摘要:
A method for operating an X-ray or neutron-optical system and beam stop comprising an X-ray or neutron source (1) from which corresponding radiation is guided as a primary beam (2) to a sample (4) under investigation, with an X-ray or neutron detector (6) for receiving radiation diffracted or scattered from the sample (4), wherein the source (1), the sample and the detector are disposed substantially on one line (=z-axis) and wherein a beam stop (5; 31; 41) is provided between the sample and the detector whose cross-sectional shape is adjusted to the cross-section of the primary beam is characterized in that the beam stop is disposed to be displaceable along the z-direction for optimum adjustment of the amounts of useful and interfering radiation impinging on the detector. This protects the detector from the influence of the primary beam while allowing a maximum amount of diffracted or scattered radiation to reach the detector, wherein the beam stop can be easily adjusted to temporally changing properties of the beam optics.
摘要:
A method for operating an X-ray or neutron-optical system and beam stop comprising an X-ray or neutron source (1) from which corresponding radiation is guided as a primary beam (2) to a sample (4) under investigation, with an X-ray or neutron detector (6) for receiving radiation diffracted or scattered from the sample (4), wherein the source (1), the sample and the detector are disposed substantially on one line (=z-axis) and wherein a beam stop (5; 31; 41) is provided between the sample and the detector whose cross-sectional shape is adjusted to the cross-section of the primary beam is characterized in that the beam stop is disposed to be displaceable along the z-direction for optimum adjustment of the amounts of useful and interfering radiation impinging on the detector. This protects the detector from the influence of the primary beam while allowing a maximum amount of diffracted or scattered radiation to reach the detector, wherein the beam stop can be easily adjusted to temporally changing properties of the beam optics.
摘要:
An X-ray diffractometer has a mechanism without toothed ring and is suited to move the two legs of a goniometer, on which the source and detector are respectively disposed, at the same time and in a correlated fashion. Each goniometer leg (or linkage) thereby has a common main center of rotation HDP and also one respective auxiliary center of rotation HD1, HD2. The two auxiliary centers of rotation are symmetrically disposed with respect to a symmetry plane E which contains the main center of rotation, and can be moved on a guidance that is symmetrical with respect to the plane E. The main center of rotation can only be moved in the plane E, e.g. along a rail guidance. The movement of the main center of rotation relative to the guidance can be easily driven by means of one single motor.
摘要:
Electric circuit of an electrolyzer with substantially vertical bipolar electrodes, comprising at least one busbar (9, 10) that is placed below and/or above the electrolyzer (3). Electrolysis installation comprising such a circuit and at least one electrolyzer (3) with vertical bipolar electrodes.
摘要:
An tuner unit is provided for communications receivers with automatic self-balancing of the individual high frequency filter circuits. An assigned frequency applied to the desired receiver channel is fed to the antenna input during the automatic balancing process. The voltage of this assigned frequency picked up at the output of the filter circuits changes according to a stepwise increase of a tuning voltage controlled by a microprocessor. The tuning voltage is applied to the filter circuit to be balanced via a digital-analog converter and via a switching means controlled by the microprocessor. The automatic balancing is provided by switching the switching means successively to connect to the individual filter sections.
摘要:
An electrolyzer apparatus for the electrolytic manufacture of elemental F2 from an electrolyte/HF-solution, e.g., KF×1.8 HF, comprising at least one electrolytic cell which contains at least two anodes, often 20 to 30 anodes, a metallic cathodic vessel, and at least two rectifiers such that each anode is allocated to one rectifier. In this manner, each anode can be controlled and regulated individually. Failure of each individual anode, e.g., anode break, causes the production of undesired side products, e.g., of CF4. Any faulty anode can be detected easily, and each anode can be shut off individually, if needed, and repaired.
摘要:
A method for performing an X-ray diffractometry analysis of a crystalline and/or amorphous sample, by means of an optical X-ray apparatus having an X-ray source with an X-ray anode constructed from a mixed configuration of at least two metals is characterized in that an energy-dispersive semi-conductor is used for acquiring detector events from the X-rays emanating from the sample, and that X-rays diffracted or scattered by the sample with different characteristic energy lines belonging to the metals of the mixed configuration of the X-ray anode used, are acquired simultaneously during an angle scan. With this method, X-ray diffractometry analysis with multiple characteristic energy lines are possible without any need for conversion or switchover.
摘要:
An electrolyzer apparatus for the electrolytic manufacture of elemental F2 from an electrolyte/HF-solution, e.g., KF×1.8 HF, comprising at least one electrolytic cell which contains at least two anodes, often 20 to 30 anodes, a metallic cathodic vessel, and at least two rectifiers such that each anode is allocated to one rectifier. In this manner, each anode can be controlled and regulated individually. Failure of each individual anode, e.g., anode break, causes the production of undesired side products, e.g., of CF4. Any faulty anode can be detected easily, and each anode can be shut off individually, if needed, and repaired.
摘要:
A method for performing an X-ray diffractometry analysis of a crystalline and/or amorphous sample, by means of an optical X-ray apparatus having an X-ray source with an X-ray anode constructed from a mixed configuration of at least two metals is characterized in that an energy-dispersive semi-conductor is used for acquiring detector events from the X-rays emanating from the sample, and that X-rays diffracted or scattered by the sample with different characteristic energy lines belonging to the metals of the mixed configuration of the X-ray anode used, are acquired simultaneously during an angle scan. With this method, X-ray diffractometry analyses with multiple characteristic energy lines are possible without any need for conversion or switchover.