ELECTRON MICROSCOPE SYSTEM USING AUGMENTED REALITY
    1.
    发明申请
    ELECTRON MICROSCOPE SYSTEM USING AUGMENTED REALITY 审中-公开
    电子显微镜系统使用增强现实

    公开(公告)号:US20130221218A1

    公开(公告)日:2013-08-29

    申请号:US13748183

    申请日:2013-01-23

    CPC classification number: H01J37/261 H01J37/265

    Abstract: Provided is an electron microscope system using an augmented reality in that it recognizes a sample identification information by using an observation image generated through an electron microscope and the observation image is linked with the pre-set sample information according to the recognized sample identification information, so that an augmented reality image thereof is provided, thereby even the unskilled man can easily utilize the electron microscope and it can generate excitement about an education thereof.

    Abstract translation: 提供一种使用增强现实的电子显微镜系统,其通过使用通过电子显微镜产生的观察图像来识别样本识别​​信息,并且观察图像根据所识别的样本识别信息与预设的样本信息相关联,因此 提供了增强的现实图像,从而即使不熟练的人也可以容易地利用电子显微镜,并且可以产生关于其教育的兴奋。

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