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公开(公告)号:US11839077B2
公开(公告)日:2023-12-05
申请号:US17190865
申请日:2021-03-03
Applicant: Kioxia Corporation
Inventor: Toshifumi Kuroda , Yusuke Shimada , Satoshi Nagashima
CPC classification number: H10B43/20 , H10B41/10 , H10B41/20 , H10B41/35 , H10B43/10 , H10B43/27 , H10B43/35
Abstract: A semiconductor storage device includes: a first conductive layer and a second conductive layer arranged in a first direction; a plurality of first semiconductor layers facing the first conductive layer, the plurality of first semiconductor layers arranged in a second direction intersecting the first direction; a first charge storage layer disposed between the plurality of first semiconductor layers and the first conductive layer; and a first insulating layer provided between the plurality of first semiconductor layers and the first charge storage layer in the first direction. The first insulating layer includes a first region, a second region, and a third region provided between the first region and the second region in the second direction. A nitrogen concentration in the first region and the second region is lower than a nitrogen concentration in the third region.
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公开(公告)号:US11765899B2
公开(公告)日:2023-09-19
申请号:US17191217
申请日:2021-03-03
Applicant: Kioxia Corporation
Inventor: Ryota Narasaki , Weili Cai , Satoshi Nagashima , Takayuki Ishikawa , Yusuke Shimada , Yefei Han
IPC: H10B43/27 , H01L23/522 , H10B41/27
CPC classification number: H10B43/27 , H01L23/5226 , H10B41/27
Abstract: A semiconductor storage device includes a first conductive layer; a first insulating layer between the first and second conductive layers; a second insulating layer between the first conductive layer and the first insulating layer; a third insulating layer between the second conductive layer and the first insulating layer; a fourth insulating layer between the second conductive layer and the third conductive layer; a fifth insulating layer between the second conductive layer and the fourth insulating layer; and a sixth insulating layer between the third conductive layer and the fourth insulating layer. The first conductive layer has a first surface. The second conductive layer has a second surface. A barrier conductive film containing at least one of nitrogen (N) or titanium (Ti) is provided on the first surface and the second surface.
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