公开(公告)号：US06564919B2

公开(公告)日：2003-05-20

申请号：US09896785

申请日：2001-06-29

申请人： Matthias Diemer ,  Frank Distler

发明人： Matthias Diemer ,  Frank Distler

IPC分类号： F16D1372

CPC分类号： F16D13/64 ,  F16D13/72

摘要： The pressure plate has at least one friction surface region which can be pressed against a friction facing arrangement of a clutch disk or the like, wherein the pressure plate is formed at least partially from a first material, and wherein a second material having thermal contact with the first material is provided in the pressure plate at least in some areas. In order to be able to compensate for negative umbrella deformation of the pressure plate caused by friction heat during operation of the clutch, the second material has a different thermal expansion, particularly a greater thermal expansion, than the first material.

公开(公告)号：US20050114747A1

公开(公告)日：2005-05-26

申请号：US10707020

申请日：2003-11-14

申请人： Vanessa Brunkhorst ,  Frank Distler ,  Owen Farnsworth ,  Alan Humphrey ,  Kevin Stanley

发明人： Vanessa Brunkhorst ,  Frank Distler ,  Owen Farnsworth ,  Alan Humphrey ,  Kevin Stanley

IPC分类号： G01R31/28 ,  G01R31/3185 ,  G06F17/50

CPC分类号： G01R31/318547

摘要： A method and system for generating a set of scan diagnostic patterns for diagnosing fails in scan chains. The method including: (a) selecting a set of latches; (b) selecting a pattern from a set of test patterns; (c) determining the number of lateral insertions of the selected pattern; (d) determining a number of new lateral insertions that the selected pattern would add to the set of scan diagnostic pattern and adding the selected pattern and a corresponding new insertion count to a count list; (e) repeating steps (b) through (d) until all patterns of the set of test patterns have been selected; (f) selecting a pattern from the count list; (g) adding the pattern selected from the count list to the set of scan diagnostic patterns; and (h) repeating steps (b) through (g) until a there are a predetermined number of patterns in the set of scan diagnostic patterns.

摘要翻译： 用于生成用于诊断的扫描诊断模式的集合的方法和系统在扫描链中失败。 该方法包括：（a）选择一组锁存器; （b）从一组测试图案中选择图案; （c）确定所选图案的横向插入次数; （d）确定所选择的模式将添加到所述扫描诊断模式集合中的新的横向插入的数量，并将所选择的模式和相应的新插入计数添加到计数列表; （e）重复步骤（b）至（d），直到选定了该组测试图案的所有图案; （f）从计数列表中选择一个图案; （g）将从计数列表中选择的模式添加到扫描诊断模式集合; 和（h）重复步骤（b）至（g），直到在该组扫描诊断图案中存在预定数量的图案。

公开(公告)号：US20070249188A1

公开(公告)日：2007-10-25

申请号：US10588142

申请日：2004-11-30

申请人： Wolfgang Mueller ,  Thomas Uhland ,  Dirk Schmidt ,  Ibrahim Degirmenci ,  Frank Distler

发明人： Wolfgang Mueller ,  Thomas Uhland ,  Dirk Schmidt ,  Ibrahim Degirmenci ,  Frank Distler

IPC分类号： H05K1/18 ,  H01R13/46

CPC分类号： H05K3/301 ,  H05K1/18 ,  H05K3/0061 ,  H05K5/0056 ,  H05K2201/10015 ,  H05K2201/10303 ,  H05K2201/10462 ,  H05K2201/10606 ,  H05K2201/2045

摘要： A device for the shakeproof accommodation of electrical special components and/or electrical circuits, particularly in a development as a second component set in a control unit, is made up of a carrier, onto which a circuit substrate, having special components fastened to it, is mounted in an electrically insulated manner over a partial surface, preferably by adhesion

摘要翻译： 用于特殊组件和/或电路的防震容纳装置，特别是作为设置在控制单元中的第二组件的开发中的装置由载体组成，其上具有紧固到其上的特殊部件的电路基板， 优选通过粘附而以部分表面以电绝缘方式安装

公开(公告)号：US20070047343A1

公开(公告)日：2007-03-01

申请号：US11552166

申请日：2006-10-24

申请人： Janice Adams ,  Frank Distler ,  Mark Ollive ,  Michael Ouellette ,  Jeannie Panner

发明人： Janice Adams ,  Frank Distler ,  Mark Ollive ,  Michael Ouellette ,  Jeannie Panner

IPC分类号： G11C29/00

CPC分类号： G11C29/802 ,  H03K19/1735

摘要： A method and system for repairing defective memory in a semiconductor chip. The chip has memory locations, redundant memory, and a central location for ordered fuses. The ordered fuses identify in compressed format defective sections of the memory locations. The defective sections are replaceable by sections of the redundant memory. The ordered fuses have an associated a fuse bit pattern of bits which sequentially represents the defective sections in the compressed format. The method and system determines the order in which the memory locations are wired together; designs a shift register of latches through the memory locations in accordance with the order in which the memory locations are wired together; and associates each of the latches with a corresponding bit of an uncompressed bit pattern from which the fuse bit pattern is derived. The uncompressed bit pattern comprises a sequence of bits, representing the defective sections in uncompressed format.

摘要翻译： 一种用于修复半导体芯片中的有缺陷的存储器的方法和系统。 该芯片具有存储器位置，冗余存储器和用于有序保险丝的中心位置。 有序保险丝以压缩格式识别存储器位置的缺陷部分。 有缺陷的部分可由冗余存储器的部分替换。 有序保险丝具有相关联的熔丝位模式，其顺序地表示压缩格式的缺陷部分。 方法和系统确定存储器位置连接在一起的顺序; 根据存储器位置连接在一起的顺序，通过存储器位置设计锁存器的移位寄存器; 并且将每个锁存器与从其导出熔丝位模式的未压缩位模式的对应位相关联。 未压缩比特模式包括一个比特序列，表示未压缩格式的缺陷部分。