-
1.发明授权Maintenance planning and failure prediction from data observed within a time window 有权在时间窗口内观察到的数据的维护计划和故障预测公开(公告)号：US08887008B2
公开(公告)日：2014-11-11
申请号：US13478771
申请日：2012-05-23
IPC分类号： G06F11/00
CPC分类号： G06Q10/109
摘要： A system for predicting a failure of equipment from prior maintenance data of the equipment collected during a time duration estimate a number of preceding failures of the equipment prior to the time duration. The system constructs a model, based on the prior maintenance data, of an impact of an external intervention on a failure of the equipment. The system constructs a model, based on the constructed model of the impact of the external intervention and the estimated number of preceding failures, of a replacement policy of the equipment and a probability of a subsequent failure of the equipment in a subsequent time period.
摘要翻译： 一种用于根据在时间段内收集的设备的先前维护数据来预测设备故障的系统，其估计在所述持续时间之前的所述设备的先前故障的数量。 该系统根据现有维护数据构建了外部干预对设备故障影响的模型。 该系统基于外部干预的影响的构造模型和先前失败的估计数量来构建设备的替换策略的模型以及在随后的时间段内设备的后续故障的概率。
-
2.发明申请MAINTENANCE PLANNING AND FAILURE PREDICTION FROM DATA OBSERVED WITHIN A TIME WINDOW 审中-公开维护计划和故障预测从时间窗口中观察到的数据公开(公告)号：US20130283104A1
公开(公告)日：2013-10-24
申请号：US13478771
申请日：2012-05-23
IPC分类号： G06F11/30
CPC分类号： G06Q10/109
摘要： A system for predicting a failure of equipment from prior maintenance data of the equipment collected during a time duration estimate a number of preceding failures of the equipment prior to the time duration. The system constructs a model, based on the prior maintenance data, of an impact of an external intervention on a failure of the equipment. The system constructs a model, based on the constructed model of the impact of the external intervention and the estimated number of preceding failures, of a replacement policy of the equipment and a probability of a subsequent failure of the equipment in a subsequent time period.
摘要翻译： 一种用于根据在时间段内收集的设备的先前维护数据来预测设备故障的系统，其估计在所述持续时间之前的所述设备的先前故障的数量。 该系统根据现有维护数据构建了外部干预对设备故障影响的模型。 该系统基于外部干预的影响的构造模型和先前失败的估计数量来构建设备的替换策略的模型以及在随后的时间段内设备的后续故障的概率。
-
3.发明申请MAINTENANCE PLANNING AND FAILURE PREDICTION FROM DATA OBSERVED WITHIN A TIME WINDOW 有权维护计划和故障预测从时间窗口中观察到的数据公开(公告)号：US20130282355A1
公开(公告)日：2013-10-24
申请号：US13454743
申请日：2012-04-24
IPC分类号： G06G7/62
CPC分类号： G06Q10/109
摘要： A system, method and computer program product for predicting a failure of equipment from prior maintenance data of the equipment collected during a time duration estimate a number of preceding failures of the equipment prior to the time duration. The system, method and computer program product construct a model, based on the prior maintenance data, of an impact of an external intervention on a failure of the equipment. The system, method and computer program product construct a model, based on the constructed model of the impact of the external intervention and the estimated number of preceding failures, a replacement policy of the equipment and a probability of a subsequent failure of the equipment in a subsequent time period.
摘要翻译： 一种系统，方法和计算机程序产品，用于根据在时间段内收集的设备的先前维护数据来预测设备的故障，以估计在该持续时间之前设备的先前故障的数量。 系统，方法和计算机程序产品根据现有维护数据构建了外部干预对设备故障影响的模型。 系统，方法和计算机程序产品构建一个模型，基于外部干预影响的构建模型和以前故障的估计数，设备的替换策略和设备的后续故障概率 后续时间
-
4.发明授权Maintenance planning and failure prediction from data observed within a time window 有权在时间窗口内观察到的数据的维护计划和故障预测公开(公告)号：US08880962B2
公开(公告)日：2014-11-04
申请号：US13454743
申请日：2012-04-24
IPC分类号： G06F11/00
CPC分类号： G06Q10/109
摘要： A system, method and computer program product for predicting a failure of equipment from prior maintenance data of the equipment collected during a time duration estimate a number of preceding failures of the equipment prior to the time duration. The system, method and computer program product construct a model, based on the prior maintenance data, of an impact of an external intervention on a failure of the equipment. The system, method and computer program product construct a model, based on the constructed model of the impact of the external intervention and the estimated number of preceding failures, a replacement policy of the equipment and a probability of a subsequent failure of the equipment in a subsequent time period.
摘要翻译： 一种系统，方法和计算机程序产品，用于根据在时间段内收集的设备的先前维护数据来预测设备的故障，以估计在该持续时间之前设备的先前故障的数量。 系统，方法和计算机程序产品根据现有维护数据构建了外部干预对设备故障影响的模型。 系统，方法和计算机程序产品构建一个模型，基于外部干预影响的构建模型和以前故障的估计数，设备的替换策略和设备的后续故障概率 后续时间
-
公开(公告)号：US20130041705A1
公开(公告)日：2013-02-14
申请号：US13205190
申请日：2011-08-08
IPC分类号： G06Q10/00
摘要： A system, method and computer program product for maintaining an infrastructure of components. The system receives structured data, unstructured data, and infrastructure data from a database. The system runs at least one statistical and optimization modeler with one or more of: the received structured data, the received unstructured data and the received infrastructure data, in order to calculate a health index of at least one component of the infrastructure. The health index represents a health attribute of the at least one component. The system establishes at least one maintenance plan of the infrastructure, based on the calculated health index. Each established maintenance plan is associated with at least one health index. The system compares health indices of the at least one established maintenance plan. The system selects a plan, among the at least one established maintenance plan, whose health index is a maximum among the compared health indices.
摘要翻译： 一种用于维护组件基础设施的系统，方法和计算机程序产品。 系统从数据库接收结构化数据，非结构化数据和基础架构数据。 该系统运行至少一个统计和优化建模器，具有以下一个或多个：接收的结构化数据，接收的非结构化数据和接收的基础设施数据，以便计算基础设施的至少一个组件的健康指数。 健康指数表示至少一个组件的健康属性。 系统根据计算出的健康指数建立基础设施的至少一个维护计划。 每个既定的维护计划与至少一个健康指数相关联。 该系统比较至少一个已建立的维护计划的健康指数。 所述系统在所述至少一个已建立的维护计划中选择其健康指数在所述健康指数中的最大值的计划。
-
6.发明授权公开(公告)号：US09240360B2
公开(公告)日：2016-01-19
申请号：US13557955
申请日：2012-07-25
IPC分类号： G06F19/00 , H01L21/66 , G05B13/04 , G05B19/418
CPC分类号： H01L22/20 , G05B13/048 , G05B19/41875 , G05B2219/32182 , G05B2219/32187 , G05B2219/32194 , G05B2219/45031 , Y02P90/14 , Y02P90/22 , Y02P90/26 , Y02P90/86
摘要： A method for run-to-run control and sampling optimization in a semiconductor manufacturing process includes the steps of: determining a process output and corresponding metrology error associated with an actual metrology for a current processing run in the semiconductor manufacturing process; determining a predicted process output and corresponding prediction error associated with a virtual metrology for the current processing run; and controlling at least one parameter corresponding to a subsequent processing run as a function of the metrology error and the prediction error.
摘要翻译： 一种用于半导体制造过程中的运行控制和采样优化的方法包括以下步骤：确定与半导体制造过程中的当前处理运行的实际测量相关联的过程输出和相应的度量误差; 确定与当前处理运行的虚拟度量相关联的预测过程输出和相应的预测误差; 以及根据计量误差和预测误差来控制与随后的处理运行相对应的至少一个参数。
-
7.发明申请公开(公告)号：US20140031968A1
公开(公告)日：2014-01-30
申请号：US13557955
申请日：2012-07-25
IPC分类号： G05B19/18
CPC分类号： H01L22/20 , G05B13/048 , G05B19/41875 , G05B2219/32182 , G05B2219/32187 , G05B2219/32194 , G05B2219/45031 , Y02P90/14 , Y02P90/22 , Y02P90/26 , Y02P90/86
摘要： A method for run-to-run control and sampling optimization in a semiconductor manufacturing process includes the steps of: determining a process output and corresponding metrology error associated with an actual metrology for a current processing run in the semiconductor manufacturing process; determining a predicted process output and corresponding prediction error associated with a virtual metrology for the current processing run; and controlling at least one parameter corresponding to a subsequent processing run as a function of the metrology error and the prediction error.
摘要翻译： 一种用于半导体制造过程中的运行控制和采样优化的方法包括以下步骤：确定与半导体制造过程中的当前处理运行的实际测量相关联的过程输出和相应的度量误差; 确定与当前处理运行的虚拟度量相关联的预测过程输出和相应的预测误差; 以及根据计量误差和预测误差来控制与随后的处理运行相对应的至少一个参数。
-
公开(公告)号：US08799042B2
公开(公告)日：2014-08-05
申请号：US13205190
申请日：2011-08-08
IPC分类号： G06Q10/00
摘要： A system, method and computer program product for maintaining an infrastructure of components. The system receives structured data, unstructured data, and infrastructure data from a database. The system runs at least one statistical and optimization modeler with one or more of: the received structured data, the received unstructured data and the received infrastructure data, in order to calculate a health index of at least one component of the infrastructure. The health index represents a health attribute of the at least one component. The system establishes at least one maintenance plan of the infrastructure, based on the calculated health index. Each established maintenance plan is associated with at least one health index. The system compares health indices of the at least one established maintenance plan. The system selects a plan, among the at least one established maintenance plan, whose health index is a maximum among the compared health indices.
摘要翻译： 一种用于维护组件基础设施的系统，方法和计算机程序产品。 系统从数据库接收结构化数据，非结构化数据和基础架构数据。 该系统运行至少一个统计和优化建模器，具有以下一个或多个：接收的结构化数据，接收的非结构化数据和接收的基础设施数据，以便计算基础设施的至少一个组件的健康指数。 健康指数表示至少一个组件的健康属性。 系统根据计算出的健康指数建立基础设施的至少一个维护计划。 每个既定的维护计划与至少一个健康指数相关联。 该系统比较至少一个已建立的维护计划的健康指数。 所述系统在所述至少一个已建立的维护计划中选择其健康指数在所述健康指数中的最大值的计划。
-
9.发明申请公开(公告)号：US20190130476A1
公开(公告)日：2019-05-02
申请号：US15827740
申请日：2017-11-30
申请人： Yada Zhu
发明人： Yada Zhu
摘要： A predictive modeling system and method that improves revenue management for a cargo business, preferably the air cargo business, by bridging a bidding stage and a decision stage by jointly learning dual predictive models, wherein it leverages the intrinsic co-clusters of originations and destinations (OD) to enable information sharing among different OD pairs. The predictive modeling method effectively leverages the block structure of the OD pairs thus increasing revenue.
-
10.发明授权公开(公告)号：US08732627B2
公开(公告)日：2014-05-20
申请号：US13526152
申请日：2012-06-18
申请人： Robert J. Baseman , Jingrui He , Yada Zhu
发明人： Robert J. Baseman , Jingrui He , Yada Zhu
IPC分类号： G06F17/50
CPC分类号： G06Q10/04 , G05B19/41875 , Y02P90/22 , Y02P90/26
摘要： A method for performing enhanced wafer quality prediction in a semiconductor manufacturing process includes the steps of: obtaining data including at least one of tensor format wafer processing conditions, historical wafer quality measurements and prior knowledge relating to at least one of the semiconductor manufacturing process and wafer quality; building a hierarchical prediction model including at least the tensor format wafer processing conditions; and predicting wafer quality for a newly fabricated wafer based at least on the hierarchical prediction model and corresponding tensor format wafer processing conditions.
摘要翻译： 一种用于在半导体制造过程中执行增强的晶片质量预测的方法包括以下步骤：获得包括张量格式晶片处理条件，历史晶片质量测量和与半导体制造工艺和晶片中的至少一个相关的先前知识中的至少一个的数据 质量; 构建包括至少张量格式晶片处理条件的分级预测模型; 并且至少基于分层预测模型和对应的张量格式晶片处理条件来预测新制造的晶片的晶片质量。
-
-
-
-
-
-
-
-
-
搜索结果
16 条记录 (耗时 0.025 秒)