Multi-Spot Defect Inspection System
    1.
    发明申请
    Multi-Spot Defect Inspection System 有权
    多点缺陷检测系统

    公开(公告)号:US20140268118A1

    公开(公告)日:2014-09-18

    申请号:US13834662

    申请日:2013-03-15

    CPC classification number: G01N21/9501 G01N21/956

    Abstract: The disclosure is directed to a system and method for inspecting a spinning sample by substantially simultaneously scanning multiple spots on a surface of the sample utilizing a plurality of illumination beams. Portions of illumination reflected, scattered, or radiated from respective spots on the surface of the sample are collected by at least one detector array. Information associated with at least one defect of the sample is determined by at least one computing system in communication with the detector array. According to various embodiments, at least one of scan pitch, spot size, spot separation, and spin rate is controlled to compensate pitch error due to tangential spot separation.

    Abstract translation: 本公开涉及一种用于通过基本上同时使用多个照明光束扫描样品表面上的多个点来检查纺丝样品的系统和方法。 通过至少一个检测器阵列收集从样品表面上的各个点反射,散射或辐射的照射部分。 与样品的至少一个缺陷相关联的信息由与检测器阵列通信的至少一个计算系统确定。 根据各种实施例,控制扫描间距,光斑尺寸,光点分离和旋转速率中的至少一个以补偿由于切点分离引起的俯仰误差。

    Monolithic optical beam splitter with focusing lens

    公开(公告)号:US09664909B1

    公开(公告)日:2017-05-30

    申请号:US13940130

    申请日:2013-07-11

    CPC classification number: G02B17/086 G02B27/141

    Abstract: A beam splitter includes first and second prisms. The first prism includes first, second, and third optical surfaces. The second prism includes three surfaces, one of which faces the second surface of the first prism and both transmit and reflect light. The first surface of the first prism is curved and forms a lens for focusing light either transmitted or reflected by the common interface between the two prisms. The first prism is from a single piece of material. Fabrication includes making two cuts through a lens to cut-out an intermediate section. A portion of the intermediate section is cut-off to form the third surface of the first prism. The first surface of the first prism corresponds to the curved top surface of the lens. The second surface of the first prism corresponds to the bottom plano surface of the lens. The first and second prisms are then combined.

    Multi-spot defect inspection system
    3.
    发明授权
    Multi-spot defect inspection system 有权
    多点缺陷检测系统

    公开(公告)号:US09182358B2

    公开(公告)日:2015-11-10

    申请号:US13834662

    申请日:2013-03-15

    CPC classification number: G01N21/9501 G01N21/956

    Abstract: The disclosure is directed to a system and method for inspecting a spinning sample by substantially simultaneously scanning multiple spots on a surface of the sample utilizing a plurality of illumination beams. Portions of illumination reflected, scattered, or radiated from respective spots on the surface of the sample are collected by at least one detector array. Information associated with at least one defect of the sample is determined by at least one computing system in communication with the detector array. According to various embodiments, at least one of scan pitch, spot size, spot separation, and spin rate is controlled to compensate pitch error due to tangential spot separation.

    Abstract translation: 本公开涉及一种用于通过基本上同时使用多个照明光束扫描样品表面上的多个点来检查纺丝样品的系统和方法。 通过至少一个检测器阵列收集从样品表面上的各个点反射,散射或辐射的照射部分。 与样品的至少一个缺陷相关联的信息由与检测器阵列通信的至少一个计算系统确定。 根据各种实施例,控制扫描间距,光斑尺寸,光点分离和旋转速率中的至少一个以补偿由于切点分离引起的俯仰误差。

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