公开(公告)号：US10790029B2

公开(公告)日：2020-09-29

申请号：US16111319

申请日：2018-08-24

Applicant: MICRON TECHNOLOGY, INC.

Inventor： Luyen Vu ,  Kalyan C. Kavalipurau ,  Jae-Kwan Park ,  Erwin E. Yu

IPC: G11C16/26 ,  G11C16/04 ,  G11C16/24 ,  G11C7/04 ,  G11C16/30 ,  G11C16/32 ,  G11C5/14

Abstract: Apparatus and methods to vary, in response to temperature, a precharge voltage level of a sense node during a sense operation, a sense node develop time during the sense operation, and/or a ratio of a deboost voltage level capacitively decoupled from the sense node to a boost voltage level capacitively coupled to the sense node during the sense operation.

公开(公告)号：US20180366203A1

公开(公告)日：2018-12-20

申请号：US16111319

申请日：2018-08-24

Applicant: MICRON TECHNOLOGY, INC.

Inventor： Luyen Vu ,  Kalyan C. Kavalipurau ,  Jae-Kwan Park ,  Erwin E. Yu

IPC: G11C16/26 ,  G11C16/32 ,  G11C16/30 ,  G11C16/24 ,  G11C16/04 ,  G11C7/04 ,  G11C5/14

CPC classification number: G11C16/26 ,  G11C5/145 ,  G11C7/04 ,  G11C16/0483 ,  G11C16/24 ,  G11C16/30 ,  G11C16/32

Abstract: Apparatus and methods to vary, in response to temperature, a precharge voltage level of a sense node during a sense operation, a sense node develop time during the sense operation, and/or a ratio of a deboost voltage level capacitively decoupled from the sense node to a boost voltage level capacitively coupled to the sense node during the sense operation.

公开(公告)号：US10127988B2

公开(公告)日：2018-11-13

申请号：US15248692

申请日：2016-08-26

Applicant: MICRON TECHNOLOGY, INC.

Inventor： Luyen Vu ,  Kalyan C. Kavalipurau ,  Jae-Kwan Park ,  Erwin E. Yu

IPC: G11C16/26 ,  G11C16/04 ,  G11C16/24 ,  G11C7/04 ,  G11C16/30 ,  G11C16/32 ,  G11C5/14

Abstract: Sense circuits and methods to vary, in response to temperature, a precharge voltage level of a sense node during a sense operation, a sense node develop time during the sense operation, and/or a ratio of a deboost voltage level capacitively decoupled from the sense node to a boost voltage level capacitively coupled to the sense node during the sense operation.

公开(公告)号：US20180061497A1

公开(公告)日：2018-03-01

申请号：US15248692

申请日：2016-08-26

Applicant: MICRON TECHNOLOGY, INC.

Inventor： Luyen Vu ,  Kalyan C. Kavalipurau ,  Jae-Kwan Park ,  Erwin E. Yu

IPC: G11C16/26 ,  G11C16/04 ,  G11C16/24 ,  G11C7/04 ,  G11C16/30

CPC classification number: G11C16/26 ,  G11C5/145 ,  G11C7/04 ,  G11C16/0483 ,  G11C16/24 ,  G11C16/30 ,  G11C16/32

Abstract: Sense circuits and methods to vary, in response to temperature, a precharge voltage level of a sense node during a sense operation, a sense node develop time during the sense operation, and/or a ratio of a deboost voltage level capacitively decoupled from the sense node to a boost voltage level capacitively coupled to the sense node during the sense operation.