公开(公告)号：US20160178694A1

公开(公告)日：2016-06-23

申请号：US14574746

申请日：2014-12-18

Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION

Inventor： Jonathan R. Fry ,  Christopher Klabes ,  Andrew J. Martin ,  Vincent J. McGahay ,  Kathryn E. Schlichting ,  Melissa A. Smith

IPC: G01R31/28 ,  G01C22/00

CPC classification number: G01R31/2896 ,  G01C22/00

Abstract: Approaches for detecting wear in integrated circuit chips are provided. An on-chip sensor system includes an integrated circuit chip including a plurality of sensor groups. Each respective one of the sensor groups is structured and arranged to detect a measure of wear corresponding to a respective one of a plurality of failure mechanisms.

Abstract translation: 提供了集成电路芯片中的磨损检测方法。 片上传感器系统包括包括多个传感器组的集成电路芯片。 每个传感器组中的每个传感器组被构造和布置成检测对应于多个故障机构中的相应一个的磨损量度。

公开(公告)号：US10060974B2

公开(公告)日：2018-08-28

申请号：US14574746

申请日：2014-12-18

Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION

Inventor： Jonathan R. Fry ,  Christopher Klabes ,  Andrew J. Martin ,  Vincent J. McGahay ,  Kathryn E. Schlichting ,  Melissa A. Smith

IPC: G01R31/26 ,  G01R31/28 ,  G01C22/00

CPC classification number: G01R31/2896 ,  G01C22/00 ,  G01R31/2884

Abstract: Approaches for detecting wear in integrated circuit chips are provided. An on-chip sensor system includes an integrated circuit chip including a plurality of sensor groups. Each respective one of the sensor groups is structured and arranged to detect a measure of wear corresponding to a respective one of a plurality of failure mechanisms.