摘要:
An apparatus and method are disclosed for testing a hard macro that is embedded in a system on a chip (SOC) that is included in an integrated circuit chip. The SOC includes the hard macro. A logic design and operation of the hard macro are unknown. A test wrapper is embedded in the SOC. The test wrapper includes a scan chain. The test wrapper surrounds inputs and outputs of the hard macro. The test wrapper receives a known test data pattern in the scan chain that is included in the test wrapper. The hard macro receives from the test wrapper a set of non-test standard SOC inputs when the SOC is not in a test mode and receives the known test data pattern when the SOC is in the test mode. The hard macro generates a set of outputs in response to the inputs. The hard macro is tested utilizing the known test data pattern.
摘要:
A processor is disclosed including trace and profile logic for gathering and producing data corresponding to events occurring during instruction execution. In one embodiment, the trace and profile logic includes a serial queue for serializing data corresponding to a plurality of “discontinuity instructions” grouped together for simultaneous execution. A “discontinuity instruction” alters, or is executed as a result of an altering of, sequential instruction fetching.
摘要:
The present invention is an integrated circuit containing multiple digital signal processors (DSPs). A single host processor interface is also placed on the chip to connect the multiple DSPs to the host. A separate direct memory access (DMA) unit is provided for each DSP to facilitate flow of data to and from a data memory for each DSP. Each DSP also includes an instruction memory.