Power Grid Structure to Optimize Performance of a Multiple Core Processor
    2.
    发明申请
    Power Grid Structure to Optimize Performance of a Multiple Core Processor 失效
    电网结构优化多核处理器的性能

    公开(公告)号:US20080252308A1

    公开(公告)日:2008-10-16

    申请号:US12143911

    申请日:2008-06-23

    IPC分类号: G01R31/26

    摘要: A reduced number of voltage regulator modules provides a reduced number of supply voltages to the package. The package includes a voltage plane for each of the voltage regulator modules. Each core or other component on the die is tied to a switch on the package, and each switch is electrically connected to all of the voltage planes. A wafer-level test determines a voltage that optimizes performance of each core or other component. Given these voltage values, an engineer may determine voltage settings for the voltage regulator modules and which cores are to be connected to which voltage regulator modules. A database stores voltage setting data, such as the optimal voltage for each component, switch values, or voltage settings for each voltage regulator module. An engineering wire may permanently set each switch to customize the voltage supply to each core or other component.

    摘要翻译: 减少数量的电压调节器模块为封装提供了减少的电源电压数量。 该封装包括用于每个电压调节器模块的电压平面。 管芯上的每个核心或其他部件连接到封装上的开关,并且每个开关电连接到所有电压平面。 晶圆级测试确定优化每个核心或其他组件的性能的电压。 给定这些电压值,工程师可以确定电压调节器模块的电压设置以及要连接到哪些电压调节器模块的哪些核心。 数据库存储电压设置数据,例如每个组件的最佳电压,开关值或每个电压调节器模块的电压设置。 工程线可以永久地设置每个开关以定制每个芯或其他部件的电压供应。

    POWER GRID STRUCTURE TO OPTIMIZE PERFORMANCE OF A MULTIPLE CORE PROCESSOR
    4.
    发明申请
    POWER GRID STRUCTURE TO OPTIMIZE PERFORMANCE OF A MULTIPLE CORE PROCESSOR 失效
    优化多核心处理器性能的电网结构

    公开(公告)号:US20080012583A1

    公开(公告)日:2008-01-17

    申请号:US11456658

    申请日:2006-07-11

    IPC分类号: G01R27/08 G01R31/26

    摘要: A reduced number of voltage regulator modules provides a reduced number of supply voltages to the package. The package includes a voltage plane for each of the voltage regulator modules. Each core or other component on the die is tied to a switch on the package, and each switch is electrically connected to all of the voltage planes. A wafer-level test determines a voltage that optimizes performance of each core or other component. Given these voltage values, an engineer may determine voltage settings for the voltage regulator modules and which cores are to be connected to which voltage regulator modules. A database stores voltage setting data, such as the optimal voltage for each component, switch values, or voltage settings for each voltage regulator module. An engineering wire may permanently set each switch to customize the voltage supply to each core or other component.

    摘要翻译: 减少数量的电压调节器模块为封装提供了减少的电源电压数量。 该封装包括用于每个电压调节器模块的电压平面。 管芯上的每个核心或其他部件连接到封装上的开关,并且每个开关电连接到所有电压平面。 晶圆级测试确定优化每个核心或其他组件的性能的电压。 给定这些电压值,工程师可以确定电压调节器模块的电压设置以及要连接到哪些电压调节器模块的哪些核心。 数据库存储电压设置数据,例如每个组件的最佳电压,开关值或每个电压调节器模块的电压设置。 工程线可以永久地设置每个开关以定制每个芯或其他部件的电压供应。