Method for producing a local coating and combinatory substrate having such coating
    1.
    发明授权
    Method for producing a local coating and combinatory substrate having such coating 失效
    用于制备具有这种涂层的局部涂层和组合基材的方法

    公开(公告)号:US07399705B2

    公开(公告)日:2008-07-15

    申请号:US11182371

    申请日:2005-07-15

    IPC分类号: H01L21/44

    摘要: A method for producing at least one local coating on a substrate is provided, as well as a combinatory substrate having such a local coating, a mask that is removable in a non-destructive manner being arranged on the substrate in a first step; the mask having at least one perforation, the perforation being at least partially filled with a reactive solution in a second step; and a coating reaction of the reactive solution with the substrate surface being induced in a third step to form the local coating.

    摘要翻译: 提供了一种用于在基板上生产至少一个局部涂层的方法,以及具有这种局部涂层的组合基板,在第一步骤中以非破坏性方式可移除的掩模布置在基板上; 所述掩模具有至少一个穿孔,所述穿孔在第二步骤中至少部分地填充有反应性溶液; 并且在第三步骤中诱导反应性溶液与基底表面的涂覆反应以形成局部涂层。

    Device and method for analyzing a sample plate
    2.
    发明授权
    Device and method for analyzing a sample plate 有权
    用于分析样品板的装置和方法

    公开(公告)号:US07911218B2

    公开(公告)日:2011-03-22

    申请号:US10582122

    申请日:2004-11-18

    IPC分类号: G01R35/00

    摘要: A device and a method are provided for the analysis of a sample plate on which at least two material samples are situated. In the method, one impedance spectrum is measured for each of the material samples. As a function of the respectively measured impedance spectrum, a configuration of a circuit equivalent is determined which includes at least one electronic component. Then, for an error minimization computation, starting values for the components of the respective circuit equivalents are determined. In the error minimization computation, a theoretical impedance spectrum is calculated for at least one of the material samples, based on the impedance spectrum measured for the material sample, as well as the starting values for the components of the respective circuit equivalent, and fit values are determined for the components of the respective circuit equivalent. Subsequently, a validation variable is determined for the calculated, theoretical impedance spectrum, and an evaluation variable is ascertained by comparison of at least one of the fit values for the components to a reference value.

    摘要翻译: 提供了一种用于分析至少两个材料样品所在的样品板的装置和方法。 在该方法中,对每个材料样品测量一个阻抗谱。 作为分别测量的阻抗谱的函数,确定包括至少一个电子部件的等效电路的配置。 然后,对于误差最小化计算,确定各个电路当量的分量的起始值。 在误差最小化计算中,基于对材料样品测量的阻抗谱以及相应电路等效元件的起始值以及拟合值,对至少一个材料样品计算理论阻抗谱 被确定为相应电路等效的组件。 随后,对于计算的理论阻抗谱确定验证变量,并且通过将组分的拟合值中的至少一个与参考值进行比较来确定评估变量。