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公开(公告)号:US20190013244A1
公开(公告)日:2019-01-10
申请号:US16114816
申请日:2018-08-28
Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
IPC: H01L21/8234 , H01L29/786 , H01L21/02 , H01L29/775 , H01L29/66 , H01L29/423 , H01L29/40 , H01L29/08 , H01L29/06 , H01L27/088 , H01L21/306 , H01L29/78
Abstract: A semiconductor device includes a first gate stack arranged about a first nanowire and a second nanowire, the first nanowire is arranged above a second nanowire, the first nanowire is connected to a first source/drain region and a second source/drain region. A second gate stack is arranged about a third nanowire and a fourth nanowire, the third nanowire is arranged above a fourth nanowire, the third nanowire is connected to a third source/drain region and a fourth source/drain region. An insulator layer having a first thickness is arranged adjacent to the first gate stack.