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    SEMICONDUCTOR DEVICES WITH 2DEG AND 2DHG
    8.
    发明申请
    SEMICONDUCTOR DEVICES WITH 2DEG AND 2DHG 有权
    具有2DEG和2DHG的半导体器件

    公开(公告)号：US20130221409A1

    公开(公告)日：2013-08-29

    申请号：US13812725

    申请日：2011-06-07

    申请人： Akira Nakajima ,  Sankara Narayanan Ekkanath Madathil

    发明人： Akira Nakajima ,  Sankara Narayanan Ekkanath Madathil

    IPC分类号： H01L29/778

    CPC分类号： H01L29/7782 ,  H01L27/095 ,  H01L29/1029 ,  H01L29/2003 ,  H01L29/42316 ,  H01L29/7786 ,  H01L29/7787 ,  H01L29/782 ,  H01L29/872

    摘要： A semiconductor device comprises three semiconductor layers. The semiconductor layers are arranged to form a 2DHG and a 2DEG separated by a polarization layer. The device comprises a plurality of electrodes: first and second electrodes electrically connected to the 2DHG so that current can flow between them via the 2DHG and a third electrode electrically connected to the 2DEG so that when a positive voltage is applied to the third electrode, with respect to at least one of the other electrodes, the 2DEG and the 2DHG will be at least partially depleted.

    摘要翻译： 半导体器件包括三个半导体层。 半导体层被布置成形成由偏振层分离的2DHG和2DEG。 该装置包括多个电极：电连接到2DHG的第一和第二电极，使得电流可以经由2DHG在它们之间流动，第三电极与2DEG电连接，使得当正电压施加到第三电极时， 相对于至少一个其它电极，2DEG和2DHG将至少部分耗尽。

    Board inspection apparatus and method and apparatus for setting inspection logic thereof
    10.
    发明授权
    Board inspection apparatus and method and apparatus for setting inspection logic thereof 有权
    板检查装置及其检查逻辑的设置方法和装置

    公开(公告)号：US07720274B2

    公开(公告)日：2010-05-18

    申请号：US11377938

    申请日：2006-03-16

    申请人： Takatoshi Katahata ,  Hirotaka Wada ,  Toshihiro Moriya ,  Atsushi Shimizu ,  Akira Nakajima

    发明人： Takatoshi Katahata ,  Hirotaka Wada ,  Toshihiro Moriya ,  Atsushi Shimizu ,  Akira Nakajima

    IPC分类号： G06K9/00

    CPC分类号： G06T7/001 ,  G06T2207/30141 ,  G06T2207/30148 ,  G06T2207/30152

    摘要： In generating inspection logic of a new component, the image of a new component is obtained, the trend data for selected characteristics of the focused region of the new component is computed; a previously inspected component having characteristics similar to that of the new component is selected by comparing the trend data of the new component with trend data of the previously inspected component, the image of the selected (previously inspected) component is read from the storage device, and inspection logic for the new component is generated using the images of the new component and images of the previously inspected component as teaching data.

    摘要翻译： 在生成新分量的检验逻辑时，获得新分量的图像，计算出新分量聚焦区域选定特征的趋势数据; 通过将新组件的趋势数据与先前检查的组件的趋势数据进行比较来选择具有与新组件类似的特征的先前检查的组件，从存储设备读取所选（先前检查）组件的图像， 并且使用新组件的图像和先前检查的组件的图像作为教学数据来生成新组件的检查逻辑。