kang ,  Sang Su Hong ,  Chang Yun Lee ,  Tak Gyum Kim

IPC分类号： C03C23/00

CPC分类号： G02B6/13

摘要： There is provided a method of manufacturing an optical waveguide, the method including: allowing a beam to be incident in an optical waveguide direction of an optical waveguide material; generating an optical soliton in the optical waveguide material by adjusting intensity of the incident beam according to the optical waveguide material; allowing the incident beam to be re-incident at an intensity higher than an intensity of the incident beam after checking generation of the optical soliton in the optical waveguide material; and increasing a refractive index of an optical soliton-generating area of the optical waveguide material by the re-incident beam to thereby form an optical waveguide.

摘要翻译： 提供了一种制造光波导的方法，该方法包括：使光束入射到光波导材料的光波导方向; 通过根据光波导材料调节入射光束的强度，在光波导材料中产生光孤子; 在检查光波导材料中的光孤子的产生之后，允许入射光束以比入射光束强度高的强度重新入射; 并且通过再入射光束增加光波导材料的光孤子产生区域的折射率，从而形成光波导。

公开(公告)号：US20080304136A1

公开(公告)日：2008-12-11

申请号：US12155584

申请日：2008-06-06

申请人： Hong Ki Kim ,  Bae Kyun Kim ,  June Sik Park ,  Dong Hoon Kang ,  Sang Su Hong ,  Kum Young Ji ,  Chang Yun Lee ,  Tak Gyum Kim

发明人： Hong Ki Kim ,  Bae Kyun Kim ,  June Sik Park ,  Dong Hoon Kang ,  Sang Su Hong ,  Kum Young Ji ,  Chang Yun Lee ,  Tak Gyum Kim

IPC分类号： G02F1/35

CPC分类号： G02F1/39 ,  G02F2201/34 ,  G02F2203/15

摘要： There is provided an optical parametric oscillator capable of converting a wavelength in a broader range and generating an output beam with high efficiency. The optical parametric oscillator includes: a non-linear optical material optical parametrically converting a beam pumped from a laser; and input and output optical devices opposing each other, the input and output optical devices guiding the optical parametrically-converted beam to the non-linear optical material to oscillate, wherein the input optical device includes an input optical mirror guiding the pumping beam into the oscillator, and the output optical device includes a plurality of output optical mirrors each guiding the optical parametrically-converted beam outside the oscillator, the output optical mirrors having reflectivities different from one another with respect to a wavelength of the optical parametrically-converted beam.

摘要翻译： 提供了能够在更宽范围内转换波长并且以高效率产生输出光束的光学参量振荡器。 所述光学参量振荡器包括：光学参量地转换从激光器泵浦的光束的非线性光学材料; 以及彼此相对的输入和输出光学器件，所述输入和输出光学器件将所述光学参量转换的光束引导到所述非线性光学材料以进行振荡，其中所述输入光学器件包括将所述泵浦光束引导到所述振荡器中的输入光学镜 并且输出光学装置包括多个输出光学镜，每个输出光镜将光学参量化转换的光束引导到振荡器外部，输出光学镜具有相对于光参量转换光束的波长彼此不同的反射率。

公开(公告)号：US20080245108A1

公开(公告)日：2008-10-09

申请号：US12062165

申请日：2008-04-03

申请人： Hong Ki Kim ,  Bae Kyun Kim ,  June Sik Park ,  Dong Hoon Kang ,  Sang Su Hong ,  Chang Yun Lee ,  Tak Gyun Kim

发明人： Hong Ki Kim ,  Bae Kyun Kim ,  June Sik Park ,  Dong Hoon Kang ,  Sang Su Hong ,  Chang Yun Lee ,  Tak Gyun Kim

IPC分类号： C03B37/022

CPC分类号： G02B6/13

摘要： There is provided a method of manufacturing an optical waveguide, the method including: allowing a beam to be incident in an optical waveguide direction of an optical waveguide material; generating an optical solution in the optical waveguide material by adjusting intensity of the incident beam according to the optical waveguide material; allowing the incident beam to be re-incident at an intensity higher than an intensity of the incident beam after checking generation of the optical solution in the optical waveguide material; and increasing a refractive index of an optical solution-generating area of the optical waveguide material by the re-incident beam to thereby form an optical waveguide.

摘要翻译： 提供了一种制造光波导的方法，该方法包括：使光束入射到光波导材料的光波导方向; 通过根据光波导材料调节入射光束的强度，在光波导材料中产生光学解决方案; 在检查光波导材料中的光学溶液的产生之后，允许入射光束以高于入射光束强度的强度重新入射; 并且通过再入射光束增加光波导材料的光溶液生成区域的折射率，从而形成光波导。

公开(公告)号：US20100183224A1

公开(公告)日：2010-07-22

申请号：US12690546

申请日：2010-01-20

申请人： June Sik Park ,  Bae Kyun Kim ,  Dong Hoon Kang ,  Dong Yul Lee ,  Sang Su Hong

发明人： June Sik Park ,  Bae Kyun Kim ,  Dong Hoon Kang ,  Dong Yul Lee ,  Sang Su Hong

IPC分类号： G06K9/46 ,  G01R31/00

CPC分类号： G06T5/009 ,  G06T7/12 ,  G06T7/136 ,  G06T2207/10061

摘要： Disclosed are a method and system for evaluating current spreading of a light emitting device. The method includes applying current to a light emitting device and acquiring a luminescence image corresponding to a digital signal, converting the luminescence image into a gray image, and determining the number of pixels having gray levels greater than a set threshold among pixels included in the luminescence image converted into the gray image, as a criterion for determining the degree of current spreading of the light emitting device.The luminescent area of the light emitting device is quantified as an objective value on the two-dimensional plane by using an image processing technique, so that the degree of current spreading in the light emitting device can be evaluated.

摘要翻译： 公开了一种用于评估发光器件的电流扩展的方法和系统。 该方法包括将电流施加到发光器件并获取对应于数字信号的发光图像，将发光图像转换成灰度图像，以及确定在发光中包括的像素中具有大于设定阈值的灰度级的像素数量 图像转换为灰度图像，作为确定发光装置的电流扩展程度的标准。 通过使用图像处理技术将发光器件的发光区域量化为二维平面上的目标值，从而可以评估发光器件中的电流扩展程度。

公开(公告)号：US20080062512A1

公开(公告)日：2008-03-13

申请号：US11896530

申请日：2007-09-04

申请人： Sang Su Hong ,  Bae Kyun Kim ,  June Sik Park ,  Grigory Onushkin

发明人： Sang Su Hong ,  Bae Kyun Kim ,  June Sik Park ,  Grigory Onushkin

IPC分类号： G02B21/06

CPC分类号： G02B21/0076

摘要： A confocal electroluminescence spectral microscope including: a base board where an object including a material capable of emitting light is mounted; a power supply supplying current to enable the object mounted on the base board to electrically emit light; a confocal lens disposed above the base board to receive the light emitted from the object; a detection part disposed above the confocal lens to obtain energy distribution with respect to the light emitted from the object; and a pin hole disposed between the confocal lens and the detection part to allow a luminescence signal for a confocal point formed on a target surface of the object.

摘要翻译： 一种共焦电致发光光谱显微镜，包括：安装有包含能够发光的材料的物体的基板; 电源供给电流以使安装在基板上的物体能够发光; 设置在所述基板上方以接收从所述物体发射的光的共焦透镜; 检测部，其设置在所述共焦透镜的上方，以获得相对于从所述物体发射的光的能量分布; 以及设置在共焦透镜和检测部分之间的针孔，以允许形成在物体的目标表面上的共焦点的发光信号。

公开(公告)号：US20120176623A1

公开(公告)日：2012-07-12

申请号：US13076060

申请日：2011-03-30

申请人： Chang Yun Lee ,  Suk Jin Ham ,  June Sik Park

发明人： Chang Yun Lee ,  Suk Jin Ham ,  June Sik Park

IPC分类号： G01B11/02

CPC分类号： G01B9/02044 ,  G01B9/0203 ,  G01B9/0209 ,  G01B9/02091 ,  G01B11/0675 ,  G01N21/45 ,  G01N21/8422 ,  G01N2021/8438

摘要： Disclosed herein are an apparatus and method for measuring characteristics of multi-layered thin films. There is provided an apparatus for measuring characteristics of multi-layered films, including: a light source member irradiating light to a sample formed of the multi-layered thin films; an interference-reflection member splitting light into a first beam for acquiring reference reflection light and a second beam for acquiring sample reflection light, and generating an interference signal when the light shutter is opened, and generating the reflection signal when the light shutter is closed; a sample member scanning and irradiating the sample by the second beam and transferring a support to which the sample is fixed; an interference-reflection light detection member splitting and detecting the intensity of the generated interference signal and reflection signal for each wavelength; and a signal processing member using the intensity of the interference signal for each wavelength and the reflection signal for each wavelength detected from the interference-reflection detection unit to image the multi-layered thin films of the sample, calculating reflectivity, refractive index, and the thickness of the multi-layered thin films. By this configuration, the performance of measuring characteristics of multi-layered thin films can be improved.

摘要翻译： 本发明公开了一种用于测量多层薄膜特性的装置和方法。 提供了一种用于测量多层膜的特性的装置，包括：将光照射到由多层薄膜形成的样品上的光源; 干涉反射构件将光分成用于获取参考反射光的第一光束和用于获取样本反射光的第二光束，并且当光闸打开时产生干涉信号，并且当光快门关闭时产生反射信号; 样品构件通过第二光束扫描和照射样品并转移固定有样品的载体; 干涉反射光检测部件，分别检测所生成的干涉信号的强度和各波长的反射信号; 以及信号处理部件，对于每个波长使用干涉信号的强度和从干涉反射检测部检测出的每个波长的反射信号，对样品的多层薄膜进行成像，计算反射率，折射率和 多层薄膜的厚度。 通过该结构，能够提高多层薄膜的测定特性的性能。