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公开(公告)号：US20070003447A1
公开(公告)日：2007-01-04
申请号：US11474723
申请日：2006-06-26
申请人： K. Gleason , Peter Navratil , John Martin , John Dunklee , Cali Sartor , Thane Allison
发明人： K. Gleason , Peter Navratil , John Martin , John Dunklee , Cali Sartor , Thane Allison
IPC分类号： B01L3/00
CPC分类号： G01N35/1016 , B01L3/0268 , B01L3/0293 , B01L3/502715 , B01L3/50273 , B01L9/527 , B01L2200/025 , B01L2200/027 , B01L2200/0684 , B01L2200/16 , B01L2300/1805 , B01L2400/0415 , B01L2400/0418 , B01L2400/0439 , B01L2400/0487 , G01N2035/1034 , G01N2035/1044
摘要： A fluid dispensing apparatus and system for facilitating dispensing small volume, fluid samples to microfluidic devices.
摘要翻译： 一种流体分配装置和系统，用于便于将小体积的流体样品分配到微流体装置。
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公开(公告)号：US07618590B2
公开(公告)日：2009-11-17
申请号：US11474723
申请日：2006-06-26
申请人： K. Reed Gleason , Peter Navratil , John Martin , John Dunklee , Cali Sartor , Thane Allison
发明人： K. Reed Gleason , Peter Navratil , John Martin , John Dunklee , Cali Sartor , Thane Allison
IPC分类号： B01L3/02
CPC分类号： G01N35/1016 , B01L3/0268 , B01L3/0293 , B01L3/502715 , B01L3/50273 , B01L9/527 , B01L2200/025 , B01L2200/027 , B01L2200/0684 , B01L2200/16 , B01L2300/1805 , B01L2400/0415 , B01L2400/0418 , B01L2400/0439 , B01L2400/0487 , G01N2035/1034 , G01N2035/1044
摘要： A fluid dispensing apparatus and system for facilitating dispensing small volume, fluid samples to microfluidic devices.
摘要翻译： 一种流体分配装置和系统，用于便于将小体积的流体样品分配到微流体装置。
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公开(公告)号：US20070075716A1
公开(公告)日：2007-04-05
申请号：US11607398
申请日：2006-12-01
申请人： K. Gleason , Tim Lesher , Eric Strid , Mike Andrews , John Martin , John Dunklee , Leonard Hayden , Amr Safwat
发明人： K. Gleason , Tim Lesher , Eric Strid , Mike Andrews , John Martin , John Dunklee , Leonard Hayden , Amr Safwat
IPC分类号： G01R31/02
CPC分类号： G01R1/06772 , G01R1/06711 , G01R1/06755 , G01R1/06777
摘要： A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
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公开(公告)号：US20080054929A1
公开(公告)日：2008-03-06
申请号：US11977280
申请日：2007-10-24
申请人： K. Gleason , Tim Lesher , Eric Strid , Mike Andrews , John Martin , John Dunklee , Leonard Hayden , Amr Safwat
发明人： K. Gleason , Tim Lesher , Eric Strid , Mike Andrews , John Martin , John Dunklee , Leonard Hayden , Amr Safwat
IPC分类号： G01R11/067
CPC分类号： G01R1/06772 , G01R1/06711 , G01R1/06755 , G01R1/06777
摘要： A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
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公开(公告)号：US20080054923A1
公开(公告)日：2008-03-06
申请号：US11977282
申请日：2007-10-24
申请人： K. Gleason , Tim Lesher , Eric Strid , Mike Andrews , John Martin , John Dunklee , Leonard Hayden , Amr Safwat
发明人： K. Gleason , Tim Lesher , Eric Strid , Mike Andrews , John Martin , John Dunklee , Leonard Hayden , Amr Safwat
CPC分类号： G01R1/06772 , G01R1/06711 , G01R1/06755 , G01R1/06777
摘要： A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
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公开(公告)号：US20080048692A1
公开(公告)日：2008-02-28
申请号：US11977324
申请日：2007-10-24
申请人： K. Gleason , Tim Lesher , Eric Strid , Mike Andrews , John Martin , John Dunklee , Leonard Hayden , Amr Safwat
发明人： K. Gleason , Tim Lesher , Eric Strid , Mike Andrews , John Martin , John Dunklee , Leonard Hayden , Amr Safwat
IPC分类号： G01R1/067
CPC分类号： G01R1/06772 , G01R1/06711 , G01R1/06755 , G01R1/06777
摘要： A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
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公开(公告)号：US20080024149A1
公开(公告)日：2008-01-31
申请号：US11906055
申请日：2007-09-27
申请人： K. Gleason , Tim Lesher , Eric Strid , Mike Andrews , John Martin , John Dunklee , Leonard Hayden , Amr Safwat
发明人： K. Gleason , Tim Lesher , Eric Strid , Mike Andrews , John Martin , John Dunklee , Leonard Hayden , Amr Safwat
IPC分类号： G01R1/067
CPC分类号： G01R1/06772 , G01R1/06711 , G01R1/06755 , G01R1/06777
摘要： A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
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公开(公告)号：US07489149B2
公开(公告)日：2009-02-10
申请号：US11977280
申请日：2007-10-24
申请人： K. Reed Gleason , Tim Lesher , Eric W. Strid , Mike Andrews , John Martin , John Dunklee , Leonard Hayden , Amr M. E. Safwat
发明人： K. Reed Gleason , Tim Lesher , Eric W. Strid , Mike Andrews , John Martin , John Dunklee , Leonard Hayden , Amr M. E. Safwat
IPC分类号： G01R11/67
CPC分类号： G01R1/06772 , G01R1/06711 , G01R1/06755 , G01R1/06777
摘要： A probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies may include a dielectric substrate that supports a signal path interconnecting test instrumentation and a probe tip and a ground path that shields both the signal oath and the probe tip.
摘要翻译： 用于测量高频下的集成电路或其他微电子器件的电特性的探针可以包括支持互连测试仪器的信号路径的电介质基底，以及屏蔽信号誓言和探针尖端的探针尖端和接地路径。
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公开(公告)号：US07482823B2
公开(公告)日：2009-01-27
申请号：US11977282
申请日：2007-10-24
申请人： K. Reed Gleason , Tim Lesher , Eric W. Strid , Mike Andrews , John Martin , John Dunklee , Leonard Hayden , Amr M. E. Safwat
发明人： K. Reed Gleason , Tim Lesher , Eric W. Strid , Mike Andrews , John Martin , John Dunklee , Leonard Hayden , Amr M. E. Safwat
IPC分类号： G01R31/02
CPC分类号： G01R1/06772 , G01R1/06711 , G01R1/06755 , G01R1/06777
摘要： A probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies may include a dielectric substrate that supports a signal path interconnecting test instrumentation and a probe tip and a ground path that shields both the signal path and the probe tip.
摘要翻译： 用于测量高频下的集成电路或其他微电子器件的电特性的探针可以包括支持互连测试仪器的信号路径的电介质衬底以及屏蔽信号路径和探针尖端的探针尖端和接地路径。
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公开(公告)号：US06815963B2
公开(公告)日：2004-11-09
申请号：US10445099
申请日：2003-05-23
申请人： K. Reed Gleason , Tim Lesher , Eric W. Strid , Mike Andrews , John Martin , John Dunklee , Leonard Hayden , Amr M. E. Safwat
发明人： K. Reed Gleason , Tim Lesher , Eric W. Strid , Mike Andrews , John Martin , John Dunklee , Leonard Hayden , Amr M. E. Safwat
IPC分类号： G01R3100
CPC分类号： G01R1/06772 , G01R1/06711 , G01R1/06755 , G01R1/06777
摘要： A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
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