公开(公告)号：US20170192057A1

公开(公告)日：2017-07-06

申请号：US15180281

申请日：2016-06-13

Applicant: International Business Machines Corporation

Inventor： SATYA R.S. BHAMIDIPATI ,  RAGHU G. GOPALAKRISHNASETTY ,  MARY P. KUSKO ,  CEDRIC LICHTENAU

IPC: G01R31/3177 ,  G01R31/317

Abstract: Aspects include a method for logic built-in self-testing (LBIST) for use in an integrated circuit with scan chains. The method includes programming a product control generator and a pattern generator with an LBIST pattern comprising at least a number of loops. The LBIST pattern is executed by generating scan-in test values for scan chains with the pattern generator and controlling at least one test parameter with the product control generator. Scan-out responses are collected from the scan chains in a signature register, and a start request is received from a chip tester. The LBIST is started in response to the start request. Test summary data is reported to the chip tester before the whole number of loops has been executed.

公开(公告)号：US20170254850A1

公开(公告)日：2017-09-07

申请号：US15291269

申请日：2016-10-12

Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION

Inventor： WILLIAM V. HUOTT ,  ANKIT N. KAGLIWAL ,  MARY P. KUSKO ,  ROBERT C. REDBURN

IPC: G01R31/3177 ,  G01R31/317

CPC classification number: G01R31/31721 ,  G01R31/31704 ,  G01R31/31723 ,  G01R31/3177 ,  G06F17/505 ,  G06F17/5068

Abstract: Aspects include a computer-implemented method for scan diagnostic logic circuit insertion in a circuit design topology. A method includes evaluating a scan chain of the circuit design topology, the scan chain comprising a plurality of scan latches and a plurality of physical structures, the evaluating including identifying the plurality of physical structures in the scan chain. The method also includes identifying one of the plurality of physical structures as a physical structure of interest, and responsive to the identification of the physical structure of interest, targeting the physical structure of interest, the targeting comprising inserting scan diagnostic logic at a location in the scan chain that is based on a location of the physical structure of interest in the scan chain.

公开(公告)号：US20180196497A1

公开(公告)日：2018-07-12

申请号：US15404355

申请日：2017-01-12

Applicant: International Business Machines Corporation

Inventor： STEVEN M. DOUSKEY ,  RAGHU G. GOPALAKRISHNASETTY ,  MARY P. KUSKO ,  HARI KRISHNAN RAJEEV ,  JAMES D. WARNOCK

IPC: G06F1/32

CPC classification number: G06F1/3287 ,  G06F1/26 ,  G06F1/3296

Abstract: Operating pulsed latches on a variable power supply including turning on a first power rail powering a first latch of an integrated circuit, wherein the first latch is a pulsed latch; turning on a second power rail powering a second latch of the integrated circuit, wherein the second latch is operatively coupled to the first latch; performing a scan operation using the first latch and the second latch; turning off the first power rail powering the first latch; and performing a functional operation using the second latch, wherein the first power rail powering the first latch is off during the functional operation.

公开(公告)号：US20170254851A1

公开(公告)日：2017-09-07

申请号：US15057240

申请日：2016-03-01

Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION

Inventor： WILLIAM V. HUOTT ,  ANKIT N. KAGLIWAL ,  MARY P. KUSKO ,  ROBERT C. REDBURN

IPC: G01R31/3185 ,  G06F17/50

CPC classification number: G01R31/31721 ,  G01R31/31704 ,  G01R31/31723 ,  G01R31/3177 ,  G06F17/505 ,  G06F17/5068

Abstract: Aspects include a computer-implemented method for scan diagnostic logic circuit insertion in a circuit design topology. A method includes evaluating a scan chain of the circuit design topology, the scan chain comprising a plurality of scan latches and a plurality of physical structures, the evaluating including identifying the plurality of physical structures in the scan chain. The method also includes identifying one of the plurality of physical structures as a physical structure of interest, and responsive to the identification of the physical structure of interest, targeting the physical structure of interest, the targeting comprising inserting scan diagnostic logic at a location in the scan chain that is based on a location of the physical structure of interest in the scan chain.

公开(公告)号：US20190286221A1

公开(公告)日：2019-09-19

申请号：US16432524

申请日：2019-06-05

Applicant: International Business Machines Corporation

Inventor： STEVEN M. DOUSKEY ,  Raghu G. Gopalakrishnasetty ,  MARY P. KUSKO ,  Hari Krishnan Rajeev ,  JAMES D. WARNOCK

IPC: G06F1/3287 ,  G06F1/3296 ,  G06F1/26

Abstract: Operating pulsed latches on a variable power supply including turning on a first power rail powering a first latch of an integrated circuit, wherein the first latch is a pulsed latch; turning on a second power rail powering a second latch of the integrated circuit, wherein the second latch is operatively coupled to the first latch; performing a scan operation using the first latch and the second latch; turning off the first power rail powering the first latch; and performing a functional operation using the second latch, wherein the first power rail powering the first latch is off during the functional operation.