摘要:
A memory cell array is logically divided into a plurality of regions having different reading speeds, the respective regions having the different reading speeds include region information storage regions for storing region information in which at least two addresses present in the memory cell at the same time are set to be different regions, a reading control circuit is constituted to carry out a reading operation by determining any of the divided regions which is to be read, selecting an optimum reading method and controlling the reading circuit based on the region information stored in the region information storage region, and an address which can be read in a short time in multivalued information stored in one memory cell is set to be a high speed reading region and is distinguished from regions having the other reading speeds. Consequently, it is possible to efficiently write and read information of 2 bits or more in one memory cell array without reducing a using efficiency of the memory cell array.
摘要:
A memory cell array is logically divided into a plurality of regions having different reading speeds, the respective regions having the different reading speeds include region information storage regions for storing region information in which at least two addresses present in the memory cell at the same time are set to be different regions, a reading control circuit is constituted to carry out a reading operation by determining any of the divided regions which is to be read, selecting an optimum reading method and controlling the reading circuit based on the region information stored in the region information storage region, and an address which can be read in a short time in multivalued information stored in one memory cell is set to be a high speed reading region and is distinguished from regions having the other reading speeds. Consequently, it is possible to efficiently write and read information of 2 bits or more in one memory cell array without reducing a using efficiency of the memory cell array.
摘要:
To provide a single-ended-output-type level shift circuit capable of improving an increase in a delay time according to a voltage level shift operation at low voltage and suppressing an increase in an area occupied by the circuit, first and second inverters 300 and 200 of a CMOS type in which a gate of each MOS transistor is individually driven are provided and the first inverter 300 is used as a level converting unit. A voltage level of a first control signal CS1 output from an output node no1 of the first inverter 300 is forcibly dropped down by a voltage dropping circuit CONT1 so as to accelerate the operation of the second inverter 200. As a result, the inversion of the level of an output signal of the first inverter 300 is accelerated. Further, the balance between current capabilities of the individual transistors is optimized and, in particular, the sizes of the transistors constituting the second inverter 200 are reduced so as to suppress an increase in a circuit area.
摘要:
A divider circuit for dividing the frequency of a multi-phase clock signal, which can ensure a sufficient data latch time even if the multi-phase clock signal has a high frequency, includes a main latch circuit which generates an inverted data signal using, for example, two of eight clock signals of an eight-phase clock signal, and a sub-latch circuit which uses the eight clock signals as a trigger to receive the inverted data signal as a common data signal.
摘要:
In a booster circuit which is operated with a two-phase clock and in which a plurality of (M≧4) lines of boosting cells constitute a unit, a boosting cell in the K-th line (1≦K≦M) is controlled, depending on the voltage of the input terminal of a boosting cell in the KA-th line (KA=(K−1) when (K−1)>0, and KA=M when (K−1)=0). As a result, a charge transfer transistor can transition from the conductive state to the non-conductive state before a clock input to the boosting cell in the K-th line transitions from low to high and then boosting operation is performed. As a result, the backflow of charge via the charge transfer transistor can be reduced or prevented.
摘要:
A boosting circuit configuration with high boosting efficiency is provided which is based on a boosting circuit that performs an operation in accordance with a two-phase clock and which includes a plurality (M≧4) of boosting cell sequences (units). A boosting cell in a K-th sequence (1≦K≦M) is controlled, depending on the potential of the output terminal of a boosting cell in a KA-th sequence (KA=(K−1) when (K−1)>0, and KA=M when (K−1)=0). Thereby, before a clock input to the boosting cell in the K-th sequence goes from “L” to “H”, so that boosting is performed, a charge transfer transistor can be caused to go from the conductive state to the non-conductive state, so that a backflow of charges via charge transfer transistor can be prevented.
摘要:
A boosting circuit comprises a first boosting cell row and a second boosting cell row. The boosting circuit further comprises an analog comparison circuit for comparing the potential of boosting cells on the same stage, and selecting and outputting the lower or higher of the potentials. The potential of an N well is controlled using the output potential of the analog comparison circuit. Thereby, the amplitude of an N well potential can be suppressed, and a single N well region can be shared.
摘要:
An output terminal of a first boost circuit is connected to a second boost circuit. After the second boost circuit is started up, a boost clock frequency of the second boost circuit is reduced. A time required to start up the second boost circuit is reduced, and in addition, a current supply capability of the first boost circuit is increased after the second boost circuit is started up. When the second boost circuit is driven, output voltages of the first and second boost circuits are stably supplied without instantaneously changing the output voltage of the first boost circuit.
摘要:
The nonvolatile semiconductor memory device includes: a first memory block having a first program level and a first read circuit; a second memory block having a second program level different from the first program level and a second read circuit of a scheme different from the first read circuit, the second memory block being formed on the same substrate as the first memory block; and a data output circuit for selecting either the first read circuit or the second read circuit and outputting data read via the selected read circuit externally.
摘要:
To provide a voltage generating circuit for generating a boosted voltage on the basis of a power source voltage or any voltage.A voltage generating circuit having a boosting circuit 1 for generating a voltage higher than a power source voltage, and a reference voltage generating circuit 2 for generating a reference voltage Vref is equipped with a voltage variation detecting circuit 4 having a first input connected to the output of the boosting circuit 1, a second input having a power source Vdd and a third input connected to the ground Vss, a control voltage Vfd being generated at a first output by making reference current equivalent to current occurring due to the potential difference between the first input and the second input flow into the third input, a differential amplifier circuit 61 for comparing the control voltage Vfd and the reference voltage Vref, and a clamp circuit 62 for extracting current from the output of the boosting circuit 1 in accordance with the output of the differential amplifier circuit 61, thereby controlling the output voltage of the boosting circuit 1.