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公开(公告)号：US5043545A
公开(公告)日：1991-08-27
申请号：US562441
申请日：1990-08-02
CPC分类号： H01H13/10 , H01H13/186 , H01H2011/067
摘要： A microswitch, comprising: a casing consisting of a base casing half and a cover casing half; a plurality of terminal pieces received, at their intermediate parts, in slots provided in the base casing half and extending substantially perpendicularly from a surface opposing a corresponding surface of the cover casing half; a contact mechanism accommodated in a cavity in the casing and electrically connected to the terminal pieces; and a push-button member elastically supported by a spring member and projecting out of the casing for actuating the contact mechanism by movement of the push-button member; the terminal pieces being provided with projections extending from their leading edges, and the slot being provided with a recess for receiving the projection; wherein the slot comprises an external part and an internal part which is narrower than the external part, and a projecting length of the projection is larger than a depth of the internal part. Thereby, the projection may be easily fitted into the recess because the terminal piece is still in the broader part of the slot and can be easily shifted at this stage, but, once the projection is received in the recess, the terminal piece is securely held in position by the narrower part of the slot.
摘要翻译： 一种微型开关，包括：壳体，其由基部壳体半部和盖壳体半部组成; 多个端子片在其中间部分处接收在设置在基座壳体半部中的槽中，并且从与罩壳半体的对应表面相对的表面基本垂直地延伸; 接触机构，其容纳在所述壳体中的空腔中并电连接到所述端子片; 以及由弹簧构件弹性地支撑并从所述壳体突出的按钮构件，用于通过所述按钮构件的移动来致动所述接触机构; 所述端子片设置有从其前缘延伸的凸起，并且所述槽设置有用于接收所述突起的凹部; 其中所述槽包括外部部分和比所述外部部分窄的内部部分，并且所述突出部的突出长度大于所述内部部分的深度。 因此，突起可容易地嵌入凹槽中，因为端子件仍然位于槽的较宽部分中，并且可以在该阶段容易地移动，但是一旦突出部被容纳在凹部中，端子件被牢固地保持 通过狭槽的较窄部分在位置。
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2.发明授权
公开(公告)号：US4851627A
公开(公告)日：1989-07-25
申请号：US219852
申请日：1988-07-13
摘要： This pressure sensitive switch includes a bellows made of corrosion resistant material and with a hollow cylindrical body, which defines a pressure receiving surface on the outer surface of its one closed end portion, and with an open end which is fixedly secured to a fixed member in such a manner that the bellows may expand and contract in its longitudinal direction in response to small changes in the pressure difference between its interior space and the space outside it; a plunger mounted so as to reciprocate in response to the expansion and contraction of the bellows by being acted upon by the inner surface of the bottom portion of the bellows; and a switch assembly which is switched to and fro in response to the reciprocating motion of the plunger. This construction is compact and efficiently functional.
摘要翻译： 该压敏开关包括由耐腐蚀材料制成的波纹管和中空圆柱体，其在其一个封闭端部的外表面上限定了压力接收表面，并且开口端固定地固定到固定构件 波纹管可以响应于其内部空间与外部空间之间的压力差的小的变化而在其纵向方向上膨胀和收缩; 柱塞，其安装成响应于波纹管的膨胀和收缩而由波纹管的底部的内表面作用而往复运动; 以及响应于柱塞的往复运动而来回切换的开关组件。 这种结构紧凑而高效。
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公开(公告)号：US20060006886A1
公开(公告)日：2006-01-12
申请号：US11038485
申请日：2005-01-21
IPC分类号： G01R31/305
CPC分类号： G01R31/311
摘要： An apparatus for diagnosing a fault in a semiconductor device includes an laser applying unit, a detection/conversion unit, and a fault diagnosis unit. The semiconductor device is held at a state where no bias voltage is applied thereto. The laser applying unit then applies a pulse laser beam having a predetermined wavelength to the semiconductor device so as to two-dimensionally scan the semiconductor device with the pulse laser beam. The detection/conversion unit detects an electromagnetic wave generated from a laser applied position in the semiconductor device, and converts the detected electromagnetic wave into a time-varying voltage signal that corresponds to a time-varying amplitude of an electric field of the electromagnetic wave. The fault diagnosis unit derives an electric field distribution in the semiconductor device on the basis of the time-varying voltage signal to perform fault diagnosis on the semiconductor device.
摘要翻译： 用于诊断半导体器件中的故障的装置包括激光施加单元，检测/转换单元和故障诊断单元。 半导体器件保持在不施加偏置电压的状态。 激光施加单元然后将具有预定波长的脉冲激光束施加到半导体器件，以便用脉冲激光束对半导体器件进行二维扫描。 检测/转换单元检测从半导体器件中的激光施加位置产生的电磁波，并将检测到的电磁波转换成对应于电磁波的电场的时变幅度的时变电压信号。 故障诊断单元根据时变电压信号，在半导体装置中导出电场分布，对半导体装置进行故障诊断。
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4.发明授权Automatic recording level control system providing for manual change of the standard level 失效自动录像电平控制系统提供手动更改标准电平
公开(公告)号：US5283701A
公开(公告)日：1994-02-01
申请号：US988783
申请日：1992-12-10
申请人： Masatsugu Yamashita
发明人： Masatsugu Yamashita
CPC分类号： G11B5/02
摘要： A magnetic cassette recorder is disclosed which has a microprocessor having stored therein a standard recording level. Inputting a signal representative of an actual amount of attenuation being offered by a level control rheostat to the input record signal, and a signal representative of the amplitude of the record signal that has traveled through the rheostat, the microprocessor computes the actual amplitude of the record signal before being attenuated by the rheostat. When the thus computed amplitude of the input record signal exceeds the stored standard amplitude, the microprocessor puts out a control signal for adjusting the rheostat to the standard amplitude. The standard recording level stored in the microprocessor is manually variable by switches to the liking of the particular user.
摘要翻译： 公开了一种具有在其中存储有标准记录水平的微处理器的磁带录像机。 输入表示由电平控制变阻器提供的输入记录信号的实际衰减量的信号，以及表示已经通过变阻器行进的记录信号的振幅的信号，微处理器计算记录的实际振幅 信号在被变阻器衰减之前。 当这样计算的输入记录信号的幅度超过所存储的标准幅度时，微处理器将调节变阻器的控制信号输出到标准幅度。 存储在微处理器中的标准记录级别可通过切换到特定用户的喜好来手动变化。
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公开(公告)号：US07542140B2
公开(公告)日：2009-06-02
申请号：US11948466
申请日：2007-11-30
IPC分类号： G01B11/00
CPC分类号： G01N21/3581 , G01N21/3563
摘要： A detection apparatus includes a sample holding section, an irradiation means, a detection means, a calculation means, and an evaluation means. The irradiation means irradiates a substance held in the sample holding section with a THz wave. The detection unit detects a THz wave that has passed through or been reflected from the substance. The calculation unit determines a frequency dependence of a property of the substance with respect to the irradiated THz wave and then calculates a slope of a straight line or a slope of a straight line obtained by straight-line approximation of the frequency dependence of the property of the substance. The evaluation unit evaluates the state change of the substance by comparing a previously-obtained slope of a straight line of the frequency dependence of the property of the substance in a standard state and the slope of the straight line of the substance calculated.
摘要翻译： 检测装置包括样本保持部，照射装置，检测装置，计算装置和评估装置。 照射装置用THz波照射保持在样品保持部中的物质。 检测单元检测已经通过或被物质反射的太赫兹波。 计算单元确定物质相对于照射的太赫兹波的特性的频率依赖性，然后计算直线的斜率或直线近似的直线的斜率，该直线近似为 物质。 评估单元通过比较以前获得的标准状态下的物质的性质的频率依赖性的直线的斜率与所计算的物质的直线的斜率之间的比例来评估物质的状态变化。
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公开(公告)号：US5051547A
公开(公告)日：1991-09-24
申请号：US454291
申请日：1989-12-22
申请人： Kunio Nagata , Masatsugu Yamashita
发明人： Kunio Nagata , Masatsugu Yamashita
摘要： A switch mechanism for an electric power tool, comprising: a linear slider received in a switch case so as to be moved manually in a first direction against the biasing force of a return spring; an actuating pin carried by the linear slider so as to be moveable along a second direction perpendicular to the first direction; a pair of direction converting levers crossed in the manner of a pair of scissors by a pivot pin mounted on the switch case, the actuating pin being located adjacent to first ends of the direction converting levers; a pair of lateral sliders engaged by second ends of the direction converting levers and allowed to move in the second direction; a first contact set including contacts carried by the linear slider and the wall surface of the switch case for mutual cooperation as the linear slider is moved in the first direction; and a second contact set including contacts carried by the lateral sliders and the wall surface of the switch case for mutual cooperation as the lateral sliders are moved in the second direction; the actuating pins being moveable between the first ends of the direction converting levers so as to selectively actuate one of the direction converting levers and the associated one of the lateral sliders through movement of the linear slider along the first direction via an engagement between the actuating pin and the first end of the associated one of the direction converting levers.
摘要翻译： 一种用于电动工具的开关机构，包括：容纳在开关壳体中的线性滑块，以克服复位弹簧的偏置力在第一方向上手动地移动; 由所述线性滑块承载的致动销，以便能够沿着垂直于所述第一方向的第二方向移动; 一对方向转换杆以一对剪刀的方式通过安装在开关壳体上的枢轴销交叉，所述致动销位于所述方向转换杆的第一端附近; 一对横向滑动件，其与方向转换杆的第二端接合并允许沿第二方向移动; 第一触点组包括由直线滑块承载的触点和用于相互协作的开关壳体的壁表面，作为线性滑块在第一方向上移动; 以及第二触点组，其包括由所述侧滑块和所述开关壳体的壁表面承载的触点，用于当所述横向滑块沿所述第二方向移动时相互协作; 所述致动销可在所述方向转换杆的所述第一端之间移动，以通过所述线性滑块沿着所述第一方向的移动来选择性地致动所述方向转换杆中的一个和所述相关联的所述侧向滑块中的一个， 以及相关联的一个方向转换杆的第一端。
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公开(公告)号：US20110216312A1
公开(公告)日：2011-09-08
申请号：US13061363
申请日：2009-08-27
申请人： Toru Matsumoto , Yoshimitsu Aoki , Masayoshi Tonouchi , Hironaru Murakami , Sunmi Kim , Masatsugu Yamashita , Chiko Otani
发明人： Toru Matsumoto , Yoshimitsu Aoki , Masayoshi Tonouchi , Hironaru Murakami , Sunmi Kim , Masatsugu Yamashita , Chiko Otani
IPC分类号： G01N21/00
CPC分类号： G01R31/307 , G01N21/3581 , G01N21/9501 , G01R31/308 , H01L22/12 , H01L2924/0002 , H01L2924/00
摘要： For a semiconductor device S, an inspection is performed in a zero-bias state by use of electromagnetic waves generated by irradiation of pulsed laser light, and an inspection range is set with reference to layout information of the semiconductor device S to perform two-dimensional scanning by inspection light L1 of the pulsed laser light within the range. Moreover, with the inspection range of the semiconductor device S arranged at a predetermined position with respect to an optical axis of an optical system, and with a solid immersion lens 36 disposed for the semiconductor device S, by a galvanometer scanner 30 being scanning means, the inspection range of the semiconductor device S is two-dimensionally scanned by the inspection light L1 via the solid immersion lens 36, and an electromagnetic wave emitted from the semiconductor device S is detected by a photoconductive element 40. Accordingly, a semiconductor inspection apparatus and inspection method capable of preferably performing an inspection in a zero-bias state for a semiconductor device is realized.
摘要翻译： 对于半导体器件S，通过使用由脉冲激光的照射产生的电磁波在零偏置状态下进行检查，并且参考半导体器件S的布局信息设置检查范围，以执行二维 通过脉冲激光的检查光L1扫描该范围内。 此外，由于半导体器件S的检查范围相对于光学系统的光轴布置在预定位置，并且对于半导体器件S设置的固体浸没透镜36，作为扫描装置的电流计扫描器30， 半导体器件S的检查范围通过固体浸没透镜36被检查光L1二维扫描，并且由光电导元件40检测从半导体器件S发射的电磁波。因此，半导体检查设备和 实现了能够优选在半偏置状态下对半导体器件进行检查的检查方法。
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公开(公告)号：US07977116B2
公开(公告)日：2011-07-12
申请号：US11716702
申请日：2007-03-12
CPC分类号： G01N21/3581 , G01N21/3577
摘要： Provided are an analysis method and an analysis apparatus that can perform analysis of a substance and information obtainment with relatively high accuracy and reproducibility without previously allowing a carrier to carry a reagent for a color reaction. In the analysis method and the analysis apparatus, the information on an analyte is obtained by using an electromagnetic wave of a frequency including a frequency band which is at least a part of a frequency range of 30 GHz or more and 30 THz or less. A non-fibrous, isotropic porous material is allowed to hold the analyte, the analyte held by the porous material is irradiated with the electromagnetic wave, a change in the propagation state of the electromagnetic wave due to transmission through or reflection by the porous material is detected and information on the analyte is obtained based on the result of the detection.
摘要翻译： 提供一种分析方法和分析装置，其可以在不预先允许载体携带用于着色反应的试剂的情况下以相对高的精度和再现性进行物质和信息获取的分析。 在分析方法和分析装置中，通过使用包括至少部分30GHz以上且30THz以下的频带的频带的频率的电磁波来获得关于分析物的信息。 允许非纤维各向同性多孔材料保持分析物，由多孔材料保持的分析物被电磁波照射，由于通过多孔材料的透射或反射而导致的电磁波的传播状态的变化是 基于检测结果获得检测信息和分析物信息。
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公开(公告)号：US20080137068A1
公开(公告)日：2008-06-12
申请号：US11948466
申请日：2007-11-30
IPC分类号： G01J3/00
CPC分类号： G01N21/3581 , G01N21/3563
摘要： A detection apparatus includes a sample holding section, an irradiation means, a detection means, a calculation means, and an evaluation means. The irradiation means irradiates a substance held in the sample holding section with a THz wave. The detection unit detects a THz wave passed through or reflected from the substance. The calculation unit determines a frequency dependence of a property of the substance with respect to the irradiated THz wave and then calculates a slope of a straight line or a slope of a straight line obtained by straight-line approximation of the frequency dependence of the property of the substance. The evaluation unit evaluates the state change of the substance by comparing a previously-obtained slope of a straight line of the frequency dependence of the property of the substance in a standard state and the slope of the straight line of the substance calculated.
摘要翻译： 检测装置包括样本保持部，照射装置，检测装置，计算装置和评估装置。 照射装置用THz波照射保持在样品保持部中的物质。 检测单元检测通过或反射的物质的太赫兹波。 计算单元确定物质相对于照射的太赫兹波的特性的频率依赖性，然后计算直线的斜率或直线近似的直线的斜率，该直线近似为 物质。 评估单元通过比较以前获得的标准状态下的物质的性质的频率依赖性的直线的斜率与所计算的物质的直线的斜率之间的比例来评估物质的状态变化。
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公开(公告)号：US07173447B2
公开(公告)日：2007-02-06
申请号：US11038485
申请日：2005-01-21
IPC分类号： G01R31/26
CPC分类号： G01R31/311
摘要： An apparatus for diagnosing a fault in a semiconductor device includes an laser applying unit, a detection/conversion unit, and a fault diagnosis unit. The semiconductor device is held at a state where no bias voltage is applied thereto. The laser applying unit then applies a pulse laser beam having a predetermined wavelength to the semiconductor device so as to two-dimensionally scan the semiconductor device with the pulse laser beam. The detection/conversion unit detects an electromagnetic wave generated from a laser applied position in the semiconductor device, and converts the detected electromagnetic wave into a time-varying voltage signal that corresponds to a time-varying amplitude of an electric field of the electromagnetic wave. The fault diagnosis unit derives an electric field distribution in the semiconductor device on the basis of the time-varying voltage signal to perform fault diagnosis on the semiconductor device.
摘要翻译： 用于诊断半导体器件中的故障的装置包括激光施加单元，检测/转换单元和故障诊断单元。 半导体器件保持在不施加偏置电压的状态。 激光施加单元然后将具有预定波长的脉冲激光束施加到半导体器件，以便用脉冲激光束对半导体器件进行二维扫描。 检测/转换单元检测从半导体器件中的激光施加位置产生的电磁波，并将检测到的电磁波转换成对应于电磁波的电场的时变幅度的时变电压信号。 故障诊断单元根据时变电压信号，在半导体装置中导出电场分布，对半导体装置进行故障诊断。
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