Resin composition, resist underlayer film, resist underlayer film-forming method and pattern-forming method
    2.
    发明授权
    Resin composition, resist underlayer film, resist underlayer film-forming method and pattern-forming method 有权
    树脂组合物,抗蚀剂下层膜,抗蚀剂下层膜形成方法和图案形成方法

    公开(公告)号:US09091922B2

    公开(公告)日:2015-07-28

    申请号:US13714406

    申请日:2012-12-14

    CPC classification number: G03F7/11 G03F7/091 H01L21/0276

    Abstract: A resin composition for forming a resist underlayer film includes a resin that includes an aromatic ring, and a crosslinking agent having a partial structure represented by a following formula (i). X represents an oxygen atom, a sulfur atom, *—COO— or —NRA—. R1 represents a hydrogen atom or a C1-30 monovalent hydrocarbon group. R2 represents a hydroxy group, a sulfanil group, a cyano group, a nitro group, a C1-30 monovalent hydrocarbon group, a C1-30 monovalent oxyhydrocarbon group or a C1-30 monovalent sulfanilhydrocarbon group. p is an integer of 1 to 3.

    Abstract translation: 用于形成抗蚀剂下层膜的树脂组合物包括具有芳环的树脂和具有由下式(i)表示的部分结构的交联剂。 X表示氧原子,硫原子,* -COO-或-NRA-。 R1表示氢原子或C1-30一价烃基。 R2表示羟基,磺胺基,氰基,硝基,C1-30一价烃基,C1-30一价羟基烃基或C1-30一价硫代烃基。 p为1〜3的整数。

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