公开(公告)号：US11112854B2

公开(公告)日：2021-09-07

申请号：US16432524

申请日：2019-06-05

Applicant: International Business Machines Corporation

Inventor： Steven M. Douskey ,  Raghu G. Gopalakrishnasetty ,  Mary P. Kusko ,  Hari Krishnan Rajeev ,  James D. Warnock

IPC: G06F1/32 ,  G06F1/26 ,  G06F1/3287 ,  G06F1/3296

Abstract: Operating pulsed latches on a variable power supply including turning on a first power rail powering a first latch of an integrated circuit, wherein the first latch is a pulsed latch; turning on a second power rail powering a second latch of the integrated circuit, wherein the second latch is operatively coupled to the first latch; performing a scan operation using the first latch and the second latch; turning off the first power rail powering the first latch; and performing a functional operation using the second latch, wherein the first power rail powering the first latch is off during the functional operation.

公开(公告)号：US20150199466A1

公开(公告)日：2015-07-16

申请号：US14152537

申请日：2014-01-10

Applicant: International Business Machines Corporation

Inventor： Kanad Basu ,  Raghu Gaurav GopalaKrishnaSetty ,  Hari Krishnan Rajeev

IPC: G06F17/50

CPC classification number: G06F17/5081 ,  G01R31/318342 ,  G06F2217/82

Abstract: Crosstalk effects can be taken into account in automatic test pattern generation (ATPG) by providing crosstalk fault models, determining paths and/or nodes to be sensitized to activate each crosstalk fault, and optimizing to enable as many crosstalk faults as possible with a given pattern, subject to constraints. Constraints can include threshold numbers of endpoints/observation points and/or attempts to sensitize. Intermediate nodes in a crosstalk fault model path to an observation point can also be determined and/or sensitized.

Abstract translation: 通过提供串扰故障模型，确定要敏化的路径和/或节点来激活每个串扰故障，以及优化以使给定模式尽可能多的串扰故障，可以在自动测试模式生成（ATPG）中考虑串扰效应 ，受制约。 约束可以包括端点/观察点的阈值数和/或敏感的尝试。 也可以确定和/或致敏于到观察点的串扰故障模型路径中的中间节点。

公开(公告)号：US20190286221A1

公开(公告)日：2019-09-19

申请号：US16432524

申请日：2019-06-05

Applicant: International Business Machines Corporation

Inventor： STEVEN M. DOUSKEY ,  Raghu G. Gopalakrishnasetty ,  MARY P. KUSKO ,  Hari Krishnan Rajeev ,  JAMES D. WARNOCK

IPC: G06F1/3287 ,  G06F1/3296 ,  G06F1/26

Abstract: Operating pulsed latches on a variable power supply including turning on a first power rail powering a first latch of an integrated circuit, wherein the first latch is a pulsed latch; turning on a second power rail powering a second latch of the integrated circuit, wherein the second latch is operatively coupled to the first latch; performing a scan operation using the first latch and the second latch; turning off the first power rail powering the first latch; and performing a functional operation using the second latch, wherein the first power rail powering the first latch is off during the functional operation.

公开(公告)号：US10386912B2

公开(公告)日：2019-08-20

申请号：US15404355

申请日：2017-01-12

Applicant: International Business Machines Corporation

Inventor： Steven M. Douskey ,  Raghu G. Gopalakrishnasetty ,  Mary P. Kusko ,  Hari Krishnan Rajeev ,  James D. Warnock

IPC: G06F1/26 ,  G06F1/32 ,  G06F1/00 ,  G06F1/3287 ,  G06F1/3296

Abstract: Operating pulsed latches on a variable power supply including turning on a first power rail powering a first latch of an integrated circuit, wherein the first latch is a pulsed latch; turning on a second power rail powering a second latch of the integrated circuit, wherein the second latch is operatively coupled to the first latch; performing a scan operation using the first latch and the second latch; turning off the first power rail powering the first latch; and performing a functional operation using the second latch, wherein the first power rail powering the first latch is off during the functional operation.

公开(公告)号：US09218447B2

公开(公告)日：2015-12-22

申请号：US14152537

申请日：2014-01-10

Applicant: International Business Machines Corporation

Inventor： Kanad Basu ,  Raghu Gaurav GopalaKrishnaSetty ,  Hari Krishnan Rajeev

IPC: G06F17/50

CPC classification number: G06F17/5081 ,  G01R31/318342 ,  G06F2217/82

Abstract: Crosstalk effects can be taken into account in automatic test pattern generation (ATPG) by providing crosstalk fault models, determining paths and/or nodes to be sensitized to activate each crosstalk fault, and optimizing to enable as many crosstalk faults as possible with a given pattern, subject to constraints. Constraints can include threshold numbers of endpoints/observation points and/or attempts to sensitize. Intermediate nodes in a crosstalk fault model path to an observation point can also be determined and/or sensitized.

Abstract translation: 通过提供串扰故障模型，确定要敏化的路径和/或节点来激活每个串扰故障，以及优化以使给定模式尽可能多的串扰故障，可以在自动测试模式生成（ATPG）中考虑串扰效应 ，受制约。 约束可以包括端点/观察点的阈值数和/或敏感的尝试。 也可以确定和/或致敏于到观察点的串扰故障模型路径中的中间节点。