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1.Method of influencing minority carrier lifetime in the semiconductor body of a pn junction device 失效
Title translation: 影响pn结器件半导体主体中少数载流子寿命的方法公开(公告)号:US3195218A
公开(公告)日:1965-07-20
申请号:US21988062
申请日:1962-08-28
Applicant: IBM
Inventor: MILLER WILLIAM H , RIDEOUT ARTHUR J , WORTHINGTON THOMAS K
IPC: H01L21/00 , H01L21/322 , H01L23/29 , H01L29/00
CPC classification number: H01L23/291 , H01L21/00 , H01L21/3221 , H01L29/00 , H01L2224/4847 , Y10S438/904 , Y10S438/938
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2.Method of fabricating a plurality of pn junctions in a semiconductor body 失效
Title translation: 在半导体本体中制造多个pn结的方法公开(公告)号:US3144366A
公开(公告)日:1964-08-11
申请号:US13177161
申请日:1961-08-16
Applicant: IBM
Inventor: RIDEOUT ARTHUR J , WORTHINGTON THOMAS K
IPC: C23C14/04 , H01L21/00 , H01L21/316 , H01L29/00
CPC classification number: H01L21/00 , C23C14/042 , H01L21/02164 , H01L21/02269 , H01L21/31612 , H01L29/00 , Y10S148/106 , Y10S148/169
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