公开(公告)号：US20140232855A1

公开(公告)日：2014-08-21

申请号：US14184132

申请日：2014-02-19

Applicant: MITUTOYO CORPORATION

Inventor： Masaoki YAMAGATA ,  Kentaro NEMOTO ,  Eisuke MORIUCHI ,  Tadashi IWAMOTO

IPC: G01B11/24

CPC classification number: G01B11/2518 ,  G01B11/007

Abstract: A shape measuring apparatus includes a first light source, a second light source, an optical system, an image capturer, and a controller. The first light source emits visible light. The second light source emits measurement light used in a measurement. The optical system emits the visible light and the measurement light at the same position on a work piece. The image capturer captures an image of the measurement light reflected by the work piece. The controller is configured to cause the emission of the visible light onto the work piece with the first light source when determining a measurement position, and to control the emission of the measurement light onto the work piece with the second light source when making the measurement.

Abstract translation: 一种形状测量装置，包括第一光源，第二光源，光学系统，图像捕获器和控制器。 第一个光源发出可见光。 第二光源发射测量中使用的测量光。 光学系统将可见光和测量光发射到工件上相同的位置。 图像捕获器捕获由工件反射的测量光的图像。 控制器被配置为在确定测量位置时使用第一光源将可见光发射到工件上，并且在进行测量时控制用第二光源将测量光发射到工件上。

公开(公告)号：US20150226544A1

公开(公告)日：2015-08-13

申请号：US14612480

申请日：2015-02-03

Applicant: MITUTOYO CORPORATION

Inventor： Kentaro NEMOTO ,  Masaoki YAMAGATA ,  Eisuke MORIUCHI ,  Tadashi IWAMOTO

IPC: G01B11/24 ,  G02B5/02 ,  G02B1/11

CPC classification number: G01B11/24 ,  G01B11/026 ,  G02B1/11 ,  G02B5/0278

Abstract: An optical probe includes a probe cover, within which is installed an optical system having an illuminating optical system and a receiving optical system. An emitting region and an incidence region through which light passes are provided to a bottom surface of the probe cover, the bottom surface forming an opposing region opposite a work piece. In addition, a light reflection prevention structure or a diffusion structure is provided to the bottom surface of the probe cover. Light reflected from the work piece is prevented from reflecting off the bottom surface by the reflection prevention structure, or the reflected light is diffused by the diffusion structure. Accordingly, an occurrence of an erroneous value in received light distribution due to second order reflected light can be inhibited.

Abstract translation: 光探头包括探针盖，在其中安装有具有照明光学系统和接收光学系统的光学系统。 发光区域和光通过的入射区域被提供到探针盖的底表面，底面形成与工件相对的相对区域。 此外，在探针盖的底面设置有光反射防止结构或扩散结构。 通过防反射结构防止从工件反射的光从底面反射，或者反射光被扩散结构扩散。 因此，可以抑制由于二次反射光引起的接收光分布中的错误值的发生。

公开(公告)号：US20150226543A1

公开(公告)日：2015-08-13

申请号：US14612467

申请日：2015-02-03

Applicant: MITUTOYO CORPORATION

Inventor： Kentaro NEMOTO ,  Masaoki YAMAGATA ,  Eisuke MORIUCHI ,  Tadashi IWAMOTO

IPC: G01B11/24 ,  G02B1/11

CPC classification number: G01B11/30 ,  G01B11/026 ,  G01B11/24 ,  G02B1/11 ,  G02B5/003 ,  G02B27/0018

Abstract: An optical probe includes a probe cover, within which is installed an optical system having an illuminating optical system and a receiving optical system. An emitting region and an incidence region through which light passes are provided to a bottom surface of the probe cover, the bottom surface forming an opposing region opposite a work piece. The bottom surface forms a surface where, of the light reflected from the work piece, light following a direct reflection direction is reflected in a direction moving away from the incidence region, from a position where light emitted from the emitting region is emitted at the work piece. Accordingly, an amount of second order reflected light striking the incidence region can be suppressed and, therefore, an occurrence of an erroneous value in received light distribution can be suppressed.

Abstract translation: 光探头包括探针盖，在其中安装有具有照明光学系统和接收光学系统的光学系统。 发光区域和光通过的入射区域被提供到探针盖的底表面，底面形成与工件相对的相对区域。 底表面形成一个表面，其中从工件反射的光，沿着直接反射方向的光沿着从入射区域移开的方向从在发光区域发射的光在工作中发射的位置被反射 片。 因此，可以抑制入射入射区域的二次反射光的量，因此能够抑制接收光分布中的错误值的发生。

公开(公告)号：US20150211842A1

公开(公告)日：2015-07-30

申请号：US14601280

申请日：2015-01-21

Applicant: MITUTOYO CORPORATION

Inventor： Masaoki YAMAGATA ,  Kentaro NEMOTO ,  Toshihisa TAKAI ,  Tadashi IWAMOTO

IPC: G01B11/24

CPC classification number: G01B11/24 ,  G01B11/25

Abstract: An illumination apparatus according to the present invention includes a light source, a reflecting mirror, an optical system, and a calculator. The reflecting mirror includes a first reflector and a second reflector, and is capable, while changing a reflection angle, of reflecting and directing at an object a first divided light, the first divided light being a portion of light from the light source emitted at the first reflector. The optical system divides the light from the light source into the first divided light and a second divided light, and guides the second divided light to the second reflector. The calculator is capable of calculating the reflection angle of the reflecting mirror by receiving the second divided light reflected by the second reflector.

Abstract translation: 根据本发明的照明装置包括光源，反射镜，光学系统和计算器。 反射镜包括第一反射器和第二反射器，并且能够在改变反射角的同时将物体反射并引导到第一分开的光，所述第一分割光是来自所述光源的光的一部分 第一反射器 光学系统将来自光源的光分成第一分割光和第二分光，并将第二分光引导到第二反射器。 计算器能够通过接收由第二反射器反射的第二分割光来计算反射镜的反射角。

公开(公告)号：US20140253724A1

公开(公告)日：2014-09-11

申请号：US14197715

申请日：2014-03-05

Applicant: MITUTOYO CORPORATION

Inventor： Masaoki YAMAGATA ,  Kentaro NEMOTO ,  Eisuke MORIUCHI ,  Tadashi IWAMOTO

IPC: G01B11/24

CPC classification number: G01B11/24 ,  G01B11/005 ,  G01B11/25

Abstract: A shape measuring apparatus includes: an irradiating part configured to irradiate work with a linear line laser, the irradiating part including: a light source configured to produce laser light; a first optical member configured to linearly spread the laser light from the light source and generate the line laser; and a second optical member, provided between the light source and the first optical member, configured to adjust an area of irradiation with a line laser on the work; a first sensor configured to receive a line laser reflected by the work and capture an image of the work; a lens configured to form an image of a line laser reflected by the work on an imaging surface of the first sensor; and a control part configured to control adjustment of the area of irradiation with the line laser on the work by the second optical member.

Abstract translation: 一种形状测量装置，包括：被配置为用线性激光照射加工的照射部，所述照射部包括：被配置为产生激光的光源; 第一光学构件，其被配置为从所述光源线性地扩展所述激光并产生所述线激光; 以及第二光学构件，设置在所述光源和所述第一光学构件之间，被配置为调节所述工件上的线激光的照射面积; 第一传感器，被配置为接收由所述工件反射的线激光并捕获所述工件的图像; 配置为在第一传感器的成像表面上形成由工件反射的线激光的图像的透镜; 以及控制部，被配置为控制由所述线激光对所述第二光学部件的作业的照射区域的调整。