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公开(公告)号:US20230172069A1
公开(公告)日:2023-06-01
申请号:US17990904
申请日:2022-11-21
发明人: Akio KONISHI , Hiroaki KANAMORI
IPC分类号: H01L41/08 , H01L41/187 , H01L41/316 , H01L41/319 , C30B29/68 , C30B23/02 , C30B29/32 , C30B29/02
CPC分类号: H01L41/0815 , H01L41/187 , H01L41/1873 , H01L41/1876 , H01L41/316 , H01L41/319 , C30B29/68 , C30B23/025 , C30B29/32 , C30B29/02
摘要: A film structure comprises a substrate and a buffer film formed on the substrate. The substrate is a 36° to 48° rotated Y-cut Si substrate, or the substrate is a SOI substrate including a base substance made of the 36° to 48° rotated Y-cut Si substrate, an insulating layer on the base substance, and a SOI layer made of a Si film on the insulating layer, and a mirror index of a crystal plane of an upper surface of the SOI layer is equal to a mirror index of a crystal plane of an upper surface of the base substance. The buffer film includes ZrO2 epitaxially grown on the substrate.