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公开(公告)号:US08658486B2
公开(公告)日:2014-02-25
申请号:US13478411
申请日:2012-05-23
IPC分类号: H01L21/00 , H01L21/84 , H01L21/336 , H01L21/8234
CPC分类号: H01L21/823807 , H01L21/76897 , H01L21/823814 , H01L29/66636 , H01L29/78
摘要: A method of forming a semiconductor structure on a substrate is provided. The method may include preparing a continuous active layer on a region of the substrate and depositing a first raised epitaxial layer on a first region of the continuous active layer. A second raised epitaxial layer is also deposited on a second region of the continuous active layer such that the first raised epitaxial layer is in close proximity to the second raised epitaxial layer. A mask may be used to etch a trench structure into the continuous active layer at both the first and the second raised epitaxial layer, whereby the etched trench structure is filled with isolation material for electrically isolating the first raised epitaxial layer from the second raised epitaxial layer.
摘要翻译: 提供了在基板上形成半导体结构的方法。 该方法可以包括在衬底的区域上制备连续的有源层并且在连续有源层的第一区域上沉积第一凸起的外延层。 第二凸起外延层也沉积在连续有源层的第二区上,使得第一凸起外延层紧邻第二凸起外延层。 可以使用掩模将沟槽结构蚀刻到第一和第二凸起外延层两端的连续有源层,由此蚀刻沟槽结构填充有用于将第一凸起外延层与第二凸起外延层电隔离的隔离材料 。
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公开(公告)号:US20130313647A1
公开(公告)日:2013-11-28
申请号:US13478411
申请日:2012-05-23
IPC分类号: H01L21/8234 , H01L27/088
CPC分类号: H01L21/823807 , H01L21/76897 , H01L21/823814 , H01L29/66636 , H01L29/78
摘要: A method of forming a semiconductor structure on a substrate is provided. The method may include preparing a continuous active layer on a region of the substrate and depositing a first raised epitaxial layer on a first region of the continuous active layer. A second raised epitaxial layer is also deposited on a second region of the continuous active layer such that the first raised epitaxial layer is in close proximity to the second raised epitaxial layer. A mask may be used to etch a trench structure into the continuous active layer at both the first and the second raised epitaxial layer, whereby the etched trench structure is filled with isolation material for electrically isolating the first raised epitaxial layer from the second raised epitaxial layer.
摘要翻译: 提供了在基板上形成半导体结构的方法。 该方法可以包括在衬底的区域上制备连续的有源层并且在连续有源层的第一区域上沉积第一凸起的外延层。 第二凸起外延层也沉积在连续有源层的第二区上,使得第一凸起外延层紧邻第二凸起外延层。 可以使用掩模将沟槽结构蚀刻到第一和第二凸起外延层两端的连续有源层,由此蚀刻沟槽结构填充有用于将第一凸起外延层与第二凸起外延层电隔离的隔离材料 。
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公开(公告)号:US08557649B2
公开(公告)日:2013-10-15
申请号:US13278301
申请日:2011-10-21
申请人: Rajasekhar Venigalla , Michael Vincent Aquilino , Massud A. Aminpur , Michael P. Belyansky , Unoh Kwon , Christopher Duncan Sheraw , Daewon Yang
发明人: Rajasekhar Venigalla , Michael Vincent Aquilino , Massud A. Aminpur , Michael P. Belyansky , Unoh Kwon , Christopher Duncan Sheraw , Daewon Yang
IPC分类号: H01L21/8238
CPC分类号: H01L29/66545 , H01L21/3081 , H01L21/3086 , H01L21/31053 , H01L21/76283
摘要: Methods for controlling the height of semiconductor structures are disclosed. Amorphous carbon is used as a stopping layer for controlling height variability. In one embodiment, the height of replacement metal gates for transistors is controlled. In another embodiment, the step height of a shallow trench isolation region is controlled.
摘要翻译: 公开了用于控制半导体结构的高度的方法。 无定形碳被用作控制高度变异性的停止层。 在一个实施例中,控制用于晶体管的替换金属栅极的高度。 在另一个实施例中,控制浅沟槽隔离区的台阶高度。
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公开(公告)号:US20130102125A1
公开(公告)日:2013-04-25
申请号:US13278301
申请日:2011-10-21
申请人: Rajasekhar Venigalla , Michael Vincent Aquilino , Massud A. Aminpur , Michael P. Belyansky , Unoh Kwon , Christopher Duncan Sheraw , Daewon Yang
发明人: Rajasekhar Venigalla , Michael Vincent Aquilino , Massud A. Aminpur , Michael P. Belyansky , Unoh Kwon , Christopher Duncan Sheraw , Daewon Yang
IPC分类号: H01L21/762 , H01L21/28
CPC分类号: H01L29/66545 , H01L21/3081 , H01L21/3086 , H01L21/31053 , H01L21/76283
摘要: Methods for controlling the height of semiconductor structures are disclosed. Amorphous carbon is used as a stopping layer for controlling height variability. In one embodiment, the height of replacement metal gates for transistors is controlled. In another embodiment, the step height of a shallow trench isolation region is controlled.
摘要翻译: 公开了用于控制半导体结构的高度的方法。 无定形碳被用作控制高度变异性的停止层。 在一个实施例中,控制用于晶体管的替换金属栅极的高度。 在另一个实施例中,控制浅沟槽隔离区的台阶高度。
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