公开(公告)号：US07319528B2

公开(公告)日：2008-01-15

申请号：US11263742

申请日：2005-11-01

申请人： Kazuhiko Hidaka

发明人： Kazuhiko Hidaka

IPC分类号： G02B7/04 ,  H01J3/14

CPC分类号： G01Q30/02 ,  G01Q40/00 ,  G01Q60/22

摘要： A surface texture measuring instrument provided with a near-field measuring unit (30) including a near-field probe (33) that forms a near-field light at a tip end thereof when a laser beam is irradiated, a laser source (35) that generates the laser beam to be irradiated on the near-field probe (33), a detection element (38) that detects scattering effect of the near-field light generated when the near-field probe (33) is moved close to a workpiece (1), and an actuator (32) that displaces the near-field probe (33) and the workpiece (1) in a direction moving close to/away from each other, includes: a laser length-measuring unit (20) that measures a relative distance between a reference position and the workpiece (1) in the vicinity of the tip end of the near-field probe (33) or a relative distance between the reference position and the near-field probe (33).

摘要翻译： 一种具有近场测量单元（30）的表面纹理测量仪器，包括当照射激光束时在其尖端处形成近场光的近场探测器（33），激光源（35） 产生要照射在近场探测器（33）上的激光束;检测元件（38），用于检测当近场探测器（33）靠近工件移动时产生的近场光的散射效应 （1），并且使近场探头（33）和工件（1）沿彼此靠近/远离的方向移动的致动器（32）包括：激光长度测量单元（20），其包括：激光长度测量单元 测量在近场探头（33）的尖端附近的基准位置和工件（1）之间的相对距离或基准位置与近场探头（33）之间的相对距离。

公开(公告)号：US06848315B2

公开(公告)日：2005-02-01

申请号：US10075650

申请日：2002-02-14

申请人： Kaoru Matsuki ,  Kazuhiko Hidaka ,  Kiyokazu Okamoto

发明人： Kaoru Matsuki ,  Kazuhiko Hidaka ,  Kiyokazu Okamoto

IPC分类号： G01B7/00 ,  G01B21/00 ,  G01D5/20 ,  G01H9/00 ,  G01H11/02 ,  G01H11/04 ,  G01B5/016

CPC分类号： G01D5/2086 ,  G01B7/003

摘要： A stylus structure (40) integrally incorporating a stylus (2), a vibrator (4), a detector (6), a first secondary magnetic circuit (12) and a second primary magnetic circuit (21), and a stylus support (30) integrally incorporating a first primary magnetic circuit (11) and a second secondary magnetic circuit (22) are mutually fittable, thereby achieving signal transmission by the respective magnetic circuits using no electrical contact.

摘要翻译： 一体地结合有触针（2），振动器（4），检测器（6），第一次级磁路（12）和第二主磁路（21）的触针结构（40）和触控笔支架 ）与第一主磁路（11）和第二次级磁路（22）整合成相互配合，从而通过不使用电接触的各个磁路实现信号传输。

公开(公告)号：US06723262B2

公开(公告)日：2004-04-20

申请号：US09768891

申请日：2001-01-24

申请人： Kazuhiko Hidaka ,  Tetsuji Takagi

发明人： Kazuhiko Hidaka ,  Tetsuji Takagi

IPC分类号： B29C4792

CPC分类号： B28B11/125 ,  B01J35/04 ,  B29C47/0028 ,  B29C47/92 ,  B29C2947/92076 ,  B29C2947/92447 ,  B29C2947/92571 ,  B29C2947/92942 ,  F01N3/0222 ,  F01N3/2828 ,  F01N2330/06 ,  Y02T10/20

摘要： A method for manufacturing a honeycomb structure having slits is provided which permits accurate forming of fine slits to cut or grind a targeted cell array alone and which is suitable for application to mass production. The method provides a honeycomb structure having slits and a plurality of arrays of numerous cells aligned in parallel. The slits communicate with an external space and formed along the arrays. The slits are formed by protruding a slit forming member 4-toward the molded article during the extrusion step.

摘要翻译： 提供一种具有狭缝的蜂窝结构体的制造方法，其能够精确地形成细缝以单独切割或研磨目标电池阵列，并且适用于批量生产。 该方法提供了具有狭缝的蜂窝结构体和多个平行排列的多个单元阵列。 狭缝与外部空间连通并沿阵列形成。 狭缝通过在挤出步骤期间向切割成形品突出而形成。

公开(公告)号：US07581438B2

公开(公告)日：2009-09-01

申请号：US11263681

申请日：2005-11-01

申请人： Kazuhiko Hidaka

发明人： Kazuhiko Hidaka

IPC分类号： G01B5/281

CPC分类号： G01Q60/38 ,  G01Q60/22 ,  G01Q70/04

摘要： A surface texture measuring probe (60) includes a probe head (65), a first supporting body (61), a second supporting body (62), a piezoelectric element (63) and a balancer (64). The first supporting body includes a first supporter (611) having an inner space, and a plurality of beams (613) respectively extending from equiangular arrangement positions of the first supporter toward the center and supporting the probe head (65) at the tip end thereof. The second supporting body (62) includes a second supporter (621) and a holder (622) supported by a plurality of beams (623) respectively extending from equiangular arrangement positions of the second supporter towards the center. The piezoelectric element (63) is disposed between the probe head and the holder, and formed to vibrate in an axial direction.

摘要翻译： 表面纹理测量探针（60）包括探头（65），第一支撑体（61），第二支撑体（62），压电元件（63）和平衡器（64）。 第一支撑体包括具有内部空间的第一支撑件（611）和分别从第一支撑件的等角布置位置朝向中心延伸的多个梁（613），并且在顶端处支撑探头（65） 。 第二支撑体（62）包括第二支撑件（621）和由分别从第二支撑件的等角位置向中心延伸的多个梁（623）支撑的支架（622）。 压电元件（63）设置在探针头和保持器之间，并形成为沿轴向振动。

公开(公告)号：US20060056548A1

公开(公告)日：2006-03-16

申请号：US11226129

申请日：2005-09-14

申请人： Akinori Saito ,  Kazuhiko Hidaka

发明人： Akinori Saito ,  Kazuhiko Hidaka

IPC分类号： H04L27/08 ,  H04B17/00 ,  H04L27/06

CPC分类号： G01D18/00

摘要： N pieces of gains Gi are sequentially and temporarily set in a control circuit (23), and a stylus (131) is brought in contact with a workpiece (W) for conducting a temporary measurement. At this time, a sensor detection signal output from a sensor detection circuit (21) is filtered by a filter (31) to take out only a frequency component corresponding to a frequency of hunting generated in a closed loop (L) including the control circuit (23). Gains Gj that do not generate hunting in the closed loop (L) are extracted, and the largest gain Gj is set in the control circuit (23) in view of enhancement in responsivity etc. of the measurement. Alternatively, by pressing the stylus (131) into the workpiece (W), a displacement signal indicating a pressing amount and a sensor signal output from a sensor (13) are measured in accordance with a measurement load applied to the stylus (131) to calculate a gain Gs′ of the sensor (13) based on the two signals. By compensating the gain of the control circuit in accordance with the gain Gs′, frequency characteristics of the measurement control system can be kept to the largest even when the stylus (131) or the workpiece (W) is replaced with another one having different properties.

摘要翻译： 在控制电路（23）中依次临时设置N个增益G i，并且触针（131）与工件（W）接触以进行临时测量。 此时，由传感器检测电路（21）输出的传感器检测信号由滤波器31滤波，仅取出对应于在包括控制电路的闭环（L）中产生的振荡频率的频率成分 （23）。 提取在闭环（L）中不产生搜索的增益G ，并且在控制电路（23）中设置最大增益G SUB 提高测量的响应度等。 或者，通过将触针（131）按压到工件（W）中，根据施加到触针（131）的测量负载来测量表示按压量的位移信号和从传感器（13）输出的传感器信号 基于两个信号计算传感器（13）的增益G S S S S S SUB。 通过根据增益G“补偿控制电路的增益，即使当触针（131）或工件（W）的测量控制系统的频率特性也可以保持最大， 被具有不同性质的另一个替代。

公开(公告)号：US20050173332A1

公开(公告)日：2005-08-11

申请号：US11050863

申请日：2005-02-07

申请人： Kazuhiko Hidaka

发明人： Kazuhiko Hidaka

IPC分类号： B01D39/20 ,  B01D46/24

CPC分类号： B01D46/2459 ,  B01D46/2451 ,  B01D46/2466 ,  B01D2046/2496

摘要： There are disclosed a method and a device for sealing an end portion of a porous structure having a columnar outer shape, such as a ceramic honeycomb filter, with a sealing material, so that the whole end portion can be uniformly coated with the sealing material, and a porous structure sealed at an end portion in a superior state by the method. In the method, an end portion of a porous structure 9 is sealed at an end face of the porous structure 9 having a columnar outer shape. A porous elastic material 13 having a predetermined thickness adhered on a planar base plate 15 is impregnated with a slurried sealing material, the porous elastic material 13 is pressed onto the end face of the porous structure 9 to coat the end portion of the porous structure 9 with the sealing material.

摘要翻译： 公开了一种用密封材料密封具有柱状外形的多孔结构的端部（例如陶瓷蜂窝过滤器）的方法和装置，使得整个端部可以均匀地涂覆有密封材料， 以及通过该方法在上部状态的端部密封的多孔结构体。 在该方法中，多孔结构体9的端部密封在具有柱状外形的多孔结构体9的端面。 将具有预定厚度的多孔弹性材料13粘附在平面基板15上浸渍有浆料密封材料，多孔弹性材料13被压在多孔结构9的端面上以涂覆多孔结构9的端部 与密封材料。

公开(公告)号：US20110004326A1

公开(公告)日：2011-01-06

申请号：US12588204

申请日：2009-10-07

申请人： Hans-Ulrich Danzebrink ,  Kazuhiko Hidaka ,  Hartmut Illers ,  Akinori Saito

发明人： Hans-Ulrich Danzebrink ,  Kazuhiko Hidaka ,  Hartmut Illers ,  Akinori Saito

IPC分类号： G05B11/01

CPC分类号： G01Q10/06 ,  G01D3/0365

摘要： A method of actuating a system comprising a movable component and an actuator configured to move the movable component comprises providing a control signal representative of a desired motion of the movable component. The control signal is supplied to one or more resonators. Each of the one or more resonators has a mode of oscillation representative of at least one elastic mode of oscillation of the system. The control signal is modified by subtracting from the control signal a signal representative of a response of the one or more resonators to the control signal. The actuator is operated in accordance with the modified control signal. Thus, undesirable elastic oscillations of the system which might occur if the system were operated with the original control system can be reduced.

摘要翻译： 一种致动包括可移动部件和构造成移动可移动部件的致动器的系统的方法包括提供表示可移动部件的期望运动的控制信号。 控制信号被提供给一个或多个谐振器。 一个或多个谐振器中的每一个具有代表系统的至少一个弹性振荡模式的振荡模式。 通过从控制信号中减去表示一个或多个谐振器对控制信号的响应的信号来修改控制信号。 执行器根据修改的控制信号进行操作。 因此，如果系统使用原始控制系统操作，则可能发生系统的不期望的弹性振荡。

公开(公告)号：US06516669B2

公开(公告)日：2003-02-11

申请号：US09855986

申请日：2001-05-15

申请人： Kaoru Matsuki ,  Kazuhiko Hidaka ,  Masanori Arai

发明人： Kaoru Matsuki ,  Kazuhiko Hidaka ,  Masanori Arai

IPC分类号： G01B5016

CPC分类号： G01B7/016 ,  B23Q17/20

摘要： A stylus 20 is mounted directly on detector 32 and the detector 32 is mounted directly on a holder 10. Thus, an vibration-type contact detection sensor 1 is formed in a state in which the holder 10 and the stylus 20 are placed out of contact with each other and the stylus 20 and the detector 32 are placed in contact with each other. Therefore, attenuation of vibration and status change of the stylus 20 by the holder 10 can be circumvented and vibration and status change of the stylus 20 can be propagated directly to the detector 32, so that the detector 32 can detect vibration and status change of the stylus 20 with high sensitivity, and contact with a workpiece can be detected with high sensitivity.

公开(公告)号：US06327789B1

公开(公告)日：2001-12-11

申请号：US09366774

申请日：1999-08-04

申请人： Kunitoshi Nishimura ,  Kazuhiko Hidaka ,  Nobuhisa Nishioki

发明人： Kunitoshi Nishimura ,  Kazuhiko Hidaka ,  Nobuhisa Nishioki

IPC分类号： G01B500

CPC分类号： G01B7/002 ,  G01B7/012

摘要： In a touch signal probe (10) having a stylus holder (11), a vibrator (12) supported by the stylus holder (11) and has a contact portion (12A) to contact to a workpiece at a distal end thereof, a vibrating means (13A) for vibrating the vibrator (12) in an axial direction resonantly, and a detecting means (13B) for detecting the contact by a change in the vibration of the vibrator (12) caused by the contact to the workpiece is provided. The vibrator (12) is supported by the stylus holder (11) at two support points (A) and (B) positioned with a node of vibration of the vibrator (12) therebetween. Since the vibrating means (13A) and the detecting means (13B) are disposed spanning over the two support points, the node of vibration can be formed between the support points A and B and the size of the touch signal probe (10) can be easily reduced.

摘要翻译： 在具有触针保持器（11）的触摸信号探头（10）中，由触针保持器（11）支撑的振动器（12），并具有在其远端与工件接触的接触部分（12A），振动 提供用于振动振动器（12）在轴向上共振的装置（13A），以及用于通过与工件接触引起的振动器（12）的振动变化来检测接触的检测装置（13B）。 在两个支撑点（A）和（B）之间，振动器（12）由触针保持器（11）支撑，其中振动器（12）的振动节点位于它们之间。 由于振动装置（13A）和检测装置（13B）跨越两个支撑点设置，所以可以在支撑点A和B之间形成振动节点，并且触摸信号探针（10）的尺寸可以是 容易减少

公开(公告)号：US06307084B1

公开(公告)日：2001-10-23

申请号：US09477948

申请日：2000-01-05

申请人： Kaoru Matsuki ,  Kiyokazu Okamoto ,  Kazuhiko Hidaka

发明人： Kaoru Matsuki ,  Kiyokazu Okamoto ,  Kazuhiko Hidaka

IPC分类号： G01B7012

CPC分类号： G01B7/012

摘要： A contact location detecting mechanism (1) of a touch signal probe (10) includes a rotary motion generator (30) for scanningly moving a stylus (102) on a plane (A), a phase value detector (50) for detecting a phase value (&thgr;) indicating a rotation position of the scanning rotary motion, and a contact location detector (70)for detecting a contact location of a contact portion (102A) based on a detection signal value (V) detected by the detector (103B) and the phase value (&thgr;). Since the contact location of the contact portion (102A) can be detected by the contact location detector (70), the touch signal probe (10) can be used for a profiling measurement and continuous measurement of a workpiece.

摘要翻译： 触摸信号探针（10）的接触位置检测机构（1）包括用于扫描地在平面（A）上移动触针（102）的旋转运动发生器（30），用于检测相位 指示扫描旋转运动的旋转位置的值（theta），以及用于基于由检测器（103B）检测到的检测信号值（V）检测接触部分（102A）的接触位置的接触位置检测器（70） 和相位值（theta）。 由于接触部分（102A）的接触位置可以由接触位置检测器（70）检测，所以触摸信号探针（10）可用于对工件进行测量和连续测量。