Biosensor system based on recognition induced birefringence (RIB)
    1.
    发明授权
    Biosensor system based on recognition induced birefringence (RIB) 有权
    基于识别诱导双折射(RIB)的生物传感器系统

    公开(公告)号:US08465968B2

    公开(公告)日:2013-06-18

    申请号:US12645005

    申请日:2009-12-22

    IPC分类号: C12M1/34

    摘要: The present invention relates to a label-free biosensor system, a method for manufacturing said label-free biosensor system, its use for detecting biochemical reactions and/or bindings, enzymatic reactions, nucleic acid hybridizations, protein-protein interactions and protein-ligand interactions, as well as an assay method for detecting and/or quantifying an analyte of interest in a biological sample which comprises detecting the Recognition Induced Birefringence (RIB) generated in the presence as opposed to the absence of said analyte by bringing said sample into contact with said label-free biosensor system.

    摘要翻译: 本发明涉及无标记生物传感器系统,制造所述无标记生物传感器系统的方法,其用于检测生化反应和/或结合的用途,酶反应,核酸杂交,蛋白质 - 蛋白质相互作用和蛋白质 - 配体相互作用 以及用于检测和/或定量生物样品中感兴趣的分析物的测定方法,其包括检测在存在下产生的识别诱导双折射(RIB),而不是通过使所述样品与所述分析物接触而不存在所述分析物 表示无标签的生物传感器系统。

    Micropolarimeter and ellipsometer
    3.
    发明授权
    Micropolarimeter and ellipsometer 失效
    微偏光计和椭偏仪

    公开(公告)号:US06275291B1

    公开(公告)日:2001-08-14

    申请号:US09397568

    申请日:1999-09-16

    IPC分类号: G01J400

    摘要: A micropolarimeter and ellipsometer for obtaining complete optical information of superficially illuminated specimens. A compact construction is designed to facilitate their use. To obtain the simultaneous surface measurement of all optical information from a specimen, the retarder of the micropolarimeter consists of a one-piece retarder array with at least one pixel group, in which the major axis orientations of the individual pixels are distributed over an angular range of 360°. This micropolarimeter can be integrated into the reflected light microscope of an ellipsometer. The result is a compact measurement unit.

    摘要翻译: 一种用于获得表面照明样本的完整光学信息的微偏振计和椭偏仪。 设计紧凑的结构使其易于使用。 为了从样本获得所有光学信息的同时表面测量,微型偏振器的延迟器由具有至少一个像素组的单片延迟器阵列组成,其中各个像素的长轴取向分布在角度范围 360°。 该微型偏振计可以集成到椭偏仪的反射光学显微镜中。 结果是一个紧凑的测量单位。

    Micropolarimeter
    4.
    发明授权
    Micropolarimeter 有权
    微偏振仪

    公开(公告)号:US06268915B1

    公开(公告)日:2001-07-31

    申请号:US09485111

    申请日:2000-02-03

    IPC分类号: G01J400

    摘要: The invention concerns a micropolarimeter comprising an analyzer (1) and a detector (10) located past the analyzer in the direction of radiation and presenting a number of segments ND which is higher than or equal to 3 (11). The invention seeks to provide a micropolarimeter with no moving parts, with a high polarization index, for use for polychromatic light, so small that it can detect the ray of common lasers in one single measurement step without it being necessary to enlarge it, and capable of being converted in a simple manner into a complete Stokesmeter. To that end, the analyzer (1) consists of a radially symmetrical flat disk (5) produced in a polarizing material with which the polarization rests on absorption effects inside said material, the surface of the analyzer (1) being greater than or equal to the surface of the detector segments (10)

    摘要翻译: 本发明涉及一种包括分析仪(1)和检测器(10)的微偏振计,该检测器(10)沿着辐射方向位于分析仪上方并且呈现高于或等于3(11)的多个段ND。 本发明寻求提供一种具有高偏振指数的移动部件的微偏振计,用于多色光,如此小以至于可以在一个单个测量步骤中检测公共激光的射线,而不需要放大它,并且能够 被简单地转换成一个完整的斯托克斯计。 为此,分析器(1)由以偏振材料制成的径向对称的平板(5)组成,其极化取决于所述材料内部的吸收效应,分析器(1)的表面大于或等于 检测器段(10)的表面

    Method and device for automatic relative adjustment of samples in
relation to an ellipsometer
    5.
    发明授权
    Method and device for automatic relative adjustment of samples in relation to an ellipsometer 失效
    用于相对于椭偏仪自动相对调整样品的方法和装置

    公开(公告)号:US6091499A

    公开(公告)日:2000-07-18

    申请号:US291119

    申请日:1999-04-14

    CPC分类号: G01B11/26 G01J4/00

    摘要: Normally, repeated calibration measurements are necessary for the adjustment of the sample and ellipsometer. To achieve an automatic relative adjustment, a sample position detection system that can be adjusted in relation to the ellipsometer and locked in is assigned to the ellipsometer, and where the detection system is connected to an adjusting system that affects the sample table and/or the entire system detection system/ellipsometer. The method for automatic relative adjustment is provided for, that by initially using one sample, the system sample/ellipsometer is adjusted via the symmetry of the detector signal of the ellipsometer, and that the sample position detection system is adjusted and subsequently locked in with the ellipsometer. With all subsequent samples, a relative adjustment of sample and ellipsometer detection system is performed using the signals of the detection system. In particular, the measurements can be performed without moving the sample itself because the adjustment can also be carried out through a single movement of the ellipsometer detection system.

    摘要翻译: 通常,重复的校准测量对于样品和椭偏仪的调整是必要的。 为了实现自动相对调整,可以将相对于椭偏仪调整并锁定的样本位置检测系统分配给椭偏仪,并且其中检测系统连接到影响样品台和/或 整个系统检测系统/椭偏仪。 提供了自动相对调整的方法,通过最初使用一个样本,通过椭偏仪的检测器信号的对称性来调整系统样品/椭偏仪,并且样品位置检测系统被调整并随后被锁定 椭偏仪。 对于所有后续样本,使用检测系统的信号执行样本和椭偏仪检测系统的相对调整。 特别地,可以在不移动样品本身的情况下进行测量,因为也可以通过椭偏仪检测系统的单次移动进行调整。