Dynamically Estimating Lifetime of a Semiconductor Device
    1.
    发明申请
    Dynamically Estimating Lifetime of a Semiconductor Device 有权
    动态估计半导体器件的寿命

    公开(公告)号:US20090287909A1

    公开(公告)日:2009-11-19

    申请号:US12086357

    申请日:2005-12-30

    IPC分类号: G06F15/00

    CPC分类号: G06F11/008 G01R31/2846

    摘要: In one embodiment, the present invention includes a method for obtaining dynamic operating parameter information of a semiconductor device such as a processor, determining dynamic usage of the device, either as a whole or for one or more portions thereof, based on the dynamic operating parameter information, and dynamically estimating a remaining lifetime of the device based on the dynamic usage. Depending on the estimated remaining lifetime, the device may be controlled in a desired manner. Other embodiments are described and claimed.

    摘要翻译: 在一个实施例中,本发明包括一种用于获得诸如处理器的半导体器件的动态操作参数信息的方法,基于动态操作参数确定设备的整体或一个或多个部分的动态使用 信息,并基于动态使用动态估计设备的剩余寿命。 根据估计的剩余寿命,可以以期望的方式控制装置。 描述和要求保护其他实施例。

    Detecting Soft Errors Via Selective Re-Execution
    2.
    发明申请
    Detecting Soft Errors Via Selective Re-Execution 有权
    通过选择性重新执行检测软错误

    公开(公告)号:US20090113240A1

    公开(公告)日:2009-04-30

    申请号:US12224762

    申请日:2006-03-31

    IPC分类号: G06F11/14 G06F11/28

    CPC分类号: G06F11/008 G06F11/1497

    摘要: In one embodiment, the present invention includes a method for determining a vulnerability level for an instruction executed in a processor, and re-executing the instruction if the vulnerability level is above a threshold. The vulnerability level may correspond to a soft error likelihood for the instruction while the instruction is in the processor. Other embodiments are described and claimed.

    摘要翻译: 在一个实施例中,本发明包括一种用于确定在处理器中执行的指令的漏洞级别的方法,以及如果漏洞级别高于阈值则重新执行该指令。 漏洞级别可能对应于指令在处理器中时指令的软错误可能性。 描述和要求保护其他实施例。

    Enhancing Reliability of a Many-Core Processor
    3.
    发明申请
    Enhancing Reliability of a Many-Core Processor 有权
    提高多核处理器的可靠性

    公开(公告)号:US20090094481A1

    公开(公告)日:2009-04-09

    申请号:US12224108

    申请日:2006-02-28

    IPC分类号: G06F9/50 G06F11/20

    摘要: In one embodiment, the present invention includes a method for identifying available cores of a many-core processor, allocating a first subset of the cores to an enabled state and a second subset of the cores to a spare state, and storing information regarding the allocation in a storage. The allocation of cores to the enables state may be based on a temperature-aware algorithm, in certain embodiments. Other embodiments are described and claimed.

    摘要翻译: 在一个实施例中,本发明包括一种用于识别多核处理器的可用核心的方法,将核心的第一子集分配给启用状态,将核心的第二子集分配到备用状态,以及存储关于分配的信息 在一个存储。 在某些实施例中,将核分配到启用状态可以基于温度感知算法。 描述和要求保护其他实施例。

    NBTI-resilient memory cells with NAND gates
    4.
    发明授权
    NBTI-resilient memory cells with NAND gates 有权
    具有NAND门的NBTI弹性存储单元

    公开(公告)号:US07447054B2

    公开(公告)日:2008-11-04

    申请号:US11611344

    申请日:2006-12-15

    IPC分类号: G11C17/00

    CPC分类号: G11C11/412 G11C11/56

    摘要: An NBTI-resilient memory cell is made up of a ring of multiple NAND gates. The NAND gates are arranged such that one of the NAND gates has a “0” in its output, while the remaining NAND gates have a “1” in their outputs. PMOS transistors within the memory cell experience less degradation than in inverter-based memory cells. Guard-banding to account for transistor degradation may be mitigated, or the operating frequency of the memory cell may be increased.

    摘要翻译: NBTI弹性存储单元由多个NAND门的环组成。 NAND门被布置成使得一个NAND门在其输出中具有“0”,而其余的NAND门在其输出中具有“1”。 存储器单元内的PMOS晶体管比基于逆变器的存储单元中的PMOS晶体管的衰减更少。 可以减轻保护带以解决晶体管劣化,或者可以增加存储单元的工作频率。

    NBTI-RESILIENT MEMORY CELLS WITH NAND GATES
    5.
    发明申请
    NBTI-RESILIENT MEMORY CELLS WITH NAND GATES 有权
    具有NAND门的NBTI恢复记忆体

    公开(公告)号:US20080084732A1

    公开(公告)日:2008-04-10

    申请号:US11611344

    申请日:2006-12-15

    IPC分类号: G11C11/00

    CPC分类号: G11C11/412 G11C11/56

    摘要: An NBTI-resilient memory cell is made up of a ring of multiple NAND gates. The NAND gates are arranged such that one of the NAND gates has a “0” in its output, while the remaining NAND gates have a “1” in their outputs. PMOS transistors within the memory cell experience less degradation than in inverter-based memory cells. Guard-banding to account for transistor degradation may be mitigated, or the operating frequency of the memory cell may be increased.

    摘要翻译: NBTI弹性存储单元由多个NAND门的环组成。 NAND门被布置成使得一个NAND门在其输出中具有“0”,而其余的NAND门在其输出中具有“1”。 存储器单元内的PMOS晶体管比基于逆变器的存储单元中的PMOS晶体管的衰减更少。 可以减轻保护带以解决晶体管劣化,或者可以增加存储单元的工作频率。

    Detecting soft errors via selective re-execution
    6.
    发明授权
    Detecting soft errors via selective re-execution 有权
    通过选择性重新执行检测软错误

    公开(公告)号:US08402310B2

    公开(公告)日:2013-03-19

    申请号:US13284086

    申请日:2011-10-28

    IPC分类号: G06F11/00 G06F11/14

    CPC分类号: G06F11/008 G06F11/1497

    摘要: In one embodiment, the present invention includes a method for determining a vulnerability level for an instruction executed in a processor, and re-executing the instruction if the vulnerability level is above a threshold. The vulnerability level may correspond to a soft error likelihood for the instruction while the instruction is in the processor. Other embodiments are described and claimed.

    摘要翻译: 在一个实施例中,本发明包括一种用于确定在处理器中执行的指令的漏洞级别的方法,以及如果漏洞级别高于阈值则重新执行该指令。 漏洞级别可能对应于指令在处理器中时指令的软错误可能性。 描述和要求保护其他实施例。

    Enhancing reliability of a many-core processor
    7.
    发明授权
    Enhancing reliability of a many-core processor 有权
    提高多核处理器的可靠性

    公开(公告)号:US08074110B2

    公开(公告)日:2011-12-06

    申请号:US12224108

    申请日:2006-02-28

    IPC分类号: G06F11/00

    摘要: In one embodiment, the present invention includes a method for identifying available cores of a many-core processor, allocating a first subset of the cores to an enabled state and a second subset of the cores to a spare state, and storing information regarding the allocation in a storage. The allocation of cores to the enables state may be based on a temperature-aware algorithm, in certain embodiments. Other embodiments are described and claimed.

    摘要翻译: 在一个实施例中,本发明包括一种用于识别多核处理器的可用核心的方法,将核心的第一子集分配给启用状态,将核心的第二子集分配到备用状态,以及存储关于分配的信息 在一个存储。 在某些实施例中,将核分配到启用状态可以基于温度感知算法。 描述和要求保护其他实施例。

    Dynamically estimating lifetime of a semiconductor device
    8.
    发明授权
    Dynamically estimating lifetime of a semiconductor device 有权
    动态估计半导体器件的寿命

    公开(公告)号:US08151094B2

    公开(公告)日:2012-04-03

    申请号:US12086357

    申请日:2005-12-30

    IPC分类号: G06F11/30

    CPC分类号: G06F11/008 G01R31/2846

    摘要: The present invention includes a method for obtaining dynamic operating parameter information of a semiconductor device such as a processor, determining dynamic usage of the device, either as a whole or for one or more portions thereof, based on the dynamic operating parameter information, and dynamically estimating a remaining lifetime of the device based on the dynamic usage. Depending on the estimated remaining lifetime, the device may be controlled in a desired manner.

    摘要翻译: 本发明包括一种用于获得诸如处理器的半导体器件的动态操作参数信息的方法,基于动态操作参数信息来确定整个或一个或多个部分的设备的动态使用,并动态地 基于动态使用估计设备的剩余寿命。 根据估计的剩余寿命,可以以期望的方式控制装置。

    Detecting Soft Errors Via Selective Re-Execution
    9.
    发明申请
    Detecting Soft Errors Via Selective Re-Execution 有权
    通过选择性重新执行检测软错误

    公开(公告)号:US20120047398A1

    公开(公告)日:2012-02-23

    申请号:US13284086

    申请日:2011-10-28

    IPC分类号: G06F11/14

    CPC分类号: G06F11/008 G06F11/1497

    摘要: In one embodiment, the present invention includes a method for determining a vulnerability level for an instruction executed in a processor, and re-executing the instruction if the vulnerability level is above a threshold. The vulnerability level may correspond to a soft error likelihood for the instruction while the instruction is in the processor. Other embodiments are described and claimed.

    摘要翻译: 在一个实施例中,本发明包括一种用于确定在处理器中执行的指令的漏洞级别的方法,以及如果漏洞级别高于阈值则重新执行该指令。 漏洞级别可能对应于指令在处理器中时指令的软错误可能性。 描述和要求保护其他实施例。

    Detecting soft errors via selective re-execution
    10.
    发明授权
    Detecting soft errors via selective re-execution 有权
    通过选择性重新执行检测软错误

    公开(公告)号:US08090996B2

    公开(公告)日:2012-01-03

    申请号:US12224762

    申请日:2006-03-31

    IPC分类号: G06F11/00 G06F11/30

    CPC分类号: G06F11/008 G06F11/1497

    摘要: In one embodiment, the present invention includes a method for determining a vulnerability level for an instruction executed in a processor, and re-executing the instruction if the vulnerability level is above a threshold. The vulnerability level may correspond to a soft error likelihood for the instruction while the instruction is in the processor. Other embodiments are described and claimed.

    摘要翻译: 在一个实施例中,本发明包括一种用于确定在处理器中执行的指令的漏洞级别的方法,以及如果漏洞级别高于阈值则重新执行该指令。 漏洞级别可能对应于指令在处理器中时指令的软错误可能性。 描述和要求保护其他实施例。