摘要:
Reticle and/or wafer stage interferometers are mounted to a supporting body that is separate from the body that supports the projection optical system of a lithography apparatus. This enables the size of the body supporting the projection optical system to be reduced so that it has more favorable dynamic characteristics.
摘要:
Disclosed is an exposing apparatus which projects an image of a pattern by a projection optical system, comprising a measuring unit having a sensor which measures a positional relationship between the projection optical system and a member which is positioned in relation to the projection optical system, and a first support device which has a first soft structure and which supports the measuring unit in a hanging manner separately from the projection optical system.
摘要:
The exposure system comprises a projection optical system that irradiates exposure light emitted from a mask onto a substrate, a first support member that supports the projection optical system, and a support structure that supports the first support member, wherein the support member supports the first support member at a position that is higher than the position at which the first support member supports the projection optical system.
摘要:
Reticle and/or wafer stage interferometers are mounted to a supporting body that is separate from the body that supports the projection optical system of a lithography apparatus. This enables the size of the body supporting the projection optical system to be reduced so that it has more favorable dynamic characteristics.
摘要:
An exposure apparatus for forming a pattern of a mask on a photo-sensitive substrate comprises an X-Y stage, a Z-stage supported on the X-Y stage, and a levelling stage that supports the photo-sensitive substrate. The levelling stage is supported on the Z-stage by a plurality of levelling devices that define a levelling reference plane, and that are operated in unison to change the level of the levelling stage relative to the Z-stage and relative to an exposure reference plane that is parallel to the levelling reference plane. The levelling devices are also operated individually to change the inclination of the photo-sensitive substrate relative to the levelling reference plane and relative to the exposure reference plane. A focus detector controls the movement of the Z-stage and the in-unison movement of the levelling devices. An inclination detector controls the individual operation of the levelling devices. The net result is that the surface of the photo-sensitive substrate is made coincident with the exposure reference plane and the levelling reference plane, and the center point of the surface of the photo-sensitive substrate becomes the pivotal center for changes in inclination of the photo-sensitive substrate.
摘要:
Disclosed is a process for producing an aminoadamantane carbamate derivative which is useful as a significant intermediate of an 11βHSD-1 inhibitor.A process for producing an acid addition salt of a compound represented by the Formula (II): or a solvate of the acid addition salt, wherein R1 and R2 are each independently hydrogen, substituted or unsubstituted alkyl or the like; R3 and R4 are each independently hydrogen, substituted or unsubstituted alkyl or the like; and R5 and R6 are each independently hydrogen, halogen, carboxy, nitro, substituted or unsubstituted alkyl or the like; which comprises separating an acid addition salt of a compound represented by the Formula (II) or a solvate of the acid addition salt by adding an acid to a mixture of syn isomer and anti isomer of a compound represented by the Formula (I): wherein R1, R2, R3, R4, R5, and R6 are as defined above, in the presence of a solvent.
摘要翻译:公开了一种生产氨基丁基氨基甲酸酯衍生物的方法,其可用作11重量%HSD-1抑制剂的重要中间体。 一种由式(II)表示的化合物的酸加成盐或其酸加成盐的溶剂化物的方法,其中R1和R2各自独立地为氢,取代或未取代的烷基等; R 3和R 4各自独立地为氢,取代或未取代的烷基等; R 5和R 6各自独立地为氢,卤素,羧基,硝基,取代或未取代的烷基等; 其包括通过向由式(I)表示的化合物的顺式异构体和反式异构体的混合物中加入酸来分离由式(II)表示的化合物的酸加成盐或酸加成盐的溶剂合物:其中 在溶剂的存在下,R 1,R 2,R 3,R 4,R 5和R 6如上定义。