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公开(公告)号:US20220196603A1
公开(公告)日:2022-06-23
申请号:US17441939
申请日:2019-04-18
Inventor: Nizar Riyad Khaled JABER , Amal HAJJAJ , Nouha ALCHEIKH , Mohammad Ibrahim YOUNIS
IPC: G01N29/036 , G01N33/00
Abstract: A gas sensor includes a microbeam configured to vibrate when driven by a driving electrode; a vibrometer configured to measure a frequency associated with a vibration of the microbeam; a power source configured to apply a first voltage (V1) to the microbeam to heat the microbeam; and a controller configured to control the power source and to receive the frequency measured by the vibrometer. The controller controls the power source to heat the microbeam so that the microbeam is at a buckling point, and the controller determines at least one characteristic of a gas present around the microbeam, based on the frequency received from the vibrometer.
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公开(公告)号:US20220163418A1
公开(公告)日:2022-05-26
申请号:US17441941
申请日:2020-04-15
Inventor: Nouha ALCHEIKH , Amal HAJJAJ , Mohammad Ibrahim YOUNIS
IPC: G01L9/00
Abstract: A device for measuring pressure includes a curved microbeam having opposing ends, a length extending between the pair of opposing ends, and a plurality of resonant frequencies, an actuating electrode extending along the length of the curved microbeam and spaced from the curved microbeam, an AC power source in communication with one of the opposing ends and the actuating electrode to deliver an AC signal at a first symmetric resonant frequency and a second symmetric resonant frequency selected from the plurality of resonant frequencies to the curved microbeam, a DC power source in communication with the opposing ends to pass an electrothermal voltage along a length of the curved microbeam, and a frequency monitoring device to monitor changes in the first symmetric resonant frequency and the second symmetric resonant frequency caused by an ambient pressure surrounding the curved microbeam.
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公开(公告)号:US20230057869A1
公开(公告)日:2023-02-23
申请号:US17792279
申请日:2020-12-21
Inventor: Nouha ALCHEIKH , Sofiane BEN MBAREK , Mohammad YOUNIS
IPC: G01R33/028 , G01R33/038 , B81B7/02
Abstract: A method for measuring a magnetic field with a micro-sensor system includes applying a direct current (ITh) to a curved micro-beam to control a stiffness of the curved micro-beam; placing the micro-sensor system into an external magnetic field (B); selecting with a controller, based on an expected value of the external magnetic field (B), a given resonant frequency of the micro-beam; measuring with a resonant frequency tracking device the given resonant frequency of the micro-beam; and calculating in the controller the external magnetic field (B), based on (1) the measured resonant frequency, (2) the applied current (ITh), and (3) calibration data stored in the controller. The calibration data is indicative of a dependency between a change of the selected resonant frequency and the external magnetic field.
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