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公开(公告)号:US11583169B2
公开(公告)日:2023-02-21
申请号:US16987744
申请日:2020-08-07
Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
Inventor: Chun-Chieh Huang , Yuan Chin Lee , Chi Shen Chang , Hung Chih Chiang
Abstract: An optical fiber scanning probe includes a rotor and at least one optical fiber. The rotor includes a torque rope rotatable about its central axis. The optical fiber is disposed on the rotor and eccentric relative to the torque rope. A central axis of the optical fiber is substantially parallel to the central axis of the torque rope. When the torque rope rotates about its central axis, the rotor brings a free end of the optical fiber to scan along an arc path.
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公开(公告)号:US10890429B2
公开(公告)日:2021-01-12
申请号:US16379721
申请日:2019-04-09
Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
Inventor: Hung Chih Chiang , Cheng Yi Chang , Ting Wei Chang , Chi Shen Chang
IPC: G01B9/02
Abstract: An automatic calibration optical interferometer comprises: a light source; an optical interference assembly, which divides a low coherent light into a first and a second incident light; an optical sampling assembly, with a first end receiving the first incident light and a partially reflective window at the second end being configured to divide the first incident light into a first reflected light and a first penetrating light configured to be emitted to the test sample; an optical reference assembly, with a reference mirror and an actuator, wherein the optical sampling assembly emits the second incident light to the reference mirror to generate a second reflected light, and the actuator moves the reference mirror; a polychromator, which outputs a displacement signal according to an optical path difference variation between the first and second reflected lights; and a displacement controller, which controls the actuator according to the displacement signal.
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公开(公告)号:US11730548B2
公开(公告)日:2023-08-22
申请号:US17125785
申请日:2020-12-17
Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
Inventor: De Yi Chiou , Kai-Hsiang Chen , Chi Shen Chang
CPC classification number: A61B34/20 , A61B5/0066 , A61N1/0534 , G02B26/103 , G02B27/106 , A61B5/0042 , A61B2034/2055
Abstract: An OCT scanning probe includes a tubular housing, at least one electrode, an optical fiber scanner and an auxiliary localization component. The electrode is disposed on an outer surface of the tubular housing. The optical fiber scanner is disposed in the tubular housing and includes an optical fiber and an optical element. The optical element is disposed on an emitting end of the optical fiber and at corresponding position to a light transmittable portion of the tubular housing. The auxiliary localization component is disposed on the tubular housing, and overlaps part of the light transmittable portion. A light beam emitted from the optical fiber scanner passes through the light transmittable portion to obtain a tomographic image. An interaction of the light beam with the auxiliary localization component causes a characteristic in the tomographic image, with the characteristic corresponding to the auxiliary localization component.
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公开(公告)号:US10976151B2
公开(公告)日:2021-04-13
申请号:US16232689
申请日:2018-12-26
Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
Inventor: Yuan Chin Lee , Ting Wei Chang , Chi Shen Chang , Chy Lin Wang
Abstract: An optical interferometer includes a beam splitter module and an optical sensor. The beam splitter module includes a lens assembly and a splitter cube. A light incident surface of the splitter cube is substantially orthogonal to an optical axis of the lens assembly. An acute angle is between the light incident surface and a light splitting surface of the splitter cube. A sampling surface of the splitter cube is substantially parallel to the light incident surface. A light reflecting surface of the splitter cube is substantially orthogonal to the light incident surface. The light incident surface is closer to the lens assembly than the sampling surface. A reference arm is defined between a splitter position on the light splitting surface and the light reflecting surface, a sample arm is defined between the splitter position and the sampling surface, and the reference arm is longer than the sample arm.
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