Image analysis useful for patterned objects

    公开(公告)号:US11308640B2

    公开(公告)日:2022-04-19

    申请号:US16706092

    申请日:2019-12-06

    申请人: ILLUMINA, INC.

    IPC分类号: G06T7/73

    摘要: A method of registering features in a repeating pattern can include (a) providing an object having a repeating pattern of features and a fiducial; (b) obtaining a target image of the object, wherein the target image includes the repeating pattern of features and the fiducial; (c) comparing the fiducial in the target image to reference data, wherein the reference data includes xy coordinates for a virtual fiducial; and (d) determining locations for the features in the target image based on the comparison of the virtual fiducial in the reference data to the fiducial in the data from the target image. The fiducial can have at least concentric circles that produce three different signal levels. The locations of the features can be determined at a variance of less than 5 μm.

    IMAGE ANALYSIS USEFUL FOR PATTERNED OBJECTS
    10.
    发明申请

    公开(公告)号:US20200250851A1

    公开(公告)日:2020-08-06

    申请号:US16706092

    申请日:2019-12-06

    申请人: ILLUMINA, INC.

    IPC分类号: G06T7/73

    摘要: A method of registering features in a repeating pattern can include (a) providing an object having a repeating pattern of features and a fiducial; (b) obtaining a target image of the object, wherein the target image includes the repeating pattern of features and the fiducial; (c) comparing the fiducial in the target image to reference data, wherein the reference data includes xy coordinates for a virtual fiducial; and (d) determining locations for the features in the target image based on the comparison of the virtual fiducial in the reference data to the fiducial in the data from the target image. The fiducial can have at least concentric circles that produce three different signal levels. The locations of the features can be determined at a variance of less than 5 μm.