SEMICONDUCTOR DEVICE TESTING
    3.
    发明申请
    SEMICONDUCTOR DEVICE TESTING 失效
    半导体器件测试

    公开(公告)号:US20090313511A1

    公开(公告)日:2009-12-17

    申请号:US12484647

    申请日:2009-06-15

    摘要: A semiconductor device test circuit includes a data producing unit to produce first test data to be fed into a semiconductor device, and expected value data; a first data retaining unit to retain the first test data, and feed the first test data into the semiconductor device; a second data retaining unit to retain the expected value data; a comparison unit to compare output data outputted through the first data retaining unit and the expected value data outputted from the second data retaining unit to supply data indicating comparison result between the output data and the expected value data; and a switching unit to switch the data fed into the second data retaining unit between the expected value data and the output data, wherein the first data retaining unit and the second data retaining unit form parts of a scan chain into which second test data may externally be fed.

    摘要翻译: 半导体器件测试电路包括产生要馈送到半导体器件的第一测试数据的数据产生单元和期望值数据; 第一数据保持单元,用于保持第一测试数据,并将第一测试数据馈送到半导体器件; 第二数据保留单元,用于保留期望值数据; 比较单元,用于比较通过第一数据保持单元输出的输出数据和从第二数据保持单元输出的期望值数据,以提供指示输出数据和期望值数据之间的比较结果的数据; 以及切换单元,用于在预期值数据和输出数据之间切换馈送到第二数据保持单元中的数据,其中第一数据保留单元和第二数据保持单元形成扫描链的部分,第二测试数据可以在其外部 喂食。

    TEMPERATURE MEASUREMENT DEVICE AND TEMPERATURE MEASUREMENT METHOD
    4.
    发明申请
    TEMPERATURE MEASUREMENT DEVICE AND TEMPERATURE MEASUREMENT METHOD 有权
    温度测量装置和温度测量方法

    公开(公告)号:US20110243183A1

    公开(公告)日:2011-10-06

    申请号:US13078477

    申请日:2011-04-01

    申请人: Kenji GOTO

    发明人: Kenji GOTO

    IPC分类号: G01K3/00

    摘要: A temperature measurement device includes a first surface temperature measurement part performing a measurement to be used as a first surface temperature; a first reference temperature measurement part performing a measurement to be used as a first reference temperature; a first external air temperature measurement part performing a measurement to be used as a first external air temperature; a second surface temperature measurement part performing a measurement to be used as a second surface temperature; a second reference temperature measurement part performing a measurement to be used as a second reference temperature; a second external air temperature measurement part performing a measurement to be used as a second external air temperature; a deep-part temperature computation part computing the deep-part temperature of a subject to be measured; and an external air temperature computation part computing the external air temperature of the external air.

    摘要翻译: 温度测量装置包括执行用作第一表面温度的测量的第一表面温度测量部分; 执行要用作第一参考温度的测量的第一参考温度测量部分; 执行要用作第一外部空气温度的测量的第一外部空气温度测量部分; 执行要用作第二表面温度的测量的第二表面温度测量部分; 执行要用作第二参考温度的测量的第二参考温度测量部分; 执行要用作第二外部空气温度的测量的第二外部空气温度测量部分; 深部温度计算部分计算待测对象的深部温度; 以及计算外部空气的外部空气温度的外部空气温度计算部。

    ELECTRONIC THERMOMETER AND BODY TEMPERATURE MEASUREMENT METHOD
    5.
    发明申请
    ELECTRONIC THERMOMETER AND BODY TEMPERATURE MEASUREMENT METHOD 有权
    电子温度计和体温测量方法

    公开(公告)号:US20110158284A1

    公开(公告)日:2011-06-30

    申请号:US12973182

    申请日:2010-12-20

    申请人: Kenji GOTO

    发明人: Kenji GOTO

    IPC分类号: G01K7/00 G01K13/00

    摘要: An electronic thermometer includes first and second body surface temperature measurement portions to measure first and second values of a measurement object, first and second reference temperature measurement portions to measure values at each position having a predetermined thermal resistance relative to a measurement position of the first and second values, and having a first and second thermal resistance relative to the open air, third temperature measurement portion to measure a third value at a different position from the previous values, correction portion to correct the obtained values; and core body temperature calculation portion to calculate a value of the object using the obtained values.

    摘要翻译: 一种电子体温计包括:第一和第二体表温度测量部分,用于测量测量对象的第一和第二值;第一和第二参考温度测量部分,测量具有相对于第一和第二测量位置的预定热阻的每个位置处的值; 第二值,并且具有相对于露天的第一和第二热阻,第三温度测量部分,用于测量与先前值不同的位置处的第三值,校正部分,以校正所获得的值; 和核心体温计算部分,使用所获得的值来计算物体的值。