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公开(公告)号:US20240282667A1
公开(公告)日:2024-08-22
申请号:US18635894
申请日:2024-04-15
申请人: Intel Corporation
发明人: Weston BERTRAND , Kyle ARRINGTON , Shankar DEVASENATHIPATHY , Aaron MCCANN , Nicholas NEAL , Zhimin WAN
IPC分类号: H01L23/433 , H01L23/367 , H01L25/065
CPC分类号: H01L23/433 , H01L23/3675 , H01L25/0657
摘要: Embodiments of the present disclosure may generally relate to systems, apparatuses, techniques, and/or processes directed to packages that include stacked dies that use thermal conductivity features including thermally conductive through silicon vias (TSVs) filled with thermally conductive material located in passive areas of a first die to route heat from a first die away from a second die that is coupled with the first die. In embodiments, the first die may be referred to as a base die. Embodiments may include thermal blocks in the form of dummy dies that include TSVs at least partially filled with thermal energy conducting material such as copper, solder, or other alloy.
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公开(公告)号:US20210257277A1
公开(公告)日:2021-08-19
申请号:US16794789
申请日:2020-02-19
申请人: Intel Corporation
发明人: Weston BERTRAND , Kyle ARRINGTON , Shankar DEVASENATHIPATHY , Aaron MCCANN , Nicholas NEAL , Zhimin WAN
IPC分类号: H01L23/433 , H01L23/367 , H01L25/065
摘要: Embodiments of the present disclosure may generally relate to systems, apparatuses, techniques, and/or processes directed to packages that include stacked dies that use thermal conductivity features including thermally conductive through silicon vias (TSVs) filled with thermally conductive material located in passive areas of a first die to route heat from a first die away from a second die that is coupled with the first die. In embodiments, the first die may be referred to as a base die. Embodiments may include thermal blocks in the form of dummy dies that include TSVs at least partially filled with thermal energy conducting material such as copper, solder, or other alloy.
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公开(公告)号:US20230128903A1
公开(公告)日:2023-04-27
申请号:US18088478
申请日:2022-12-23
申请人: Intel Corporation
发明人: Weston BERTRAND , Kyle ARRINGTON , Shankar DEVASENATHIPATHY , Aaron MCCANN , Nicholas NEAL , Zhimin WAN
IPC分类号: H01L23/433 , H01L25/065 , H01L23/367
摘要: Embodiments of the present disclosure may generally relate to systems, apparatuses, techniques, and/or processes directed to packages that include stacked dies that use thermal conductivity features including thermally conductive through silicon vias (TSVs) filled with thermally conductive material located in passive areas of a first die to route heat from a first die away from a second die that is coupled with the first die. In embodiments, the first die may be referred to as a base die. Embodiments may include thermal blocks in the form of dummy dies that include TSVs at least partially filled with thermal energy conducting material such as copper, solder, or other alloy.
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