公开(公告)号：US10990534B2

公开(公告)日：2021-04-27

申请号：US16264447

申请日：2019-01-31

Applicant: Intel Corporation

Inventor： Wei Chen ,  Eswaramoorthi Nallusamy ,  Larisa Novakovsky ,  Mark Schmisseur ,  Eric Rasmussen ,  Stephen Van Doren ,  Yen-Cheng Liu

IPC: G06F12/08 ,  G06F12/0891 ,  G06F12/0802 ,  G06F12/02

Abstract: Techniques and mechanisms for capturing an image of processor state at one node of multiple nodes of a multi-processor platform, where the processor state includes some version of data which the node retrieved from another node of the platform. In an embodiment, a disruption of power is detected when a processor of a first node has a cached version of data which was retrieved from a second node. In response to detection of the disruption, the data is saved to a system memory of the first node as part of an image of the processor's state. The image further comprises address information, corresponding to the data, which indicates a memory location at the second node. In another embodiment, processor state is restored during a boot-up of the node, wherein the state includes the captured version of data which was previously retrieved from the second node.

公开(公告)号：US09612930B2

公开(公告)日：2017-04-04

申请号：US14737768

申请日：2015-06-12

Applicant: Intel Corporation

Inventor： Vedvyas Shanbhogue ,  Eric Rasmussen ,  Deep K. Buch ,  Gordon McFadden ,  Kameswar Subramaniam ,  Amy L. Santoni ,  Willard M. Wiseman ,  Bret L. Toll

IPC: G06F11/00 ,  G06F11/263 ,  G06F11/22 ,  G06F11/14

CPC classification number: G06F11/2635 ,  G06F11/1417 ,  G06F11/1433 ,  G06F11/2242 ,  G06F11/2268 ,  G06F11/27

Abstract: In an embodiment, a processor includes at least one core, a power management unit having a first test register including a first field to store a test patch identifier associated with a test patch and a second field to store a test mode indicator to request a core functionality test, and a microcode storage to store microcode to be executed by the at least one core. Responsive to the test patch identifier, the microcode may access a firmware interface table and obtain the test patch from a non-volatile storage according to an address obtained from the firmware interface table. Other embodiments are described and claimed.