摘要:
According to a method of manufacturing a semiconductor device, a short-circuit wiring is formed in a region on a wafer including a dicing region, and electrode pads for input and output signals of a plurality of devices disposed in a semiconductor device forming region are electrically short-circuited by the short-circuit wiring, so that occurrence of plasma damage is suppressed even if the wafer is subjected to various plasma processes. When the wafer subjected to the plasma processes is cut along the dicing region to separate a semiconductor device, the electrical short-circuit of the electrode pads by the short-circuit wiring is released, so that the functionally unwanted short-circuit of the devices or the like is appropriately released.
摘要:
An apparatus for introduction into a test body includes a functional portion for obtaining information on an inside of a test body; a power source for supplying power for driving the functional portion; and an enclosed container for accommodating the functional portion and the power source. A cross-sectional shape orthogonal to a longitudinal direction of the enclosed container is an elliptical shape to make an outer shape small to alleviate a burden on a test subject during introduction into a body by swallowing or the like for test.
摘要:
An image pickup apparatus includes an image pickup device chip having an image pickup device on a front face and an external connection terminal on a rear face through a via interconnect; a wiring board placed within a projection plane of the image pickup device chip and made up of an intermediate portion whose first main face is connected with the external connection terminal, a first flexing portion and a second flexing portion extended from opposite ends of the intermediate portion and bent toward the intermediate portion at a predetermined angle, and a first extension portion and a second extension portion; and a signal cable connected to the first extension portion and the second extension portion.
摘要:
An image pickup device according to the present invention including an image pickup device main body having a semiconductor substrate provided with a light-receiving section and a wiring layer laminated on the semiconductor substrate, has a first surface which causes light to enter the light-receiving section and positioned on the image pickup device main body on the side of the wiring layer and a second surface which causes light to enter the light-receiving section and positioned on the image pickup device main body on the side of the semiconductor substrate so as to oppose the first surface.
摘要:
A semiconductor apparatus including a semiconductor substrate having a first principal surface on which an electric circuit is formed and a second principal surface opposed to the first principal surface, and a through hole that penetrates the first principal surface and the second principal surface, a multilayered wiring layer having a plurality of conductive wiring layers connected to the electric circuit and a plurality of inter-layer insulating layers having an insulating layer opening of a same size and at a same position as a through hole opening which is an opening of the first principal surface of the through hole, an electrode pad that covers the insulating layer opening connected to the conductive wiring layer and a lead-out wiring layer having a through wiring layer connected to the electrode pad formed inside the through hole and a connection wiring layer formed integral with the through wiring layer.
摘要:
A solid-state image pickup apparatus includes a solid-state image pickup device, a microlens member laminated on the solid-state image pickup device, and a flat plate-like cover glass attached onto a region excluding a pixel region on the microlens member as viewed in a planar manner from above the microlens member to seal the pixel region of the solid-state image pickup device.