-
公开(公告)号：US20070272124A1
公开(公告)日：2007-11-29
申请号：US10584398
申请日：2004-12-27
申请人： Masayuki Tsutsumi , Satoshi Maeda , Keizo Kawahara , Takefumi Yoshida , Kazutake Okamoto , Morio Morino , Shoichi Uemura , Akinobu Nagara , Noriko Takahashi , Hiroko Oyama , Shunji Kurahara , Jun Yasui
发明人： Masayuki Tsutsumi , Satoshi Maeda , Keizo Kawahara , Takefumi Yoshida , Kazutake Okamoto , Morio Morino , Shoichi Uemura , Akinobu Nagara , Noriko Takahashi , Hiroko Oyama , Shunji Kurahara , Jun Yasui
CPC分类号： C08J5/18 , C08J2379/08 , H05K1/0346
摘要： This polyimide film is superior in heat resistance, rigidity and high frequency properties, is free of inconveniences due to curling even when various functional layers are laminated by heating, and is preferable as a substrate film superior in thermal degradation stability for electronic parts. This polyimide film has a planar orientation coefficient of 0.79-0.89 as measured by an X-ray diffraction method, a difference in the surface planar orientation degree between one surface thereof and the other surface thereof of not more than 2 and a curling degree of not more than 5%, which is obtained by imidation of a polyimide precursor film having a particular imidation rate.
摘要翻译： 该聚酰亚胺膜的耐热性，刚性和高频特性优异，即使通过加热层压各种功能层也不会发生卷曲的不便，优选作为电子部件的热劣化稳定性优异的基板膜。 该聚酰亚胺膜通过X射线衍射法测得的平面取向系数为0.79-0.89，其一个表面与另一个表面之间的表面平面取向度之差不大于2，卷曲度不为 大于5％，其通过酰亚胺化具有特定酰亚胺化速率的聚酰亚胺前体膜获得。
-
公开(公告)号：US08314203B2
公开(公告)日：2012-11-20
申请号：US10584398
申请日：2004-12-27
申请人： Masayuki Tsutsumi , Satoshi Maeda , Keizo Kawahara , Takefumi Yoshida , Kazutake Okamoto , Morio Morino , Shoichi Uemura , Akinobu Nagara , Noriko Takahashi , Hiroko Oyama , Shunji Kurahara , Jun Yasui
发明人： Masayuki Tsutsumi , Satoshi Maeda , Keizo Kawahara , Takefumi Yoshida , Kazutake Okamoto , Morio Morino , Shoichi Uemura , Akinobu Nagara , Noriko Takahashi , Hiroko Oyama , Shunji Kurahara , Jun Yasui
IPC分类号： C08G69/08
CPC分类号： C08J5/18 , C08J2379/08 , H05K1/0346
摘要： This polyimide film is superior in heat resistance, rigidity and high frequency properties, is free of inconveniences due to curling even when various functional layers are laminated by heating, and is preferable as a substrate film superior in thermal degradation stability for electronic parts. This polyimide film has a planar orientation coefficient of 0.79-0.89 as measured by an X-ray diffraction method, a difference in the surface planar orientation degree between one surface thereof and the other surface thereof of not more than 2 and a curling degree of not more than 5%, which is obtained by imidation of a polyimide precursor film having a particular imidation rate.
摘要翻译： 该聚酰亚胺膜的耐热性，刚性和高频特性优异，即使通过加热层压各种功能层也不会发生卷曲的不便，优选作为电子部件的热劣化稳定性优异的基板膜。 该聚酰亚胺膜通过X射线衍射法测得的平面取向系数为0.79-0.89，其一个表面与另一个表面之间的表面平面取向度之差不大于2，卷曲度不为 大于5％，其通过酰亚胺化具有特定酰亚胺化速率的聚酰亚胺前体膜获得。
-
3.发明申请公开(公告)号：US20140192349A1
公开(公告)日：2014-07-10
申请号：US14239468
申请日：2012-08-21
摘要： A film thickness measurement apparatus includes: an ECT sensor for measuring a film thickness of a thermal barrier coating formed on a turbine blade; a storage unit for storing a measurement point on the turbine blade which is a point where the film thickness of the thermal barrier coating is measured; a laser displacement meter for measuring a shape of the turbine blade; a measurement position calculation unit for calculating an actual measurement point suitable for actual film thickness measurement using the ECT sensor, based on the shape of the turbine blade measured by the laser displacement meter and the measurement point on the turbine blade stored in the storage unit; and an arm drive unit for driving the ECT sensor to adjust a measurement position of the ECT sensor based on the actual measurement point calculated by the measurement position calculation unit.
摘要翻译： 膜厚测量装置包括：用于测量形成在涡轮叶片上的隔热涂层的膜厚度的ECT传感器; 存储单元，用于将测量点存储在所述涡轮叶片上，所述测量点是测量所述热障涂层的膜厚度的点; 用于测量涡轮叶片的形状的激光位移计; 测量位置计算单元，用于基于由激光位移计测量的涡轮叶片的形状和存储在存储单元中的涡轮叶片上的测量点来计算适用于使用ECT传感器的实际膜厚测量的实际测量点; 以及臂驱动单元，用于驱动ECT传感器，以基于由测量位置计算单元计算出的实际测量点来调节ECT传感器的测量位置。
-
4.发明授权公开(公告)号：US08988668B2
公开(公告)日：2015-03-24
申请号：US14239468
申请日：2012-08-21
摘要： A film thickness measurement apparatus includes: an ECT sensor for measuring a film thickness of a thermal barrier coating formed on a turbine blade; a storage unit for storing a measurement point on the turbine blade which is a point where the film thickness of the thermal barrier coating is measured; a laser displacement meter for measuring a shape of the turbine blade; a measurement position calculation unit for calculating an actual measurement point suitable for actual film thickness measurement using the ECT sensor, based on the shape of the turbine blade measured by the laser displacement meter and the measurement point on the turbine blade stored in the storage unit; and an arm drive unit for driving the ECT sensor to adjust a measurement position of the ECT sensor based on the actual measurement point calculated by the measurement position calculation unit.
摘要翻译： 膜厚测量装置包括：用于测量形成在涡轮叶片上的隔热涂层的膜厚度的ECT传感器; 存储单元，用于将测量点存储在所述涡轮叶片上，所述测量点是测量所述热障涂层的膜厚度的点; 用于测量涡轮叶片的形状的激光位移计; 测量位置计算单元，用于基于由激光位移计测量的涡轮叶片的形状和存储在存储单元中的涡轮叶片上的测量点来计算适用于使用ECT传感器的实际膜厚测量的实际测量点; 以及臂驱动单元，用于驱动ECT传感器，以基于由测量位置计算单元计算出的实际测量点来调节ECT传感器的测量位置。
-
-
-
搜索结果
4 条记录 (耗时 0.036 秒)
