公开(公告)号：US5778527A

公开(公告)日：1998-07-14

申请号：US707100

申请日：1996-09-03

申请人： Michael Barenboim ,  Mark Edward Mino ,  John Lennon Sullivan, Jr. ,  Kenneth Wayne Watts

发明人： Michael Barenboim ,  Mark Edward Mino ,  John Lennon Sullivan, Jr. ,  Kenneth Wayne Watts

IPC分类号： H01R43/16 ,  H05K13/00 ,  H01R43/20 ,  H05K3/30 ,  H05K13/04

CPC分类号： H05K13/003 ,  H01R43/16 ,  Y10T29/49121 ,  Y10T29/49139 ,  Y10T29/49153 ,  Y10T29/49218 ,  Y10T29/49222 ,  Y10T29/5149 ,  Y10T29/515 ,  Y10T29/53183

摘要： A method is provided for processing a number of "L"-shaped sections within a flat strip to form terminals extending from a component. In the strip, these sections are attached to a web by connecting portions. A number of such sections are simultaneously processed within various stations through which the strip is incrementally fed. These connecting portions are first twisted, so that each "L"-shaped section in the number of such sections extends in a plane perpendicular to the web. Next, these connecting portions are deflected so that outward extending legs of the sections extend in a direction needed for insertion into an electronic component structure. Then, these connecting portions are sheared, as each "L"-shaped section separated from the strip is placed in a slot within a receptacle block. Then, the receptacle block is slid to insert the "L"-shaped sections.

摘要翻译： 提供了一种用于处理扁平条中的多个“L”形部分以形成从部件延伸的端子的方法。 在条带中，这些部分通过连接部分连接到卷材上。 多个这样的部分在不同的工位中被同时处理，通过该工位条带被递增地供给。 这些连接部分首先被扭曲，使得这些部分的数量中的每个“L”形部分在垂直于卷材的平面中延伸。 接下来，这些连接部分被偏转，使得这些部分的向外延伸的支腿沿插入电子部件结构所需的方向延伸。 然后，将这些连接部分剪切，因为与条带分离的每个“L”形部分被放置在插座块内的槽中。 然后，将插座块滑动以插入“L”形部分。

公开(公告)号：US5871629A

公开(公告)日：1999-02-16

申请号：US716487

申请日：1996-09-18

申请人： Kenneth Wayne Watts

发明人： Kenneth Wayne Watts

IPC分类号： B25B5/08 ,  B25B9/00 ,  C25D7/00 ,  H01L21/68 ,  H05K7/10 ,  C25D17/06 ,  B25B1/08 ,  C25D5/02

CPC分类号： H01L21/6835 ,  B25B5/08 ,  B25B9/00 ,  C25D17/06 ,  C25D7/0607 ,  H05K7/1084 ,  Y10S269/903

摘要： A fixture for securing a pin grid array (PGA) and grounding all circuits or pins in the PGA for electrolytic plating provides a series of parallel wires that are inserted between every other gap between the PGA pin rows. The cross section of each wire is constructed to provide a first cross sectional width at one location that is less than or equal to the PGA gap width for insertion into the PGA gap and a second cross sectional width, at an angle to the first cross sectional width, that is greater than the gap width. With this arrangement, the wire can be inserted in the gap with the first cross sectional width traversing the gap and then rotated to bring the wider, second cross sectional width into spreading engagement with the pins for a reliable mechanical and conductive contact.

摘要翻译： 用于固定针栅阵列（PGA）并将PGA中的所有电路或引脚接地用于电解电镀的夹具提供一系列平行导线，插入PGA引脚列之间的每隔一个间隙。 每个导线的横截面被构造成在一个位置处提供小于或等于用于插入PGA间隙的PGA间隙宽度的第一横截面宽度和与第一横截面呈角度的第二横截面宽度 宽度大于间隙宽度。 利用这种布置，线可以插入到具有穿过间隙的第一横截面宽度的间隙中，然后旋转以使较宽的第二横截面宽度与销扩展接合以获得可靠的机械和导电接触。

公开(公告)号：US5710631A

公开(公告)日：1998-01-20

申请号：US789031

申请日：1997-01-27

申请人： Akram Aref Bou-Ghannam ,  Alan David Dorundo ,  Michael Gerard Lisanke ,  Huizong Lu ,  Lanphuong Thi Pena ,  Ali Reza Taheri ,  Samuel Sheung-Lok So ,  Kenneth Wayne Watts ,  Darell Smith Whitaker

发明人： Akram Aref Bou-Ghannam ,  Alan David Dorundo ,  Michael Gerard Lisanke ,  Huizong Lu ,  Lanphuong Thi Pena ,  Ali Reza Taheri ,  Samuel Sheung-Lok So ,  Kenneth Wayne Watts ,  Darell Smith Whitaker

IPC分类号： G01N21/88 ,  G01B9/02

CPC分类号： G01N21/88

摘要： An interferometer is used to locate and examine defects in a test surface of a test specimen. Defects are first located as the test surface is driven past the objective of the interferometer at a constant speed, with a darkfield interferogram being examined as it flows across a row of CCD elements. During this process, the location of each defect is stored. Next, the test specimen is sequentially moved into the locations at which static measurements are made using an area array of CCD elements. During these measurements, the phase angle relationship of the interferometer is varied so that heights of surface segments may be calculated. If some to these segments are located more than a quarter wave length of the interferometer light source from the surface at which the darkfield is established, a process is used to perform height corrections for segments within transition boundaries.

摘要翻译： 使用干涉仪来定位和检查试样表面的缺陷。 当测试表面以恒定的速度被驱动经过干涉仪的目标时，首先定位缺陷，当它们流过一行CCD元件时，检查暗场干涉图。 在此过程中，存储每个缺陷的位置。 接下来，使用CCD元件的区域阵列将测试样本顺序地移动到进行静态测量的位置。 在这些测量期间，改变干涉仪的相位角关系，从而可以计算出表面段的高度。 如果这些段中的一些位于来自暗场建立的表面的干涉仪光源的四分之一波长以上，则使用过程对过渡边界内的段执行高度校正。