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1.发明授权Voltage and temperature sensor for a serializer/deserializer communication application 有权用于串行器/解串器通信应用的电压和温度传感器公开(公告)号：US09212952B1
公开(公告)日：2015-12-15
申请号：US13802219
申请日：2013-03-13
Applicant: Inphi Corporation
Inventor： Karthik S. Gopalakrishnan , Sadettin Cirit
IPC: G01K7/00
CPC classification number: G01K13/00 , G01K7/00 , G01K7/01 , G01K2219/00 , G01R19/2503 , H04Q9/14
Abstract: The present invention relates generally to integrated circuits. More particularly, the present invention provides a circuit and method for sensing a voltage and/or temperature from an integrated circuit device such as a Serializer/Deserializer (SerDes) integrated circuit device. But it will be recognized that the technique can be used for monitoring other system on chip devices, such as micro-controllers, digital signal processors, microprocessors, networking devices, application specific integrated circuits, and other integrated circuit devices that may desire on-chip temperature and/or voltage sensing capability.
Abstract translation: 本发明一般涉及集成电路。 更具体地说，本发明提供了用于从诸如串行器/解串器（SerDes）集成电路器件的集成电路器件感测电压和/或温度的电路和方法。 但是将会认识到，该技术可以用于监视片上设备，例如微控制器，数字信号处理器，微处理器，网络设备，专用集成电路以及可能需要片上的其它集成电路设备 温度和/或电压感测能力。
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2.发明授权Voltage and temperature sensor for a serializer/deserializer communication application 有权用于串行器/解串器通信应用的电压和温度传感器公开(公告)号：US09587992B1
公开(公告)日：2017-03-07
申请号：US14021955
申请日：2013-09-09
Applicant: Inphi Corporation
Inventor： Sadettin Cirit , Karthik S. Gopalakrishnan
IPC: G01K7/00
CPC classification number: G01K7/00 , G01K1/14 , G01K7/01 , G01K13/00 , G01K15/005 , G01K2219/00 , G01R19/2503 , H04Q9/00
Abstract: The present invention relates to integrated circuits. More specifically, embodiments of the present invention provide methods and systems for determining temperatures of an integrated circuit using an one-point calibration technique, where temperature is determined by a single temperature measurement and calculation using known electrical characteristics of the integrated circuit.
Abstract translation: 集成电路技术领域本发明涉及集成电路。 更具体地，本发明的实施例提供了使用单点校准技术来确定集成电路的温度的方法和系统，其中温度通过单个温度测量和使用集成电路的已知电气特性的计算来确定。
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公开(公告)号：US10458856B2
公开(公告)日：2019-10-29
申请号：US15409828
申请日：2017-01-19
Applicant: INPHI CORPORATION
Inventor： Sadettin Cirit , Karthik S. Gopalakrishnan
Abstract: The present invention relates to integrated circuits. More specifically, embodiments of the present invention provide methods and systems for determining temperatures of an integrated circuit using an one-point calibration technique, where temperature is determined by a single temperature measurement and calculation using known electrical characteristics of the integrated circuit.
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公开(公告)号：US09683903B2
公开(公告)日：2017-06-20
申请号：US14938137
申请日：2015-11-11
Applicant: INPHI CORPORATION
Inventor： Karthik S. Gopalakrishnan , Sadettin Cirit
CPC classification number: G01K13/00 , G01K7/00 , G01K7/01 , G01K2219/00 , G01R19/2503 , H04Q9/14
Abstract: The present invention relates generally to integrated circuits. More particularly, the present invention provides a circuit and method for sensing a voltage and/or temperature from an integrated circuit device such as a Serializer/Deserializer (SerDes) integrated circuit device. But it will be recognized that the technique can be used for monitoring other system on chip devices, such as micro-controllers, digital signal processors, microprocessors, networking devices, application specific integrated circuits, and other integrated circuit devices that may desire on-chip temperature and/or voltage sensing capability.
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