摘要:
Stuck-at fault, shorted and open circuit conditions occurring in the differential inputs to Differential Receivers on a Large Scale Integrated (LSI) chip are detected by a test circuit arrangement fabricated on the chip. The test circuit arrangement includes Pass Gate devices operatively coupled to the differential inputs and an Exclusive NOR circuit (XNOR) coupled to the Pass Gate devices. Pull devices are coupled to the Pass Gate devices and the differential inputs. By activating the Pass Gate devices and applying a test sequence to the differential inputs, the state of the output of the XNOR circuit indicates if an open circuit, stuck-at or short exists in the inputs to the Differential Receiver.
摘要:
The invention is generally directed to a method and apparatus for validating a specified manufacturing test rule, which pertains to an electronic component. One embodiment comprising a method includes the step of generating a file of test data sets, wherein each test data set in the file is valid for the rule. Each test data set includes a stimulus comprising one or more single input vectors, and further includes a set of results that are expected, when the stimulus is applied to the electronic component. The method further comprises constructing a testbench to prepare each of a plurality of testcases for simulation, wherein each testcase corresponds to the stimulus and the expected output results of one of the test data sets, and each testcase is disposed to be simulated separately, or independently, from every other testcase. The method further comprises selectively preparing each of the testcases for simulation, in order to provide simulated results for the stimulus corresponding to each testcase. The expected results and the simulated results are compared for each testcase, in order to determine whether there are any differences therebetween. Each of the above steps can be carried out using means that are completely automated. Thus, the entire method for validating manufacturing test rules can likewise be completely automated. Also, the processing applied to different test cases can occur simultaneously or in parallel, to substantially reduce the processing burden.
摘要:
Illustrative embodiments provide a computer-implemented method for resolving indeterminate states by inserting logic into a design. The computer-implemented method receives an original design input from a requester to form a received input and determines whether the received input contains an indeterminate output. Responsive to a determination that the received input contains an indeterminate output, the computer-implemented method generates a temporary design from the received input, wherein the temporary design contains “unique” output and all inputs, updates the temporary design, and synthesizes the original design and each temporary design individually to form a synthesized original design and a set of synthesized temporary designs. The computer-implemented method merges the synthesized original design with the set of synthesized temporary design to form a final design; and returns the final design to the requester.
摘要:
The invention is directed to validating a specified manufacturing test rule, which pertains to an electronic component. The method includes generating a file of test data sets, wherein each test data set in the file is valid for the rule. Each test data set includes a stimulus comprising one or more single input vectors, and further includes a set of results that are expected. The method further comprises constructing a testbench to prepare testcases for simulation, wherein each testcase corresponds to the stimulus and the expected output results of one of the test data sets, and each testcase is disposed to be simulated separately, or independently, from every other testcase. The method further comprises selectively preparing each of the testcases for simulation, in order to provide simulated results for the stimulus corresponding to each testcase. The expected results and the simulated results are compared for each testcase.
摘要:
A system for creating manufacturing test rules. Stimuli for an electronic design are generated automatically by a stimuli generator. The stimuli generator takes into account certain limitations of the design when automatically generating the manufacturing test rules. The design is tested by a testbench using the stimuli. A simulation log for the design is generated by the testbench. The simulation log is then processed by a simulation log processor. An HDL representation of the design is generated by the simulation log processor using the processed simulation log. A gate-level version of the design is generated by a synthesis tool using the HDL representation of the design. The gate-level version of the design is further processed by the synthesis tool to make any necessary modifications. Then, the gate-level version of the design is outputted as the final manufacturing test rule. Thus, creating manufacturing test rules can be completely automated.
摘要:
Illustrative embodiments provide a computer-implemented method for resolving indeterminate states by inserting logic into a design. The computer-implemented method receives an original design input from a requester to form a received input and determines whether the received input contains an indeterminate output. Responsive to a determination that the received input contains an indeterminate output, the computer-implemented method generates a temporary design from the received input, wherein the temporary design contains “unique” output and all inputs, updates the temporary design, and synthesizes the original design and each temporary design individually to form a synthesized original design and a set of synthesized temporary designs. The computer-implemented method merges the synthesized original design with the set of synthesized temporary design to form a final design; and returns the final design to the requester.
摘要:
A system for creating manufacturing test rules. Stimuli for an electronic design are generated automatically by a stimuli generator. The stimuli generator takes into account certain limitations of the design when automatically generating the manufacturing test rules. The design is tested by a testbench using the stimuli. A simulation log for the design is generated by the testbench. The simulation log is then processed by a simulation log processor. An HDL representation of the design is generated by the simulation log processor using the processed simulation log. A gate-level version of the design is generated by a synthesis tool using the HDL representation of the design. The gate-level version of the design is further processed by the synthesis tool to make any necessary modifications. Then, the gate-level version of the design is outputted as the final manufacturing test rule. Thus, creating manufacturing test rules can be completely automated.
摘要:
Methods, systems, and media for managing functional verification of a parameterizable design are disclosed. Embodiments include a system having a testbench configuration module adapted to configure a testbench, the testbench having testbench signals and one or more instantiated components having a plurality of ports of a generic design, where the testbench signals are wired to the plurality of ports. The testbench may also have one or more instantiated special components based on chip-specific versions of the design where the special components are wired to the same ports as the generic design. The system may also include a functional verification manager that, through a component module, observes values in the testbench and automatically configure a verification environment based on the observed values, including automatic insertion of checkers at different levels of hierarchy. The testbench may be a VHDL or Verilog testbench in some embodiments.
摘要:
Methods, systems, and media for functional simulation of an I/O bus are disclosed. More particularly, a method of simulating distortion and noise parameters of an I/O bus is disclosed. Embodiments include constraining one or more fields of a record and determining delay amounts based on the resulting parameters, where the final delay amount includes a delay buffer and a net of delay amounts associated with the parameters. Embodiments may also include determining a value of a next bit to be sent to the I/O bus and, after waiting the delay amount, driving the bit on the bus to the next bit value. Parameters may include skew, jitter, duty cycle distortion, voltage reference distortion, and drift of any of these parameters. Further embodiments may include signaling the end of a phase in response to a phase done condition being satisfied.
摘要:
The present invention describes a system and method for independently verifying the Execution Rate of individual tasks by a device through simulation. Described is a situation in which a system has a main device through which data flows to and from other devices. Bus transfers must fall within required rates. A simulation of the configuration utilizes models of the various devices, including the “Main device”. This simulation is used to verify the data traffic and associated transfer rates. Data transfer includes random bursts, with randomly chosen periods between bursts. The data rate and data validity are measured during each burst period.