摘要:
Disclosed are a method and system for evaluating current spreading of a light emitting device. The method includes applying current to a light emitting device and acquiring a luminescence image corresponding to a digital signal, converting the luminescence image into a gray image, and determining the number of pixels having gray levels greater than a set threshold among pixels included in the luminescence image converted into the gray image, as a criterion for determining the degree of current spreading of the light emitting device.The luminescent area of the light emitting device is quantified as an objective value on the two-dimensional plane by using an image processing technique, so that the degree of current spreading in the light emitting device can be evaluated.
摘要:
a wavelength converted laser apparatus includes a laser oscillator emitting an excitation laser beam having a first wavelength, a harmonic wave generator converting the excitation laser beam into a beam having a second wavelength lower than the first wavelength and an optical parametric oscillator converting and outputting the beam having the second wavelength into a beam having a continuously selectable specific wavelength. The optical parametric oscillator has an OPO crystal, a SHG crystal disposed at an output terminal of the optical parametric oscillator crystal to generate a second harmonic beam and a pair of high reflectivity mirrors for amplifying the beam outputted from the optical parametric oscillator.
摘要:
There is provided a method of manufacturing an optical waveguide, the method including: allowing a beam to be incident in an optical waveguide direction of an optical waveguide material; generating an optical solution in the optical waveguide material by adjusting intensity of the incident beam according to the optical waveguide material; allowing the incident beam to be re-incident at an intensity higher than an intensity of the incident beam after checking generation of the optical solution in the optical waveguide material; and increasing a refractive index of an optical solution-generating area of the optical waveguide material by the re-incident beam to thereby form an optical waveguide.
摘要:
A laser measuring device for precisely measuring a short distance is obtained by adding a relatively simple structure to a TOF laser measuring device that is simple and easily handled. The laser measuring device includes a light emitter, a light receiver and an optical length extender, which increases an optical path of emitted light or incident light.
摘要:
There is provided a method of manufacturing an optical waveguide, the method including: allowing a beam to be incident in an optical waveguide direction of an optical waveguide material; generating an optical soliton in the optical waveguide material by adjusting intensity of the incident beam according to the optical waveguide material; allowing the incident beam to be re-incident at an intensity higher than an intensity of the incident beam after checking generation of the optical soliton in the optical waveguide material; and increasing a refractive index of an optical soliton-generating area of the optical waveguide material by the re-incident beam to thereby form an optical waveguide.
摘要:
There is provided an optical parametric oscillator capable of converting a wavelength in a broader range and generating an output beam with high efficiency. The optical parametric oscillator includes: a non-linear optical material optical parametrically converting a beam pumped from a laser; and input and output optical devices opposing each other, the input and output optical devices guiding the optical parametrically-converted beam to the non-linear optical material to oscillate, wherein the input optical device includes an input optical mirror guiding the pumping beam into the oscillator, and the output optical device includes a plurality of output optical mirrors each guiding the optical parametrically-converted beam outside the oscillator, the output optical mirrors having reflectivities different from one another with respect to a wavelength of the optical parametrically-converted beam.
摘要:
A confocal electroluminescence spectral microscope including: a base board where an object including a material capable of emitting light is mounted; a power supply supplying current to enable the object mounted on the base board to electrically emit light; a confocal lens disposed above the base board to receive the light emitted from the object; a detection part disposed above the confocal lens to obtain energy distribution with respect to the light emitted from the object; and a pin hole disposed between the confocal lens and the detection part to allow a luminescence signal for a confocal point formed on a target surface of the object.
摘要:
Disclosed herein are an apparatus and method for measuring characteristics of multi-layered thin films. There is provided an apparatus for measuring characteristics of multi-layered films, including: a light source member irradiating light to a sample formed of the multi-layered thin films; an interference-reflection member splitting light into a first beam for acquiring reference reflection light and a second beam for acquiring sample reflection light, and generating an interference signal when the light shutter is opened, and generating the reflection signal when the light shutter is closed; a sample member scanning and irradiating the sample by the second beam and transferring a support to which the sample is fixed; an interference-reflection light detection member splitting and detecting the intensity of the generated interference signal and reflection signal for each wavelength; and a signal processing member using the intensity of the interference signal for each wavelength and the reflection signal for each wavelength detected from the interference-reflection detection unit to image the multi-layered thin films of the sample, calculating reflectivity, refractive index, and the thickness of the multi-layered thin films. By this configuration, the performance of measuring characteristics of multi-layered thin films can be improved.