公开(公告)号：US20160363612A1

公开(公告)日：2016-12-15

申请号：US15171346

申请日：2016-06-02

Applicant: Japan Display Inc.

Inventor： Nobuyuki ISHIGE ,  Satoru TOMITA

IPC: G01R1/073 ,  G09G3/00

CPC classification number: G09G3/006 ,  G06F3/0416 ,  G06F3/044 ,  G09G3/3648

Abstract: According to one embodiment, an inspection device of a display device, includes a first probe block which includes first probes, a probe block attachment which supports the first probe block to enable a position of the first probe block to be set variably, a signal source which supplies a signal to the first probes, and a transmission cable which connects the first probe block with the signal source.

Abstract translation: 根据一个实施例，显示装置的检查装置包括第一探针块，其包括第一探针，探针块附件，其支撑第一探针块以使第一探针块的位置可变地设定;信号源 其向第一探针提供信号，以及将第一探测块与信号源连接的传输电缆。

公开(公告)号：US20240243017A1

公开(公告)日：2024-07-18

申请号：US18391670

申请日：2023-12-21

Applicant: Japan Display Inc.

Inventor： Satoru TOMITA ,  Noriyuki HIRATA

IPC: H01L21/66 ,  G06T7/00 ,  G06T7/60 ,  H10K59/12

CPC classification number: H01L22/12 ,  G06T7/0004 ,  G06T7/60 ,  H10K59/1201 ,  H10K59/122

Abstract: According to one embodiment, a measuring method includes forming a partition including a lower portion provided on a base and an upper portion which protrudes from a side surface of the lower portion, acquiring a first image generated by applying an electron beam to the partition for each of elements constituting the partition, analyzing the first image for each element, and measuring a protrusion amount of an end portion of the upper portion from the side surface of the lower portion based on the analysis result.

公开(公告)号：US20240127419A1

公开(公告)日：2024-04-18

申请号：US18484453

申请日：2023-10-11

Applicant: Japan Display Inc.

Inventor： Satoru TOMITA ,  Kazuyuki ENDOU ,  Kota MAKISHI

IPC: G06T7/00 ,  G01N23/04 ,  G01N23/083

CPC classification number: G06T7/0004 ,  G01N23/04 ,  G01N23/083 ,  G06T2207/10116 ,  G06T2207/20081 ,  G06T2207/30108

Abstract: According to one embodiment, a measuring method includes forming a partition including a lower portion arranged on a first surface side of a base and an upper portion protruding from a side surface of the lower portion, acquiring a first image including the partition, which is generated by emitting electromagnetic waves from the first surface side of the base or a second surface side opposed to the first surface of the base, analyzing the acquired first image, and measuring an amount of protrusion at which the end portion of the upper portion protrudes from the side surface of the lower portion, based on the analysis result.

公开(公告)号：US20240099059A1

公开(公告)日：2024-03-21

申请号：US18470456

申请日：2023-09-20

Applicant: Japan Display Inc.

Inventor： Satoru TOMITA

IPC: H10K59/12 ,  G02B21/26 ,  G02B21/36 ,  H10K59/121 ,  H10K77/10

CPC classification number: H10K59/1201 ,  G02B21/26 ,  G02B21/361 ,  G02B21/365 ,  H10K59/121 ,  H10K77/10 ,  H10K2102/302

Abstract: According to one embodiment, a measuring method includes forming a partition including a lower portion arranged on a first surface side of a base and an upper portion protruding from a side surface of the lower portion, acquiring a first image including the partition observed from a second surface side opposed to the first surface of the base by an optical microscope, analyzing the acquired first image, and measuring an amount of protrusion by which an end portion of the upper portion protrudes from the side surface of the lower portion, based on the analysis result.

公开(公告)号：US20240085355A1

公开(公告)日：2024-03-14

申请号：US18466824

申请日：2023-09-14

Applicant: Japan Display Inc.

Inventor： Satoru TOMITA

IPC: G01N23/2251

CPC classification number: G01N23/2251

Abstract: According to one embodiment, a measuring method includes forming a partition including a lower portion arranged on a base and an upper portion protruding from a side surface of the lower portion, acquiring a first image generated by detecting a secondary electron generated by emitting an electron beam including a primary electron to an area including at least a part of the side surface of the lower portion and at least a part of an end portion of the upper portion, analyzing the first image, and measuring an amount of protrusion by which the end portion of the upper portion protrudes from the side surface of the lower portion, based on the analysis result.